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<ep-patent-document id="EP03778291B8W1" file="EP03778291W1B8.xml" lang="de" country="EP" doc-number="1556728" kind="B8" correction-code="W1" date-publ="20081008" status="c" dtd-version="ep-patent-document-v1-3">
<SDOBI lang="de"><B000><eptags><B001EP>ATBECHDEDKESFRGBGRITLILUNLSEMCPTIESI....FIRO..CY..TRBGCZEEHU..SK................</B001EP><B003EP>*</B003EP><B005EP>J</B005EP><B007EP>DIM360 Ver 2.15 (14 Jul 2008) -  2999001/0</B007EP></eptags></B000><B100><B110>1556728</B110><B120><B121>KORRIGIERTE EUROPÄISCHE PATENTSCHRIFT</B121></B120><B130>B8</B130><B132EP>B1</B132EP><B140><date>20081008</date></B140><B150><B151>W1</B151><B153>73</B153><B155><B1551>de</B1551><B1552>Bibliographie</B1552><B1551>en</B1551><B1552>Bibliography</B1552><B1551>fr</B1551><B1552>Bibliographie</B1552></B155></B150><B190>EP</B190></B100><B200><B210>03778291.9</B210><B220><date>20031028</date></B220><B240><B241><date>20050423</date></B241><B242><date>20050721</date></B242></B240><B250>de</B250><B251EP>de</B251EP><B260>de</B260></B200><B300><B310>10250568</B310><B320><date>20021028</date></B320><B330><ctry>DE</ctry></B330></B300><B400><B405><date>20081008</date><bnum>200841</bnum></B405><B430><date>20050727</date><bnum>200530</bnum></B430><B450><date>20080702</date><bnum>200827</bnum></B450><B452EP><date>20080219</date></B452EP><B480><date>20081008</date><bnum>200841</bnum></B480></B400><B500><B510EP><classification-ipcr sequence="1"><text>G02B  21/00        20060101AFI20040511BHEP        </text></classification-ipcr></B510EP><B540><B541>de</B541><B542>VERFAHREN ZUR VERBESSERUNG DER TIEFENDISKRIMINIERUNG OPTISCH ABBILDENDER SYSTEME</B542><B541>en</B541><B542>METHOD FOR IMPROVING DEPTH DISCRIMINATION IN OPTICAL REPRODUCTION SYSTEMS</B542><B541>fr</B541><B542>PROCEDE POUR AMELIORER LA DISCRIMINATION EN PROFONDEUR DE SYSTEMES DE REPRODUCTION OPTIQUE</B542></B540><B560><B561><text>EP-A- 1 235 424</text></B561><B561><text>WO-A-02/12945</text></B561><B561><text>WO-A-97/06509</text></B561><B562><text>HANLEY Q S ET AL: "SPECTRAL IMAGING IN A PROGAMMABLE ARRAY MICROSCOPE BY HADAMARD TRANSFORM FLUORESCENCE SPECTROSCOPY" APPLIED SPECTROSCOPY, THE SOCIETY FOR APPLIED SPECTROSCOPY. BALTIMORE, US, Bd. 53, Nr. 1, Januar 1999 (1999-01), Seiten 1-10, XP000822234 ISSN: 0003-7028</text></B562></B560></B500><B700><B720><B721><snm>BACKS, Bernhard</snm><adr><str>Uhlandstrasse 44</str><city>85386 Eching</city><ctry>DE</ctry></adr></B721><B721><snm>SCHAFFER, Jörg</snm><adr><str>Am Kalten Born 28</str><city>37085 Göttingen</city><ctry>DE</ctry></adr></B721><B721><snm>SCHÄFER, Lutz</snm><adr><str>16-715 Doon Village Rd.</str><city>Kitchener,
Ontario N2P 2A2</city><ctry>CA</ctry></adr></B721><B721><snm>VÖLCKER, Martin</snm><adr><str>Zanger Haupstrasse 15</str><city>89551 Königsbronn-Zang</city><ctry>DE</ctry></adr></B721></B720><B730><B731><snm>Carl Zeiss MicroImaging GmbH</snm><iid>07401480</iid><irf>P07611EP</irf><adr><str>Carl-Zeiss-Promenade 10</str><city>07745 Jena</city><ctry>DE</ctry></adr></B731></B730><B740><B741><snm>Scholze, Humbert</snm><iid>09259781</iid><adr><str>Carl Zeiss Jena GmbH 
Servicebereich Recht und Patente 
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