(19)
(11) EP 1 563 544 A1

(12)

(43) Date of publication:
17.08.2005 Bulletin 2005/33

(21) Application number: 03786643.1

(22) Date of filing: 12.11.2003
(51) International Patent Classification (IPC)7H01L 27/146, H01L 27/148
(86) International application number:
PCT/US2003/035859
(87) International publication number:
WO 2004/044989 (27.05.2004 Gazette 2004/22)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR
Designated Extension States:
AL LT LV MK

(30) Priority: 12.11.2002 US 291728
12.11.2002 US 291772

(71) Applicant: MICRON TECHNOLOGY, INC.
Boise, ID 83707-0006 (US)

(72) Inventors:
  • MOULI, Chandra
    Boise, ID 83712 (US)
  • RHODES, Howard
    Boise, ID 83706 (US)

(74) Representative: Collins, John David 
Marks & Clerk90 Long Acre
London WC2E 9RA
London WC2E 9RA (GB)

   


(54) GROUNDED GATE AND ISOLATION TECHNIQUES FOR REDUCING DARK CURRENT IN CMOS IMAGE SENSORS