(19)
(11) EP 1 614 162 A2

(12)

(88) Date of publication A3:
16.12.2004

(43) Date of publication:
11.01.2006 Bulletin 2006/02

(21) Application number: 04759937.8

(22) Date of filing: 16.04.2004
(51) International Patent Classification (IPC): 
H01L 29/10(1974.07)
(86) International application number:
PCT/US2004/011818
(87) International publication number:
WO 2004/095583 (04.11.2004 Gazette 2004/45)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR
Designated Extension States:
AL HR LT LV MK

(30) Priority: 16.04.2003 US 417021

(71) Applicant: RAYTHEON COMPANY
Waltham, MA 02451 (US)

(72) Inventor:
  • LUM, Wing Y.
    Santa Barbara, CA 93111 (US)

(74) Representative: Lindner, Michael 
Witte, Weller & Partner, Patentanwälte, Postfach 105462
70047 Stuttgart
70047 Stuttgart (DE)

   


(54) RADIATION-HARDENED TRANSISTOR FABRICATED BY MODIFIED CMOS PROCESS