(19)
(11) EP 1 622 507 A2

(12)

(88) Date of publication A3:
20.01.2005

(43) Date of publication:
08.02.2006 Bulletin 2006/06

(21) Application number: 04760590.2

(22) Date of filing: 27.04.2004
(51) International Patent Classification (IPC): 
A61B 5/00(1968.09)
(86) International application number:
PCT/US2004/012893
(87) International publication number:
WO 2004/099824 (18.11.2004 Gazette 2004/47)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR

(30) Priority: 02.05.2003 US 467355 P
02.05.2003 US 428410
21.10.2003 US 513396 P
14.04.2004 US 824214
14.04.2004 US 824254

(71) Applicant: Oculir, Inc.
San Diego, CA 92130 (US)

(72) Inventors:
  • BURD, John, F.
    San Diego, CA 92100 (US)
  • SELL, William
    Petaluma, CA 94952 (US)
  • FRADEN, Jacob
    La Jolla, CA 92037 (US)
  • KRAMER, Charles, E.
    Cave Junction, OR 97523 (US)
  • KRANTZ, Gary
    Laguna Beach, CA 92651 (US)
  • CHAPMAN, Bart
    San Diego, CA 92130 (US)

(74) Representative: Viering, Hans-Martin 
Patentanwälte Viering, Jentschura & Partner, Postfach 22 14 43
80504 München
80504 München (DE)

   


(54) METHODS AND DEVICE FOR NON-INVASIVE ANALYTE MEASUREMENT