(19)
(11) EP 1 622 649 A2

(12)

(88) Date of publication A3:
13.01.2005

(43) Date of publication:
08.02.2006 Bulletin 2006/06

(21) Application number: 04731078.4

(22) Date of filing: 04.05.2004
(51) International Patent Classification (IPC): 
A61K 49/04(1980.01)
A61B 6/02(1968.09)
A61B 6/00(1968.09)
(86) International application number:
PCT/IB2004/050579
(87) International publication number:
WO 2004/098649 (18.11.2004 Gazette 2004/47)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR

(30) Priority: 06.05.2003 EP 03101251

(71) Applicants:
  • Philips Intellectual Property & Standards GmbH
    20099 Hamburg (DE)

    DE 
  • Koninklijke Philips Electronics N.V.
    5621 BA Eindhoven (NL)

    AT BE BG CH CY CZ DK EE ES FI FR GB GR HU IE IT LU MC NL PL PT RO SE SI SK TR 

(72) Inventors:
  • SCHLOMKA, J.-P., Philips I.P. & Standards GmbH
    52066 Aachen (DE)
  • HARDING, G., Philips I.P. & Standards GmbH
    52066 Aachen (DE)
  • MARTENS, G., Philips I.P. & Standards GmbH
    52066 Aachen (DE)

(74) Representative: Volmer, Georg 
Philips Intellectual Property & Standards GmbH, Postfach 50 04 42
52088 Aachen
52088 Aachen (DE)

   


(54) APPARATUS AND METHOD FOR EXAMINING AN OBJECT BY MEANS OF ELASTICALLY SCATTERED X-RAY RADIATION AND CONTRAST AGENT