(19)
(11) EP 1 629 622 A2

(12)

(88) Date of publication A3:
02.06.2005

(43) Date of publication:
01.03.2006 Bulletin 2006/09

(21) Application number: 04752834.4

(22) Date of filing: 20.05.2004
(51) International Patent Classification (IPC): 
H04L 1/24(1980.01)
H04L 25/03(1974.07)
H04L 1/20(1980.01)
(86) International application number:
PCT/US2004/015895
(87) International publication number:
WO 2004/105334 (02.12.2004 Gazette 2004/49)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR

(30) Priority: 20.05.2003 US 441461
31.03.2004 US 815604
18.05.2004 US 849264

(71) Applicants:
  • RAMBUS INC.
    Los Altos, California 94022 (US)
  • Garlepp, Bruno W.
    San Jose, CA 95129 (US)
  • Chen, Fred F.
    San Francisco, CA 94118 (US)
  • Ho, Andrew
    Palo Alto, CA 94303 (US)
  • Stojanovic, Vladimir
    Stanford, CA 94305 (US)

(72) Inventors:
  • GARLEPP, Bruno, W.
    San Jose, CA 95129 (US)
  • CHEN, Fred, F.
    San Francisco, CA 94118 (US)
  • HO, Andrew
    Palo Alto, CA 94303 (US)
  • STOJANOVIC, Vladimir
    Stanford, CA 94305 (US)

(74) Representative: Eisenführ, Speiser & Partner 
Patentanwälte Rechtsanwälte Postfach 10 60 78
28060 Bremen
28060 Bremen (DE)

   


(54) MARGIN TEST METHODS AND CIRCUITS