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<ep-patent-document id="EP04791269B8W1" file="EP04791269W1B8.xml" lang="de" country="EP" doc-number="1676116" kind="B8" correction-code="W1" date-publ="20120704" status="c" dtd-version="ep-patent-document-v1-4">
<SDOBI lang="de"><B000><eptags><B001EP>......DE..ESFRGB..IT................................................................................</B001EP><B003EP>*</B003EP><B005EP>J</B005EP><B007EP>DIM360 Ver 2.15 (14 Jul 2008) -  2999001/0</B007EP></eptags></B000><B100><B110>1676116</B110><B120><B121>KORRIGIERTE EUROPÄISCHE PATENTSCHRIFT</B121></B120><B130>B8</B130><B132EP>B1</B132EP><B140><date>20120704</date></B140><B150><B151>W1</B151><B153>74</B153><B155><B1551>de</B1551><B1552>Bibliographie</B1552><B1551>en</B1551><B1552>Bibliography</B1552><B1551>fr</B1551><B1552>Bibliographie</B1552></B155></B150><B190>EP</B190></B100><B200><B210>04791269.6</B210><B220><date>20041021</date></B220><B240><B241><date>20060126</date></B241><B242><date>20100902</date></B242></B240><B250>de</B250><B251EP>de</B251EP><B260>de</B260></B200><B300><B310>10349411</B310><B320><date>20031021</date></B320><B330><ctry>DE</ctry></B330><B310>102004051508</B310><B320><date>20041021</date></B320><B330><ctry>DE</ctry></B330></B300><B400><B405><date>20120704</date><bnum>201227</bnum></B405><B430><date>20060705</date><bnum>200627</bnum></B430><B450><date>20120530</date><bnum>201222</bnum></B450><B452EP><date>20111212</date></B452EP><B480><date>20120704</date><bnum>201227</bnum></B480></B400><B500><B510EP><classification-ipcr sequence="1"><text>G01N   1/28        20060101AFI20050511BHEP        </text></classification-ipcr></B510EP><B540><B541>de</B541><B542>VERFAHREN ZUR AUTOMATISCHEN ERZEUGUNG VON LASER-SCHNITTLINIEN IN DER LASER-MIKRODISSEKTION</B542><B541>en</B541><B542>METHOD FOR AUTOMATIC PRODUCTION OF LASER CUTTING LINES IN LASER MICRO-DISSECTION</B542><B541>fr</B541><B542>PROCEDE DE GENERATION AUTOMATIQUE DE LIGNES DE DECOUPE LASER LORS D'UNE MICRODISSECTION LASER</B542></B540><B560><B561><text>DE-A1- 19 636 074</text></B561><B561><text>US-A- 4 741 043</text></B561><B561><text>US-A- 5 843 657</text></B561><B561><text>US-A- 5 998 129</text></B561><B561><text>US-A1- 2002 090 122</text></B561><B561><text>US-A1- 2002 164 678</text></B561><B562><text>SCHACHTER B J ET AL: "Some Experiments in Image Segmentation by Clustering of Local Feature Values" PATTERN RECOGNITION, ELSEVIER, KIDLINGTON, GB, Bd. 11, 1979, Seiten 19-28, XP002269476 ISSN: 0031-3203</text></B562><B562><text>ANONYMOUS: "Laser Capture Microdissection Systems" PRODUCT SPECIFICATION, [Online] Juli 2003 (2003-07), XP002315059 Gefunden im Internet: URL:www.arctur.com&gt; [gefunden am 2005-01-25]</text></B562></B560></B500><B700><B720><B721><snm>SIECKMANN, Frank</snm><adr><str>Hoersterholz 1d</str><city>44879 Bochum</city><ctry>DE</ctry></adr></B721><B721><snm>JOHANNSEN, Gerhard</snm><adr><str>Schiffenberger Weg 10</str><city>35435 Wettenberg</city><ctry>DE</ctry></adr></B721></B720><B730><B731><snm>Leica Microsystems CMS GmbH</snm><iid>100737262</iid><irf>L 091 WO/EP</irf><adr><str>Ernst-Leitz-Strasse 17-37</str><city>35578 Wetzlar</city><ctry>DE</ctry></adr></B731></B730><B740><B741><snm>Grunert, Marcus</snm><sfx>et al</sfx><iid>101206588</iid><adr><str>Kudlek &amp; Grunert 
Patentanwälte 
Postfach 330429</str><city>80064 München</city><ctry>DE</ctry></adr></B741></B740></B700><B800><B840><ctry>DE</ctry><ctry>ES</ctry><ctry>FR</ctry><ctry>GB</ctry><ctry>IT</ctry></B840><B860><B861><dnum><anum>EP2004052600</anum></dnum><date>20041021</date></B861><B862>de</B862></B860><B870><B871><dnum><pnum>WO2005040762</pnum></dnum><date>20050506</date><bnum>200518</bnum></B871></B870><B880><date>20060705</date><bnum>200627</bnum></B880></B800></SDOBI>
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