| (84) |
Designated Contracting States: |
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DE FR GB |
| (30) |
Priority: |
30.03.2005 JP 2005096902
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| (43) |
Date of publication of application: |
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04.10.2006 Bulletin 2006/40 |
| (73) |
Proprietor: Sumitomo Electric Device Innovations, Inc. |
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Yokohama-shi
Kanagawa 244-0845 (JP) |
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| (72) |
Inventors: |
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- Kurachi, Shunsuke,
Eudyna Devices Inc.
Nakakoga-gun
Yamanashi 409-3883 (JP)
- Komatani, Tsutomu,
Eudyna Devices Inc.
Nakakoga-gun
Yamanashi 409-3883 (JP)
|
| (74) |
Representative: Fenlon, Christine Lesley et al |
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Haseltine Lake LLP
Lincoln House, 5th Floor
300 High Holborn London WC1V 7JH London WC1V 7JH (GB) |
| (56) |
References cited: :
WO-A-2005/024955 US-A1- 2004 201 038
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US-A1- 2001 028 100
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- TAN W S ET AL: "Comparison of different surface passivation dielectrics in AlGaN/GaN
heterostructure field-effect transistors" JOURNAL OF PHYSICS D. APPLIED PHYSICS, IOP
PUBLISHING, BRISTOL, GB, vol. 35, no. 7, 19 March 2002 (2002-03-19), pages 595-598,
XP009098462 ISSN: 0022-3727
- ARULKUMARAN S ET AL: "Surface passivation effects on AlGaN/GaN high-electron-mobility
transistors with SiO2, Si3N4, and silicon oxynitride" APPLIED PHYSICS LETTERS, AIP,
AMERICAN INSTITUTE OF PHYSICS, MELVILLE, NY, US, vol. 84, no. 4, 26 January 2004 (2004-01-26),
pages 613-615, XP012061941 ISSN: 0003-6951
- HWANG J ET AL: "Effects of a molecular beam epitaxy grown AlN passivation layer on
AlGaN/GaN heterojunction field effect transistors" SOLID STATE ELECTRONICS, ELSEVIER
SCIENCE PUBLISHERS, BARKING, GB, vol. 48, no. 2, February 2004 (2004-02), pages 363-366,
XP004470558 ISSN: 0038-1101
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