(19)
(11) EP 1 751 527 A2

(12)

(43) Date of publication:
14.02.2007 Bulletin 2007/07

(21) Application number: 05723818.0

(22) Date of filing: 24.02.2005
(51) International Patent Classification (IPC): 
G01N 23/207(2006.01)
(86) International application number:
PCT/US2005/006114
(87) International publication number:
WO 2005/082050 (09.09.2005 Gazette 2005/36)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU MC NL PL PT RO SE SI SK TR
Designated Extension States:
AL BA HR LV MK YU

(30) Priority: 24.02.2004 US 546976 P

(71) Applicant: SSCI, Inc.
West Lafayette, IN 47906 (US)

(72) Inventors:
  • BATES, Simon
    West Lafayette, IN 47906 (US)
  • IVANISEVIC, Igor
    West Lafayette, IN 47906 (US)

(74) Representative: Palmer, Jonathan R. 
Boult Wade Tennant, Verulam Gardens, 70 Gray's Inn Road
London WC1X 8BT
London WC1X 8BT (GB)

   


(54) ANALYSIS AND SCREENING OF SOLID FORMS USING THE ATOMIC PAIR DISTRIBUTION FUNCTION