SYSTEMS AND METHODS RELATING TO MAGNITUDE ENHANCEMENT ANALYSIS SUITABLE FOR HIGH BIT LEVEL DISPLAYS ON LOW BIT LEVEL SYSTEMS, DETERMINING THE MATERIAL THICKNESS, AND 3D VISUALIZATION OF COLOR SPACE DIMENSIONS - Patent 1766553

(19)

(11)

EP 1 766 553 A2

(12)

(43)	Date of publication:
	28.03.2007 Bulletin 2007/13

(21)	Application number: 05763406.5

(22)	Date of filing: 23.06.2005

(51)

International Patent Classification (IPC):

G06K 9/00^(2006.01)

(86)	International application number:
	PCT/US2005/022312

(87)	International publication number:
	WO 2006/002327 (05.01.2006 Gazette 2006/01)

(84)	Designated Contracting States:
	AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU MC NL PL PT RO SE SI SK TR
	Designated Extension States:
	AL BA HR LV MK YU

(30)

Priority:

23.06.2004 US 582414
02.07.2004 US 585059
23.08.2004 US 604092
12.10.2004 US 618276
23.11.2004 US 630824
28.03.2005 US 665967

(71)	Applicant: Lumeniq, Inc.
	Bellingham, WA 98225 (US)

(72)	Inventors:
	OGREN, Wayne, E. Bellingham, WA 98226-9563 (US) LOVE, Patrick, B. Bellingham, WA 98225 (US) MCLAIN, Peter, B. Bellingham, WA 98225 (US) MANCILLA, Rick Ventura, CA 93001 (US) STEINER, Edward Owings Mills, MD 21117-1032 (US) ROGERS, William, Paul Bellingham, WA 98225 (US) HARING, Andrew Kirkland, WA 98003 (US)

(74)	Representative: Maccalli, Marco et al
	Maccalli & Pezzoli S.r.l., Via Settembrini, 40 20124 Milano 20124 Milano (IT)

(54)	SYSTEMS AND METHODS RELATING TO MAGNITUDE ENHANCEMENT ANALYSIS SUITABLE FOR HIGH BIT LEVEL DISPLAYS ON LOW BIT LEVEL SYSTEMS, DETERMINING THE MATERIAL THICKNESS, AND 3D VISUALIZATION OF COLOR SPACE DIMENSIONS