TESTING METHOD OF ANALYTIC CHIP OF MULTIPLE REACTORS, THE ANALYTIC CHIP, AND THE TESTING DEVICE - Patent 1774333

(19)

(11)

EP 1 774 333 A1

(12)

(43)	Date of publication:
	18.04.2007 Bulletin 2007/16

(21)	Application number: 05741780.0

(22)	Date of filing: 29.03.2005

(51)

International Patent Classification (IPC):

G01N 33/543^(2006.01)

C12Q 1/68^(2006.01)

(86)	International application number:
	PCT/CN2005/000412

(87)	International publication number:
	WO 2006/007773 (26.01.2006 Gazette 2006/04)

(84)	Designated Contracting States:
	DE FR GB

(30)

Priority:

21.07.2004 WO PCT/CN2004/000839
06.02.2005 CN 200510020350

(71)	Applicant: Chengdu Kuachang Medical Industrial Limited
	Chengdu, Sichuan 610041 (CN)

(72)	Inventors:
	ZOU, Fanglin Sichuan Province, Chengdu City 610000 (CN) CHEN, Chunsheng Sichuan Province, Chengdu 610063 (CN) WANG, Jianxia Sichuan Province, Meishan 610000 (CN)

(74)	Representative: Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
	Maximilianstrasse 58 80538 München 80538 München (DE)

(54)	TESTING METHOD OF ANALYTIC CHIP OF MULTIPLE REACTORS, THE ANALYTIC CHIP, AND THE TESTING DEVICE