(19)
(11) EP 1 782 510 A2

(12)

(88) Date of publication A3:
19.10.2006

(43) Date of publication:
09.05.2007 Bulletin 2007/19

(21) Application number: 05813080.8

(22) Date of filing: 16.08.2005
(51) International Patent Classification (IPC): 
H01S 3/08(2006.01)
(86) International application number:
PCT/US2005/028993
(87) International publication number:
WO 2006/023448 (02.03.2006 Gazette 2006/09)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR
Designated Extension States:
AL BA HR MK YU

(30) Priority: 25.08.2004 US 604540 P
11.02.2005 US 56855

(71) Applicant: KLA-Tencor Technologies Corporation
Milpitas, California 95035 (US)

(72) Inventors:
  • CHUANG, Yung-Ho
    Cupertino, CA 95014 (US)
  • ARMSTRONG, Joseph, J.
    Milpitas, CA 95035 (US)

(74) Representative: Parkinson, Neil Scott et al
Marks & Clerk Sussex House 83-85 Mosley Street
Manchester M2 3LG
Manchester M2 3LG (GB)

   


(54) FIBER AMPLIFIED BASED LIGHT SOURCE FOR SEMICONDUCTOR INSPECTION