BACKGROUND OF THE INVENTION
Field of the Invention
[0001] The present invention relates to a waveguide using a three-dimensional photonic crystal
having a three-dimensional periodic-refractive-index structure, and to a device including
the waveguide.
Description of the Related Art
[0002] The concept of controlling transmission and reflection characteristics of electromagnetic
waves with structures having a size equal to or smaller than the wavelength has been
proposed by
Yablonovitch (Physical Review Letters, Vol. 58, pp. 2059, 1987). According to this document, transmission and reflection characteristics of electromagnetic
waves can be controlled by periodically arraying structures having a size equal to
or smaller than the wavelength. When the electromagnetic waves are visible light,
transmission and reflection characteristics of the light can be controlled. Such a
structure is known as a photonic crystal. It has been suggested that photonic crystals
can be used to realize a reflective mirror having a reflectance of 100%, at which
the optical loss is zero, in a certain wavelength range. Thus, the concept in which
a reflectance of 100% can be realized in a certain wavelength range is referred to
as a photonic bandgap, making reference to the energy gap of semiconductors.
[0003] In addition, when the structures having a size equal to or smaller than the wavelength
have a three-dimensional fine periodic structure, the photonic bandgap can be realized
for light incident from all directions. Hereinafter, this is referred to as "complete
photonic bandgap". Optical devices having a new function can be realized using the
complete photonic bandgap. For example, by forming a periodic defect such as a point
defect or a linear defect in a photonic crystal, the photonic crystal can operate
as a resonator or a waveguide. It is known that, in particular, when a linear defect
is appropriately provided, a waveguide with a steep bend and an add-drop waveguide
can be realized while light is strongly confined in the linear defect (Japanese Patent
Laid-Open No.
2001-74955 and the extended abstracts of the 65th meeting of the Japan Society of Applied Physics,
No. 3, pp. 936).
[0004] Examples of three-dimensional photonic crystals that can realize the complete photonic
bandgap include structures shown in Figs. 23A to 23F. Fig. 23A shows a diamond opal
structure, Fig. 23B shows a woodpile structure, Fig. 23C shows a spiral structure,
Fig. 23D shows a unique three-dimensional periodic structure, Fig. 23E shows an inverse
structure of a three-dimensional periodic structure, and Fig. 23F shows a diamond
woodpile structure.
[0005] When a waveguide is produced utilizing the complete photonic bandgap (PBG) by a three-dimensional
photonic crystal, in general, a frequency range in which light is guided in a single
mode and a frequency range in which light is guided in a multiple mode are present
for light having a certain frequency in the PBG. Among the modes in which light is
guided in the waveguide, the term "single mode" means the mode in which light is guided
in a state in which a single wavenumber vector is possessed for the light having a
certain frequency. Each waveguide mode has an intrinsic periodic electromagnetic field
intensity distribution in the waveguide.
[0006] In a waveguide used for an optical circuit, a light-emitting device, or the like,
the waveguide must have a desired confinement effect and light must be guided in the
single mode at a desired frequency. In addition, when light guided in the waveguide
is supplied to the outside, it is important that the electromagnetic field intensity
distribution of the light at an end of the waveguide is a single-peaked intensity
distribution having a satisfactory symmetry in a cross-section perpendicular to the
waveguide direction. The electromagnetic field intensity distribution of the light
at the end of the waveguide is formed according to the electromagnetic field intensity
distribution of each waveguide mode in a plane perpendicular to the waveguide direction.
Therefore, it is important that the waveguide mode has a single-peaked electromagnetic
field intensity distribution concentrated in a predetermined area in a plane perpendicular
to the waveguide direction.
[0007] According to the description of Japanese Patent Laid-Open No.
2001-74955, linear defects are provided inside the woodpile structure shown in Fig. 23B to form
a waveguide. Some of the columnar structures are removed to form the linear defects.
This structure can realize a waveguide in which light can be guided in a single mode
in a specific range, and in a mode having an electromagnetic field intensity distribution
that is close to a single-peaked distribution. However, light is guided in a multiple
mode in a part of the frequency range of the photonic bandgap, and thus the available
range is limited. Furthermore, when a medium constituting the three-dimensional photonic
crystal is composed of a medium having a low refractive index, the width of the photonic
bandgap is small. Accordingly, the frequency range that can be used in the single
mode is markedly decreased.
[0008] The extended abstracts of the 65th meeting of the Japan Society of Applied Physics,
No. 3, pp. 936 describes a waveguide in which linear defects are provided inside the woodpile structure
shown in Fig. 23B, and columnar structures are additionally formed in layers adjacent
to the linear defects. According to this waveguide structure, light can be guided
in a single mode over a relatively wide frequency range. Figs. 24A and 24B show the
electromagnetic field intensity distribution in a plane perpendicular to the waveguide
direction of the waveguide mode and the electromagnetic field intensity distribution
in a plane parallel to the waveguide direction and the stacking direction, respectively.
In Fig. 24A, the white central part represents higher electromagnetic field intensity.
This electromagnetic field intensity distribution is not suitable in view of the application
because this distribution has a double-peaked electromagnetic field intensity distribution
in which the electromagnetic field is highly concentrated at the added columnar structures.
In addition, the electromagnetic field intensity distribution markedly changes in
the waveguide (Fig. 24B). Therefore, in the case where this waveguide structure is
arranged with another resonator structure or another waveguide structure, when the
arrangement of each structure is slightly shifted by an error in the preparation,
the positional relationship in the electromagnetic field intensity distribution markedly
changes. The propagation characteristic of the electromagnetic field of the individual
structures depends on the positional relationship of the electromagnetic field intensity
distribution of the structures. Therefore, when the arrangement of the structures
changes slightly, the propagation characteristic of electromagnetic field between
the individual structures changes markedly, resulting in a significant change in the
performance of the device. Accordingly, in order to obtain a desired performance using
the device having the waveguide structure described in the
extended abstracts of the 65th meeting of the Japan Society of Applied Physics, No.
3, pp. 936, the individual structures must be arranged with high accuracy, and it is difficult
to produce such a device.
[0009] Furthermore, the above-described waveguide structures do not include an element for
changing the frequency of the waveguide mode. Therefore, these structures cannot provide
a waveguide that can guide light in a single mode over a desired frequency range.
SUMMARY OF THE INVENTION
[0010] The present invention provides a waveguide using a three-dimensional photonic crystal
in which light can be guided in a mode that is a single mode and has a single-peaked
electromagnetic field intensity distribution in a plane perpendicular to the waveguide
direction, and guided over a desired frequency range, and a device including the waveguide.
[0011] According to a waveguide of the present invention, in a waveguide including a plurality
of linear defects of a three-dimensional photonic crystal, the three-dimensional photonic
crystal includes a first layer including a plurality of columnar structures disposed
at a predetermined interval; a second layer including a plurality of columnar structures
disposed at the predetermined interval, the columnar structures extending in a direction
different from that in which the columnar structures in the first layer extend; a
third layer including a plurality of columnar structures disposed at the predetermined
interval, the columnar structures extending in the same direction as the columnar
structures in the first layer; and a fourth layer including a plurality of columnar
structures disposed at the predetermined interval, the columnar structures extending
in the same direction as the columnar structures in the second layer, wherein the
first layer and the third layer are stacked such that the positions at which the columnar
structures contained in the first layer are disposed are shifted by one-half the predetermined
interval with respect to the positions at which the columnar structures contained
in the third layer are disposed in a direction perpendicular to the direction of extension
of the columnar structures, and the second layer and the fourth layer are stacked
such that the positions at which the columnar structures contained in the second layer
are disposed are shifted by one-half the predetermined interval with respect to the
positions at which the columnar structures contained in the fourth layer are disposed
in a direction perpendicular to the direction of extension of the columnar structures.
In the waveguide of the present invention, the plurality of linear defects include
a first linear defect formed by changing the medium of some of the columnar structures
to a medium different from that of the columnar structures and a second linear defect
formed by shifting the position or changing the shape of some of the columnar structures
extending in the same direction as the first linear defect, and the first linear defect
and the second linear defect are disposed apart by 0.5 times the out-of-plane lattice
period or more in the stacking direction of the three-dimensional photonic crystal.
[0012] Further features of the present invention will become apparent from the following
description of exemplary embodiments with reference to the attached drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
[0013] Fig. 1 is a view illustrating a woodpile structure A.
[0014] Fig. 2 includes views illustrating individual layers of the woodpile structure A.
[0015] Fig. 3 is a graph showing the normalized frequency of the woodpile structure A.
[0016] Figs. 4A to 4D are schematic views of the relevant parts according to a first embodiment
of the present invention.
[0017] Figs. 5A and 5B are views showing the waveguide mode of the first embodiment of the
present invention.
[0018] Fig. 6 is a graph showing the normalized frequency of the first embodiment of the
present invention.
[0019] Fig. 7 is a graph showing the normalized frequency of the first embodiment of the
present invention.
[0020] Fig. 8 is a view illustrating a photonic crystal structure D.
[0021] Fig. 9 includes views illustrating individual layers of the photonic crystal structure
D.
[0022] Fig. 10 is a graph showing the normalized frequency of the photonic crystal structure
D.
[0023] Figs. 11A to 11D are schematic views of the relevant parts according to a second
embodiment of the present invention.
[0024] Figs. 12A and 12B are views showing the waveguide mode of the second embodiment of
the present invention.
[0025] Fig. 13 is a graph showing the normalized frequency of the second embodiment of the
present invention.
[0026] Figs. 14A to 14D are schematic views of the relevant parts according to the second
embodiment of the present invention.
[0027] Fig. 15 is a graph showing the normalized frequency of the second embodiment of the
present invention.
[0028] Figs. 16A to 16D are schematic views of the relevant parts according to the second
embodiment of the present invention.
[0029] Fig. 17 is a graph showing the normalized frequency of the second embodiment of the
present invention.
[0030] Fig. 18 is a graph showing the normalized frequency of the second embodiment of the
present invention.
[0031] Fig. 19 includes schematic views of the relevant part according to a fifth embodiment
of the present invention.
[0032] Fig. 20 includes schematic views of the relevant part according to the fifth embodiment
of the present invention.
[0033] Fig. 21 includes schematic views of the relevant part according to the fifth embodiment
of the present invention.
[0034] Fig. 22 is a graph illustrating a spectrum of the fifth embodiment of the present
invention.
[0035] Figs. 23A to 23F are views illustrating known photonic crystals.
[0036] Fig. 24A is a view showing the electromagnetic field intensity distribution of a
known photonic crystal.
[0037] Fig. 24B is a view showing the electromagnetic field intensity distribution of the
known photonic crystal.
[0038] Figs. 25A to 25D are schematic views of the relevant parts according to a third embodiment
of the present invention.
[0039] Figs. 26A and 26B are views showing the waveguide mode of the third embodiment of
the present invention.
[0040] Fig. 27 is a graph showing the normalized frequency of the third embodiment of the
present invention.
[0041] Fig. 28 is a graph showing the normalized frequency of the third embodiment of the
present invention.
[0042] Figs. 29A to 29D are schematic views of the relevant parts according to a fourth
embodiment of the present invention.
[0043] Figs. 30A and 30B are views showing the waveguide mode of the fourth embodiment of
the present invention.
[0044] Fig. 31 is a graph showing the normalized frequency of the fourth embodiment of the
present invention.
[0045] Figs. 32A to 32D are schematic views of the relevant parts according to the fourth
embodiment of the present invention.
[0046] Fig. 33 is a graph showing the normalized frequency of the fourth embodiment of the
present invention.
[0047] Fig. 34 is a graph showing the normalized frequency of the fourth embodiment of the
present invention.
[0048] Fig. 35 includes schematic views of the relevant part according to a sixth embodiment
of the present invention.
[0049] Fig. 36 includes schematic views of the relevant part according to the sixth embodiment
of the present invention.
[0050] Fig. 37 includes schematic views of the relevant part according to the sixth embodiment
of the present invention.
[0051] Fig. 38 is a graph illustrating a spectrum of the sixth embodiment of the present
invention.
[0052] Fig. 39A is a view illustrating a photonic crystal having discrete structures.
[0053] Fig. 39B includes views illustrating individual layers of the photonic crystal having
the discrete structures.
[0054] Fig. 40A is a view illustrating a photonic crystal having discrete structures.
[0055] Fig. 40B includes views illustrating individual layers of the photonic crystal having
the discrete structures.
DESCRIPTION OF THE EMBODIMENTS
First Embodiment
[0056] Fig. 1 is a view of a woodpile structure A. The woodpile structure A includes four
layers 101 to 104 forming the fundamental period in the x-y plane.
[0057] Fig. 2 shows x-y cross-sectional views of the individual layers of the woodpile structure
A. In the first layer 101 and the third layer 103, a plurality of columnar structures
101a and 103a extending in the y-axis direction are periodically disposed at regular
intervals P in the x-axis direction. Each of the columnar structures 101a is disposed
at a position shifted by P/2 from the position of the corresponding columnar structure
103a in the x-axis direction. In the second layer 102 and the fourth layer 104, a
plurality of columnar structures 102a and 104a extending in the x-axis direction are
periodically disposed at regular intervals P in the y-axis direction. Each of the
columnar structures 102a is disposed at a position shifted by P/2 from the position
of the corresponding columnar structure 104a in the y-axis direction. The refractive
index of the material constituting the columnar structures 101a to 104a, the shape
of the columnar structures, the intervals at which the columnar structures are disposed,
the thickness of the layers, and the like are optimized, thereby obtaining a complete
photonic bandgap over a desired frequency range.
[0058] Table 1 shows structural parameters of the woodpile structure A. Herein, the term
"in-plane lattice period" represents the interval P of the columnar structures 101a
to 104a shown in Fig. 2. The term "out-of-plane lattice period" represents the fundamental
period formed by a plurality of layers. In the woodpile structure A, the out-of-plane
lattice period represents the total length corresponding to the four layers 101 to
104 in the stacking direction. The term "refractive index" described in Table 1 represents
the refractive index of a medium constituting the columnar structures 101a to 104a
of the woodpile structure. A medium constituting parts other than the columnar structures
of the woodpile structure is for example air, and the refractive index thereof is
1.0. The term "columnar structure width" represents the length of the columnar structure
in the direction perpendicular to the direction in which the columnar structure in
the layer extends. The term "columnar structure height" represents the length of the
columnar structure in the stacking direction (z-axis direction).
Table 1
| ◆ Structure A |
| · Woodpile structure A |
| Refractive index |
2.4 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.4P |
| Columnar structure width |
0.35P |
| Columnar structure height |
0.35P |
[0059] Fig. 3 is a graph showing the photonic bandgap of the woodpile structure A calculated
by the plane-wave expansion method. The abscissa of the graph represents the wavenumber
vector, that is, the incident direction of electromagnetic waves incident on the photonic
crystal. For example, point K represents a wavenumber vector parallel to the x-axis
(or y-axis), and point X represents a wavenumber vector having a slope of 45° with
respect to the x-axis (or y-axis) in the x-y plane. The ordinate of the graph represents
a normalized frequency normalized by a lattice period.
[0060] A complete photonic bandgap in which light cannot be present regardless of the incident
direction of the light is formed in the frequency range shown by the shaded area in
Fig. 3. When a defect that causes disorder in the period is provided inside such a
three-dimensional photonic crystal, a defect mode having a frequency within the complete
photonic bandgap is generated. The frequency and the wavenumber vector of this defect
mode are determined by the shape or the medium of the defect. When a linear defect
is provided, the dimension of the wavenumber vector is not limited in the direction
of extension of the linear defect. Consequently, in the defect mode, light is guided
in the direction of extension of the linear defect.
[0061] Figs. 4A to 4D are schematic views of a waveguide structure B in which linear defects
are provided inside the woodpile structure A. Fig. 4A is an x-z cross-sectional view
of the waveguide structure B. Figs. 4B to 4D are x-y cross-sectional views of the
waveguide structure B in cross-section IVB, cross-section IVC, and cross-section IVD,
respectively. The waveguide structure B includes a linear defect (first linear defect)
20 extending in the y-axis direction inside the woodpile structure A shown in Fig.
1. The waveguide structure B also includes second linear defects 200, 201, 202 and
203 that are disposed in layers different from the layer having the first linear defect
20 and that are provided in some of the columnar structures extending in the y-axis
direction. The first linear defect 20 is an area where one of the columnar structures
is removed in the first layer 101. The second linear defects 200 to 203 are formed
by changing the columnar structure width of some of the columnar structures in the
third layer 103.
[0062] Table 2 shows the structural parameters of the waveguide structure B. The center
of the first linear defect 20 in the x-z cross-section of Fig. 4A is defined as the
origin of the coordinates. The length of each defect in the x-axis direction in the
layer is defined as a defect width. The length of each defect in the stacking direction
(z-axis direction) is defined as a defect height.
[0063] In Table 2 and Figs. 4A to 4D, the defect widths are represented by 20w and 200w
to 203w, and the defect heights are represented by 20h and 200h to 203h.
Table 2
| ◆Waveguide structure B |
| · Photonic crystal structure |
| Refractive index |
2.4 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.4P |
| Columnar structure width |
0.35P |
| Columnar structure height |
0.35P |
| · First linear defect 20 |
| Central coordinates (x, z) |
(0.00P, 0.00P) |
| Refractive index |
1.0 |
| Defect width 20w |
0.35P |
| Defect height 20h |
0.35P |
| · Second linear defect 200 |
| Central coordinates (x, z) |
(-0.50P, 0.70P) |
| Defect width 200w |
0.20P |
| Defect height 200h |
0.35P |
| · Second linear defect 201 |
| Central coordinates (x, z) |
(0.50P, 0.70P) |
| Defect width 201w |
0.20P |
| Defect height 201h |
0.35P |
| · Second linear defect 202 |
| Central coordinates (x, z) |
(-0.50P, -0.70P) |
| Defect width 202w |
0.20P |
| Defect height 202h |
0.35P |
| · Second linear defect 203 |
| Central coordinates (x, z) |
(0.50P, -0.70P) |
| Defect width 203w |
0.20P |
| Defect height 203h |
0.35P |
[0064] Fig. 5A shows the waveguide mode of the waveguide structure B calculated by the finite-difference
time-domain (FDTD) method. The abscissa of the graph represents the dimension of a
component in the waveguide direction (y-axis direction) of the wavenumber vector normalized
by the lattice period P. The ordinate of the graph represents the frequency normalized
by the lattice period P (normalized frequency). The frequency ranges shown by areas
a in Fig. 5A show the frequency ranges other than the complete photonic bandgap. The
mode present in the complete photonic bandgap shows defect modes due to the defects.
The frequency range shown by area b in Fig. 5A shows the frequency range in which
light can be guided in a single mode among the defect modes.
[0065] As shown in Fig. 5A, the frequency range in which light can be guided in single mode
is in the range of 0.449 to 0.459. When the waveguide mode in the case where only
the first linear defect 20 is provided and the second linear defects 200 to 203 are
not provided in the waveguide structure B is calculated by the FDTD method, the frequency
range in which light can be guided in a single mode is in the range of 0.433 to 0.440.
These results show that the formation of the second linear defects 200 to 203 can
provide a waveguide that can guide light in a single mode over a wider frequency range.
[0066] Fig. 5B shows the electromagnetic field intensity distribution in the x-z cross-section
of the waveguide mode in the frequency range in which light can be guided in a single
mode. The parts shown by the white area represent the area having high electromagnetic
field intensity. This result shows that the waveguide mode has a single-peaked electromagnetic
field intensity distribution in which the electromagnetic field intensity is highly
concentrated near the center of the waveguide.
[0067] Fig. 6 shows the change in the frequency range in which light can be guided in a
single mode in the case where the defect widths 200w, 201w, 202w, and 203w of the
second linear defects 200 to 203 in the waveguide structure B are changed by the same
amount at the same time.
[0068] In Fig. 6, the abscissa represents the defect width and the ordinate represents the
normalized frequency. The continuous line and the broken line that join the points
in Fig. 6 represent the high frequency and the low frequency, respectively, in the
frequency range in which light can be guided in a single mode. By changing the defect
widths 200w, 201w, 202w, and 203w, the frequency range in which light can be guided
in a single mode can be changed. Accordingly, in the waveguide structure B, the frequency
range in which light can be guided in a single mode can be controlled by changing
the shape of the second linear defects 200 to 203.
[0069] The waveguide structure B of the present embodiment can control the frequency range
in which light can be guided in a single mode, and provide a mode having a single-peaked
or substantially single-peaked intensity distribution in the plane perpendicular to
the waveguide direction. The reason for this will be described.
[0070] In the waveguide mode of the waveguide structure B, when the electromagnetic field
intensity distribution of the waveguide mode close to the low frequency side of the
PBG is compared with the electromagnetic field intensity distribution of the waveguide
mode close to the high frequency side, the electromagnetic field intensity distribution
of the mode close to the low frequency side is relatively highly concentrated on the
linear defects. In contrast, in the mode close to the high frequency side, the electromagnetic
field intensity distribution expands to areas distant from the linear defects. In
particular, the electromagnetic field intensity distribution expands in the stacking
direction with respect to the linear defects.
[0071] The relationship between the frequency of light and the wavenumber vector is determined
by the refractive index of the space. Similarly, the relationship between the frequency
of the waveguide mode and the wavenumber vector is determined by the mode refractive
index. Accordingly, when the wavenumber vector is constant, the lower the mode refractive
index, the higher the frequency of the mode. In addition, the mode refractive index
is determined by the ratio with which the electromagnetic field intensity distribution
of the mode is concentrated on a part of the structure having a high refractive index.
[0072] When second linear defects are provided at positions distant from a linear defect
in the stacking direction and the shape of the second linear defects is changed, the
refractive index of the mode close to the high frequency side of the guided mode changes
markedly. Thus, the frequency of the mode can be changed markedly. By using this phenomenon,
the shape of the second linear defects is appropriately designed so that the frequency
of the waveguide mode close to the high frequency side is controlled to a desired
frequency. Thus, the frequency range in which light can be guided in a single mode
can be controlled.
[0073] When the second linear defects are provided near the first linear defect, the electromagnetic
field intensity distribution of the waveguide mode is strongly affected by the second
linear defects. Since the electromagnetic field intensity distribution of the waveguide
mode has a property of being easily concentrated on a part composed of a material
with a high refractive index, the electromagnetic field intensity distribution of
the waveguide mode is concentrated on the second linear defects. Consequently, the
electromagnetic field intensity distribution in the plane perpendicular to the waveguide
direction becomes a double-peaked distribution.
[0074] In contrast, in the waveguide structure B, since the second linear defects are provided
at positions distant from the first linear defect, the second linear defects do not
markedly affect the electromagnetic field intensity distribution of the waveguide
mode. Therefore, the electromagnetic field intensity distribution in the plane perpendicular
to the waveguide direction is a single-peaked distribution in which the intensity
distribution is highly concentrated on the first linear defect.
[0075] In this embodiment, layers that include columnar structures extending in the same
direction as the first linear defect and that are disposed nearest to the first linear
defect are selected, and the second linear defects are provided at columnar structures
disposed nearest to the first linear defect. Alternatively, the second linear defects
may be provided at other columnar structures. For example, layers that include columnar
structures extending in the same direction as the first linear defect and that are
disposed nearest to the first linear defect are selected, and the second linear defects
may be provided at columnar structures disposed at positions distant from the first
linear defect. In this case, the same advantages can be achieved. Alternatively, the
second linear defects may be provided at columnar structures disposed in layers that
are further from the first linear defect in the stacking direction. In this case,
the same advantages can be achieved.
[0076] It is effective if the distance between the first linear defect and the second linear
defects in the stacking direction is in the range of 0.5 to 1.5 times the out-of-plane
lattice period. The reason for this is as follows. When the second linear defects
are provided at positions nearer than 0.5 times the out-of-plane lattice period, it
is difficult to obtain the waveguide mode in which the electromagnetic field intensity
distribution in the plane perpendicular to the waveguide direction is a single-peaked
distribution. When the second linear defects are provided at positions farther than
1.5 times the out-of-plane lattice period, the electromagnetic field of the waveguide
mode is weak and the second linear defects do not significantly affect the waveguide
mode.
[0077] The number of columnar structures having the second linear defects is not limited
to that given in this embodiment. When a plurality of linear defects are provided,
the shapes of the linear defects may be different from each other. The frequency of
the waveguide mode can be controlled more precisely by controlling the position, the
number, and the shape of the second linear defects.
[0078] Next, the fact that the advantages of the present invention can be achieved regardless
of the refractive index of the medium of the columnar structures constituting the
photonic crystal will be described. A description will be made of a waveguide structure
C that is composed of a three-dimensional photonic crystal having columnar structures
with a refractive index of 3.6 and that has the same structure as the waveguide structure
B. Table 3 shows the structural parameters of the waveguide structure C.
Table 3
| ◆Waveguide structure C |
| · Photonic crystal structure |
| Refractive index |
3.6 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.2P |
| Columnar structure width |
0.30P |
| Columnar structure height |
0.30P |
| · First linear defect 20 |
| Central coordinates (x, z) |
(0.00P, 0.00P) |
| Refractive index |
1.0 |
| Defect width 20w |
1.70P |
| Defect height 20h |
0.30P |
| · Second linear defect 200 |
| Central coordinates (x, z) |
(-0.50P, 0.60P) |
| Defect width 200w |
0.25P to 0.20P |
| Defect height 200h |
0.30P |
| · Second linear defect 201 |
| Central coordinates (x, z) |
(0.50P, 0.60P) |
| Defect width 201w |
0.25P to 0.20P |
| Defect height 201h |
0.30P |
| · Second linear defect 202 |
| Central coordinates (x, z) |
(-0.50P, -0.60P) |
| Defect width 202w |
0.25P to 0.20P |
| Defect height 202h |
0.30P |
| · Second linear defect 203 |
| Central coordinates (x, z) |
(0.50P, -0.60P) |
| Defect width 203w |
0.25P to 0.20P |
| Defect height 203h |
0.30P |
[0079] Fig. 7 shows the change in the frequency range in which light can be guided in a
single mode in the case where the defect widths 200w, 201w, 202w, and 203w in the
waveguide structure C are changed by the same amount at the same time. In Fig. 7,
the abscissa represents the defect width and the ordinate represents the normalized
frequency. The continuous line and the broken line that join the points in Fig. 7
represent the high frequency and the low frequency, respectively, in the frequency
range in which light can be guided in a single mode. The waveguide mode is calculated
by the FDTD method. By changing the defect widths 200w, 201w, 202w, and 203w, the
area in which light can be guided in a single mode changes. Thus, regardless of the
refractive index of the medium constituting the three-dimensional photonic crystal
structure, the frequency range in which light can be guided in a single mode can be
controlled by controlling the shape of the second linear defects.
[0080] As described above, according to this embodiment, regarding structures produced by
providing the woodpile structure with a waveguide structure, a waveguide that can
guide light in a mode that is a single mode and that has a desired intensity distribution
over a desired frequency range can be realized.
[0081] As in known structures, it is important that at least two types of medium having
a high refractive index ratio are used as the media constituting the above-described
waveguide structure using the three-dimensional photonic crystal. The photonic bandgap
is obtained on the basis of a refractive index distribution in the crystal. Therefore,
a combination of media that provide a larger refractive index ratio can provide a
wider photonic bandgap. In order to obtain a photonic bandgap having an effective
width, the refractive index ratio may be 2 or more. A material having a high refractive
index, such as Si, GaAs, InP, Ge, TiO
2, GaN, Ta
2O
5, or Nb
2O
5, can be used as the medium of the columnar structures. Furthermore, a transparent
material that has no absorption in the wavelength range used can be used. A medium
having a low refractive index such as a dielectric substance e.g., SiO
2; an organic polymeric material, e.g., polymethylmethacrylate (PMMA); air; or water
is used as the medium other than the medium constituting the columnar structures.
The medium constituting the first linear defect formed by removing some of the columnar
structures is not limited to air and may be composed of the above-described medium
having a low refractive index.
[0082] For example, regarding the first linear defect, the shape of the defect is the same
as or different from the shape of the columnar structure, and the refractive index
may be changed. Regarding the second linear defects, the shape of the columnar structures
is the same, and in addition, the position of the second linear defects may be changed.
Alternatively, the shape of the columnar structure may be changed, and in addition,
the position of the defects may be changed. Alternatively, the refractive index of
the material of the columnar structure may be changed. These embodiments may be combined.
[0083] A known production method (such as a method of repeating structural patterning using
electron beam lithography and stacking, a method of fusion bonding of wafers, or a
nanoimprint method) can be employed to produce the waveguide.
Second Embodiment
[0084] Fig. 8 is a schematic view of a three-dimensional photonic crystal structure D exhibiting
a photonic bandgap wider than that of the woodpile structure.
[0085] The three-dimensional photonic crystal structure D includes twelve layers 301 to
312 forming the fundamental period in the x-y plane. Fig. 9 shows a part of the x-y
cross-sections of each layer. In a first layer 301 and a seventh layer 307, a plurality
of columnar structures 301a and 307a extending in the y-axis direction are disposed
at regular intervals P in the x-axis direction. Each of the columnar structures 301a
is disposed at a position shifted by P/2 from the position of the corresponding columnar
structure 307a in the x-axis direction. In a fourth layer 304 and a tenth layer 310,
a plurality of columnar structures 304a and 310a extending in the x-axis direction
are disposed at regular intervals P in the y-axis direction. Each of the columnar
structures 304a is disposed at a position shifted by P/2 from the position of the
corresponding columnar structure 310a in the y-axis direction.
[0086] In a second layer 302 and a third layer 303, discrete structures 302a and 303a are
arrayed at positions corresponding to the intersections of the columnar structures
301a of the first layer 301 and the columnar structures 304a of the fourth layer 304a.
The discrete structures 302a and 303a are discretely arrayed so as not to be in contact
with each other in the x-y plane. The discrete structures 302a and 303a have a symmetry
such that the discrete structures have the same shape and overlap with each other
when rotated by 90 degrees in the x-y plane. Similarly, a fifth layer 305, a sixth
layer 306, an eighth layer 308, a ninth layer 309, an eleventh layer 311, and a twelfth
layer 312, which are disposed between layers including the columnar structures, include
discrete structures. Specifically, discrete structures 305a, 306a, 308a, 309a, 311a,
and 312a are discretely arrayed in the x-y plane at positions corresponding to the
intersections of the columnar structures of the adjacent layers.
[0087] A wide complete photonic bandgap can be obtained over a desired frequency range (wavelength
range) by optimizing the refractive index of the material of the columnar structures
and the discrete structures, the shape of the columnar structures or the discrete
structures, the intervals at which the columnar structures or the discrete structures
are disposed, the thickness of each layer, and the like. The second, third, fifth,
sixth, eighth, ninth, eleventh, and twelfth layers are layers including discrete structures.
[0088] Table 4 shows the structural parameters of the three-dimensional photonic crystal
structure D used in the second embodiment.
[0089] The term "in-plane lattice period" represents the interval P of the columnar structures
shown in Fig. 9. The term "out-of-plane lattice period" represents the fundamental
period formed by a plurality of layers. In the three-dimensional photonic crystal
structure D, the out-of-plane lattice period represents the total length corresponding
to the twelve layers 301 to 312 in the stacking direction. The term "refractive index"
shown in Table 4 represents the refractive index of a medium constituting the columnar
structures and the discrete structures of the three-dimensional photonic crystal structure
D. A medium constituting parts other than the columnar structures and the discrete
structures of the three-dimensional photonic crystal structure D is air, and the refractive
index thereof is 1.0. The term "discrete structure width" represents the length of
each discrete structure shown in Fig. 9 in the in-plane direction. The discrete structure
widths are represented by Dw1 and Dw2 in Table 4 and Fig. 9. The term "discrete structure
height" represents the length of the discrete structure in the stacking direction
(z-axis direction). The discrete structure height is represented by Dh in Table 4
and Fig. 8.
Table 4
| Three-dimensional photonic crystal structure D |
| · Photonic crystal structure |
| Refractive index |
2.4 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.4P |
| Columnar structure width |
0.30P |
| Columnar structure height |
0.25P |
| Discrete structure width Dw1 |
0.60P |
| Discrete structure width Dw2 |
0.40P |
| Discrete structure height Dh |
0.05P |
[0090] Fig. 10 is a graph showing the photonic bandgap of the three-dimensional photonic
crystal structure D calculated by the plane-wave expansion method.
[0091] The ordinate and the abscissa in Fig. 10 are the same as those in Fig. 3 of the first
embodiment. A complete photonic bandgap in which light cannot be present regardless
of the incident direction of the light is formed in the frequency range shown by the
shaded area. When a linear defect is provided inside the three-dimensional photonic
crystal structure D, a waveguide mode having a frequency within the complete photonic
bandgap can be generated.
[0092] Figs. 11A to 11D are schematic views of a waveguide structure E in which linear defects
are provided inside the three-dimensional photonic crystal structure D. The waveguide
structure E includes a first linear defect 40 extending in the y-axis direction inside
the three-dimensional photonic crystal structure D. The waveguide structure E also
includes second linear defects 400, 401, 402, and 403 that are disposed in layers
different from the layer having the first linear defect 40 and that are prepared by
modifying some of the columnar structures extending in the y-axis direction.
[0093] The first linear defect 40 is an area where one of the columnar structures of the
first layer and some of the discrete structures of the two adjacent layers disposed
on the first layer and the two adjacent layers disposed under the first layer are
removed.
[0094] This structure is the same as a first linear defect 50 shown in Fig. 14 and a first
linear defect 60 shown in Fig. 16, which will be described below.
[0095] Fig. 11A shows an x-z cross section of the waveguide structure E. Figs. 11B to 11D
are x-y cross-sectional views of the waveguide structure E in cross-section XIB, cross-section
XIC, and cross-section XID, respectively.
[0096] Table 5 shows the structural parameters of the waveguide structure E. The waveguide
structure E includes second linear defects 400, 401, 402, and 403 in which the width
of columnar structures extending in the y-axis direction is 0.20P. A height 40h of
the first linear defect 40 is the sum of the height of the first layer 301 and that
of the two adjacent layers disposed on the first layer 301 and the two adjacent layers
disposed under the first layer 301. A first linear defect width 40w corresponds to
the discrete structure width Dw1 of the third layer 303. The term "defect width" represents
the length of each defect in the x-axis direction in the layer. The defect widths
are represented by 40w and 400w to 403w in Table 5 and Figs. 11B to 11D. The term
"defect height" represents the length of each defect in the stacking direction (z-axis
direction). The defect heights are represented by 40h and 400h to 403h in Table 5
and Fig. 11A. The center of the first linear defect 40 provided in the x-z cross-section
of Fig. 11A is defined as the origin of the coordinates.
Table 5
| ◆ Waveguide structure E |
| · Photonic crystal structure D |
| Refractive index |
2.4 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.4P |
| Columnar structure width |
0.30P |
| Columnar structure height |
0.25P |
| Discrete structure width Dw1 |
0.60P |
| Discrete structure width Dw2 |
0.40P |
| Discrete structure height Dh |
0.05P |
| · First linear defect 40 |
| Central coordinates (x, z) |
(0.00P, 0.00P) |
| Refractive index |
1.0 |
| Defect width 40w |
0.60P |
| Defect height 40h |
0.45P |
| · Second linear defect 400 |
| Central coordinates (x, z) |
(-0.50P, 0.70P) |
| Defect width 400w |
0.2P |
| Defect height 400h |
0.25P |
| · Second linear defect 401 |
| Central coordinates (x, z) |
(0.50P, 0.70P) |
| Defect width 401w |
0.2P |
| Defect height 401h |
0.25P |
| · Second linear defect 402 |
| Central coordinates (x, z) |
(-0.50P, -0.70P) |
| Defect width 402w |
0.2P |
| Defect height 402h |
0.25P |
| · Second linear defect 403 |
| Central coordinates (x, z) |
(0.50P, -0.70P) |
| Defect width 403w |
0.2P |
| Defect height 403h |
0.25P |
[0097] Fig. 12A shows the waveguide mode of the waveguide structure E calculated by the
FDTD method. The abscissa of the graph represents the dimension of a component in
the waveguide direction (y-axis direction) of the wavenumber vector normalized by
the lattice period P. The ordinate of the graph represents the frequency normalized
by the lattice period P (normalized frequency). The frequency ranges shown by areas
a in Fig. 12A show the frequency ranges other than the complete photonic bandgap.
In Fig. 12A, the frequency range shown by area b shows the frequency range in which
light can be guided in a single mode among waveguide modes. The frequency range in
which light can be guided in a single mode is in the range of 0.462 to 0.478. When
the waveguide mode in the case where only the first linear defect 40 is provided and
the second linear defects 400 to 403 are not provided in the waveguide structure E
is calculated by the FDTD method, the frequency range in which light can be guided
in a single mode is in the range of 0.452 to 0.466. These results show that the formation
of the second linear defects 400 to 403 can provide a waveguide that can guide light
in a single mode over a wider frequency range.
[0098] Fig. 12B shows the electromagnetic field intensity distribution in the x-z cross-section
of the waveguide mode in the frequency range in which light can be guided in a single
mode in the waveguide structure E. The parts shown by the whiter area represent the
area having higher electromagnetic field intensity. This result shows that the waveguide
mode has a single-peaked electromagnetic field intensity distribution in which the
electromagnetic field intensity is highly concentrated near the center of the waveguide.
[0099] Fig. 13 shows the change in the frequency range in which light can be guided in a
single mode in the case where the defect widths 400w, 401w, 402w, and 403w of the
second linear defects 400 to 403 in the waveguide structure E are changed by the same
amount at the same time. In Fig. 13, the abscissa represents the defect width and
the ordinate represents the normalized frequency. The continuous line and the broken
line that join the points in Fig. 13 represent the high frequency and the low frequency,
respectively, in the frequency range in which light can be guided in a single mode.
By changing the defect widths 400w, 401w, 402w, and 403w, the frequency range in which
light can be guided in a single mode is changed. Accordingly, in the waveguide structure
E, the frequency range in which light can be guided in a single mode can be controlled
by changing the shape of the second linear defects 400 to 403, which are provided
some of the columnar structures disposed in layers different from the layer having
the first linear defect 40.
[0100] The waveguide structure E of this embodiment can control the frequency range in which
light can be guided in a single mode, and provide a substantially single-peaked intensity
distribution in the plane perpendicular to the waveguide direction. The reason for
this is the same as in the first embodiment.
[0101] In this embodiment, layers that include columnar structures extending in the same
direction as the first linear defect and that are disposed nearest to the first linear
defect are selected, and the second linear defects are provided at columnar structures
disposed nearest to the first linear defect. Alternatively, the second linear defects
may be provided at other columnar structures. For example, layers that include columnar
structures extending in the same direction as the first linear defect and that are
disposed nearest to the first linear defect are selected, and the second linear defects
may be provided at columnar structures disposed at positions more distant from the
first linear defect. In this case, the same advantages can be achieved. Alternatively,
the second linear defects may be provided at columnar structures disposed in layers
that are more distant from the first linear defect in the stacking direction. In this
case, the same advantages can be achieved. It is effective if the distance between
the first linear defect and the second linear defects in the stacking direction is
in the range of 0.5 to 1.5 times the out-of-plane lattice period. The reason for this
is as follows. At positions nearer than 0.5 times the out-of-plane lattice period,
it is difficult to obtain the waveguide mode in which the electromagnetic field intensity
distribution in the plane perpendicular to the waveguide direction is a single-peaked
distribution. At positions farther than 1.5 times the out-of-plane lattice period,
the electromagnetic field of the waveguide mode is weak. Therefore, even when the
second linear defects are provided, the second linear defects do not significantly
affect the waveguide mode.
[0102] The number of the second linear defects is not limited to that given in this embodiment.
When a plurality of linear defects are provided, the shapes of the linear defects
may be different from each other.
[0103] Next, an embodiment of a waveguide structure F including the three-dimensional photonic
crystal structure D will be described. In this waveguide structure F, instead of or
in addition to the columnar structures extending in the same direction as the first
linear defect, the second linear defects are provided at some of the discrete structures.
[0104] In a waveguide structure F shown in Fig. 14, a first linear defect 50 extending in
the y-axis direction is provided inside the three-dimensional photonic crystal structure
D, and the shape of some of the discrete structures disposed in layers different from
the layer having the first linear defect 50 is changed. The area of the first linear
defect 50 is filled with air.
[0105] Fig. 14A shows an x-z cross-sectional view of the waveguide structure F. Figs. 14B
to 14D are x-y cross-sectional views. In this embodiment, in the layers shown in Figs.
14C and 14D (corresponding to the fifth layer 305 and the ninth layer 309 shown in
Fig. 9), the width of the x-axis direction of the discrete structures disposed nearest
to the first linear defect 50 is changed. Figs. 14C and 14D shows structures including
second linear defects 500, 501, 502, and 503 formed by changing the width in the x-axis
direction.
[0106] Table 6 shows the structural parameters of the waveguide structure F. A height 50h
of the first linear defect 50 is the sum of the height of the first layer 301 and
that of the two adjacent layers disposed on the first layer 301 and the two adjacent
layers disposed under the first layer 301. The height of the second linear defects
corresponds to the height of the discrete structures. The term "defect width" represents
the lengths of each defect in the x-y plane directions in the layer. In Table 6 and
Figs. 14B to 14D, the lengths in the x-axis direction are represented by 50w and 500w1
to 503w1, and the lengths in the y-axis direction are represented by 500w2 to 503w2.
In the columns of defect widths (500w1, 501w1, 502w1, and 503w1) in Table 6, the term
"0.00P" means that the case where the linear defect is not present. The term "defect
height" represents the length of each defect in the stacking direction (z-axis direction).
The defect heights are represented by 50h and 500h to 503h in Table 6 and Fig. 14A.
The waveguide mode was calculated by the FDTD method.
Table 6
| ◆Waveguide structure F |
| · Photonic crystal structure D |
| Refractive index |
2.4 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.4P |
| Columnar structure width |
0.30P |
| Columnar structure height |
0.25P |
| Discrete structure width Dw1 |
0.60P |
| Discrete structure width Dw2 |
0.40P |
| Discrete structure height Dh |
0.05P |
| · First linear defect 50 |
| Central coordinates (x, z) |
(0.00P, 0.00P) |
| Refractive index |
1.0 |
| Defect width 50w |
0.60P |
| Defect height 50h |
0.45P |
| · Second linear defect 500 |
| Central coordinates (x, z) |
(-0.50P, 0.90P) |
| Defect width 500w1 |
0.00P to 0.40P |
| Defect width 500w2 |
0.40P |
| Defect height 500h |
0.05P |
| · Second linear defect 501 |
| Central coordinates (x, z) |
(0.50P, 0.90P) |
| Defect width 501w1 |
0.00P to 0.40P |
| Defect width 501w2 |
0.40P |
| Defect height 501h |
0.05P |
| · Second linear defect 502 |
| Central coordinates (x, z) |
(-0.50P, -0.90P) |
| Defect width 502w1 |
0.00P to 0.40P |
| Defect width 502w2 |
0.40P |
| Defect height 502h |
0.05P |
| · Second linear defect 503 |
| Central coordinates (x, z) |
(0.50P, -0.90P) |
| Defect width 503w1 |
0.00P to 0.40P |
| Defect width 503w2 |
0.40P |
| Defect height 503h |
0.05P |
[0107] Fig. 15 shows the change in the frequency range in which light can be guided in a
single mode in the case where the defect widths 500w1, 501w1, 502w1, and 503w1 of
the waveguide structure F are changed by the same amount at the same time. In Fig.
15, the abscissa represents the defect width and the ordinate represents the normalized
frequency.
[0108] The continuous line and the broken line that join the points in Fig. 15 represent
the high frequency and the low frequency, respectively, in the frequency range in
which light can be guided in a single mode. By changing the defect widths 500w1, 501w1,
502w1, and 503w1, the frequency range in which light can be guided in a single mode
is changed.
[0109] Figs. 16A to 16D shows a waveguide structure G. In the waveguide structure G, a first
linear defect 60 extending in the y-axis direction and second linear defects 600,
601, 602, and 603 are provided inside the three-dimensional photonic crystal structure
D. The second linear defects 600, 601, 602, and 603 are formed by changing the width
of the y-axis direction of the discrete structures disposed nearest to the first linear
defect 60 in the layers shown in Figs. 16C and 16D. Table 7 shows the structural parameters
of the waveguide structure G. In Table 7 and Figs. 16B to 16D, the lengths in the
x-axis direction are represented by 60w and 600w1 to 603w1, and the lengths in the
y-axis direction are represented by 600w2 to 603w2. In the columns of defect widths
(600w2, 601w2, 602w2, and 603w2) in Table 7, the term "0.00P" means that the case
where the linear defect is not present. The term "defect height" represents the length
of each defect in the stacking direction. The defect heights are represented by 60h
and 600h to 603h in Table 7 and Fig. 16A. The waveguide mode was calculated by the
FDTD method.
Table 7
| ◆Waveguide structure G |
| · Photonic crystal structure D |
| Refractive index |
2.4 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.4P |
| Columnar structure width |
0.30P |
| Columnar structure height |
0.25P |
| Discrete structure width Dw1 |
0.60P |
| Discrete structure width Dw2 |
0.40P |
| Discrete structure height Dh |
0.05P |
| · First linear defect 60 |
| Central coordinates (x, z) |
(0.00P, 0.00P) |
| Refractive index |
1.0 |
| Defect width 60w |
0.60P |
| Defect height 60h |
0.45P |
| · Second linear defect 600 |
| Central coordinates (x, z) |
(-0.50P, 0.85P) |
| Defect width 600w1 |
0.40P |
| Defect width 600w2 |
0.00P to 0.40P |
| Defect height 600h |
0.05P |
| · Second linear defect 601 |
| Central coordinates (x, z) |
(0.50P, 0.85P) |
| Defect width 601w1 |
0.40P |
| Defect width 601w2 |
0.00P to 0.40P |
| Defect height 601h |
0.05P |
| · Second linear defect 602 |
| Central coordinates (x, z) |
(-0.50P, -0.85P) |
| Defect width 602w1 |
0.40P |
| Defect width 602w2 |
0.00P to 0.40P |
| Defect height 602h |
0.05P |
| · Second linear defect 603 |
| Central coordinates (x, z) |
(0.50P, -0.85P) |
| Defect width 603w1 |
0.40P |
| Defect width 603w2 |
0.00P to 0.40P |
| Defect height 603h |
0.05P |
[0110] Fig. 17 shows the change in the frequency range in which light can be guided in a
single mode in the case where the defect widths 600w2, 601w2, 602w2, and 603w2 of
the waveguide structure G are changed by the same amount at the same time. In Fig.
17, the abscissa represents the defect width and the ordinate represents the normalized
frequency. The continuous line and the broken line that join the points in Fig. 17
represent the high frequency and the low frequency, respectively, in the frequency
range in which light can be guided in a single mode. By changing the defect widths
600w2, 601w2, 602w2, and 603w2, the frequency range in which light can be guided in
a single mode is changed.
[0111] As described above, regarding the second linear defects formed by changing the shape
of the discrete structures, the frequency range in which light can be guided in a
single mode can be controlled by changing the shape of the second linear defects.
[0112] In this embodiment, the second linear defects are provided at discrete structures
that are disposed in layers different from the layer having the first linear defect
and that are disposed nearest to the first linear defect. Alternatively, the second
linear defects may be provided at other discrete structures.
[0113] For example, the second linear defects may be provided at discrete structures that
are disposed in layers different from the layer having the first linear defect and
that are disposed at positions more distant from the first linear defect or discrete
structures that are disposed in layers more distant from the first linear defect in
the stacking direction. Alternatively, the second linear defects may be provided at
discrete structures adjacent to columnar structures extending in the y-axis direction.
In these cases the same advantages can be achieved. It is effective if the distance
between the first linear defect and the second linear defects in the stacking direction
is in the range of 0.5 to 1.5 times the out-of-plane lattice period.
[0114] The reason for this is as follows. At positions nearer than 0.5 times the out-of-plane
lattice period, it is difficult to obtain the waveguide mode in which the electromagnetic
field intensity distribution in the plane perpendicular to the waveguide direction
is a single-peaked distribution. On the other hand, when the second linear defects
are provided at positions farther than 1.5 times the out-of-plane lattice period,
the second linear defects do not significantly affect the waveguide mode.
[0115] Furthermore, the second linear defects may be provided at both the columnar structures
and the discrete structures. The number of the second linear defects is not limited
to that given in this embodiment. When a plurality of defects are provided, the shapes
of the defects may be different from each other.
[0116] A description will be made of the fact that the refractive index of the medium constituting
the photonic crystal is not limited to that given in the above embodiment. In a photonic
crystal composed of a medium having a refractive index of 3.6, a waveguide structure
H having the same structure as the waveguide structure E shown in Fig. 11 is prepared.
Table 8 shows the structural parameters of the waveguide structure H. The waveguide
mode was calculated by the FDTD method.
Table 8
| ◆ Waveguide structure H |
| · Photonic crystal structure D |
| Refractive index |
3.6 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.4P |
| Columnar structure width |
0.25P |
| Columnar structure height |
0.25P |
| Discrete structure width Dw1 |
0.60P |
| Discrete structure width Dw2 |
0.40P |
| Discrete structure height Dh |
0.05P |
| · First linear defect 40 |
| Central coordinates (x, z) |
(0.00P, 0.00P) |
| Refractive index |
1.0 |
| Defect width 40w |
0.60P |
| Defect height 40h |
0.45P |
| · Second linear defect 400 |
| Central coordinates (x, z) |
(-0.50P, 0.70P) |
| Defect width 400w |
0.15P to 0.20P |
| Defect height 400h |
0.25P |
| · Second linear defect 401 |
| Central coordinates (x, z) |
(0.50P, 0.70P) |
| Defect width 401w |
0.15P to 0.20P |
| Defect height 401h |
0.25P |
| · Second linear defect 402 |
| Central coordinates (x, z) |
(-0.50P, -0.70P) |
| Defect width 402w |
0.15P to 0.20P |
| Defect height 402h |
0.25P |
| · Second linear defect 403 |
| Central coordinates (x, z) |
(0.50P, -0.70P) |
| Defect width 403w |
0.15P to 0.20P |
| Defect height 403h |
0.25P |
[0117] Fig. 18 shows the change in the frequency range in which light can be guided in a
single mode in the case where the defect widths 400w, 401w, 402w, and 403w are changed
by the same amount at the same time. In Fig. 18, the abscissa represents the defect
width and the ordinate represents the normalized frequency. The continuous line and
the broken line that join the points in Fig. 18 represent the high frequency and the
low frequency, respectively, in the frequency range in which light can be guided in
a single mode. By changing the defect widths 400w, 401w, 402w, and 403w, the frequency
range in which light can be guided in a single mode is changed. This result shows
that the range in which light can be guided in a single mode can be controlled by
controlling the shape of the second linear defects provided in layers different from
the layer having the first linear defect, regardless of the refractive index of the
medium constituting the three-dimensional photonic crystal structure.
[0118] As described above, this embodiment describes waveguide structures prepared by forming
defects in the three-dimensional photonic crystal structure D.
[0119] According to the waveguide structures described in the embodiment, a waveguide that
can guide light in a mode that is a single mode and that has a desired intensity distribution
over a desired frequency range can be realized.
[0120] The medium that can constitute the above-described waveguides using the three-dimensional
photonic crystal and a process for producing the three-dimensional photonic crystal
are the same as those given in the first embodiment. Therefore, further description
is omitted here.
[0121] As an embodiment of the second linear defects in which some of the columnar structures
or some of the discrete structures are modified, instead of the shape, the position
or the refractive index thereof may be changed. Alternatively, the position or the
refractive index may be changed in addition to the change in the shape.
[0122] The embodiment describes a three-dimensional photonic crystal in which each additional
layer includes two layers having discrete structures, but the three-dimensional photonic
crystal is not limited thereto. For example, the three-dimensional photonic crystal
may have a structure in which each additional layer includes one layer or three or
more layers having discrete structures. Alternatively, the three-dimensional photonic
crystal may have a structure in which discrete structures are provided at one side
of a columnar structure. In these cases, the same advantages can also be achieved
by forming linear defects at the positions described above. Cases where the number
of layers having discrete structures is one and three will be described.
[0123] Fig. 39A is a schematic view of the relevant part of a three-dimensional periodic
structure in which the number of layers having discrete structures is one. A three-dimensional
periodic structure 2100 includes eight layers 2101 to 2108 forming the fundamental
period in the x-y plane.
[0124] Fig. 39B includes x-y cross-sectional views of each layer 2101 to 2108.
[0125] In a first layer 2101 and a fifth layer 2105, a plurality of columnar structures
2101a and 2105a composed of a first medium (having a high refractive index) and extending
in the y-axis direction are disposed in the x-axis direction at a regular interval
(pitch) P, respectively. Each of the columnar structures 2101a is disposed at a position
shifted by P/2 from the position of the corresponding columnar structure 2105a in
the x-axis direction. In a third layer 2103 and a seventh layer 2107, a plurality
of columnar structures 2103a and 2107a composed of the first medium and extending
in the x-axis direction are disposed in the y-axis direction at a regular interval
(pitch) P, respectively. Each of the columnar structures 2103a is disposed at a position
shifted by P/2 from the position of the corresponding columnar structure 2107a in
the y-axis direction.
[0126] In a second layer 2102, discrete structures are arrayed at positions corresponding
to the intersections of the columnar structures 2101a of the first layer 2101 and
the columnar structures 2103a of the third layer 2103. Discrete structures 2102a composed
of the first medium are discretely arrayed so as not to be in contact with each other
in the x-y plane. Similarly, in a fourth layer 2104, a sixth layer 2106, and an eight
layer 2108, which are disposed between layers including the columnar structures, discrete
structures are arrayed at positions corresponding to the intersections of the columnar
structures of the adjacent layers. For example, discrete structures 2104a, 2106a,
and 2108a composed of the first medium and having the same shape as the discrete structures
2102a that are discretely arrayed in the x-y plane are arrayed.
[0127] The columnar structures 2101a, 2103a, 2105a, and 2107a and the discrete structures
2102a, 2104a, 2106a, and 2108a of the layers are in contact with each other. Parts
1a other than the columnar structures and the parts 1a other than the discrete structures
of the layers are filled with a second medium (having a low refractive index).
[0128] Fig. 40A is a schematic view of the relevant part of a three-dimensional periodic
structure in which the number of layers having discrete structures is three. A three-dimensional
periodic structure 2300 includes 16 layers 2301 to 2316 forming the fundamental period
in the x-y plane.
[0129] Fig. 40B includes x-y cross-sectional views of each layer 2301 to 2316.
[0130] In a first layer 2301 and a ninth layer 2309, a plurality of columnar structures
2301a and 2309a composed of a first medium and extending in the y-axis direction are
disposed in the x-axis direction at a regular interval P, respectively. Each of the
columnar structures 2301a is disposed at a position shifted by P/2 from the position
of the corresponding columnar structure 2309a in the x-axis direction. In a fifth
layer 2305 and a 13th layer 2313, a plurality of columnar structures 2305a and 2313a
composed of the first medium and extending in the x-axis direction are disposed in
the y-axis direction at a regular interval P, respectively. Each of the columnar structures
2305a is disposed at a position shifted by P/2 from the position of the corresponding
columnar structure 2313a in the y-axis direction.
[0131] In a second layer 2302, a third layer 2303, and a fourth layer 2304, discrete structures
are arrayed at positions corresponding to the intersections of the columnar structures
2301a of the first layer 2301 and the columnar structures 2305a of the fifth layer
2305. For example, discrete structures 2302a, 2303a, and 2304a composed of the first
medium are discretely arrayed so as not to be in contact with each other in the x-y
plane.
[0132] The discrete structures 2302a and 2304a have a symmetry such that the discrete structures
have the same shape and overlap with each other when rotated by 90 degrees in the
x-y plane. Similarly, a sixth layer 2306, a seventh layer 2307, an eighth layer 2308,
a tenth layer 2310, an eleventh layer 2311, a twelfth layer 2312, a 14th layer 2314,
a 15th layer 2315, and a 16th layer 2316, which are disposed between layers including
the columnar structures, include discrete structures. Specifically, discrete structures
2306a, 2307a, 2308a, 2310a, 2311a, 2312a, 2314a, 2315a, and 2316a composed of the
first medium are discretely arrayed in the x-y plane at positions corresponding to
the intersections of the columnar structures of the adjacent layers.
[0133] The columnar structures and the discrete structures of the layers are in contact
with each other. Parts other than the columnar structures and the discrete structures
of the layers are filled with a second medium. A complete photonic bandgap can be
obtained over a desired and a very wide frequency range (wavelength range) by optimizing
the refractive indices of the first medium and the second medium, the shape of the
columnar structures or the discrete structures, the intervals at which the columnar
structures or the discrete structures are disposed, the thickness of each layer, and
the like.
[0134] As in the structure shown in Fig. 39A, the shapes of the columnar structures and
the discrete structures, the extending direction of the columnar structures, the intervals
at which the columnar structures or the discrete structures are disposed, and the
refractive indices of the media used are not limited to those of the structure described
above.
[0135] The three types of discrete structures of the additional layer provided between the
layers having the columnar structures may have different areas in the x-y plane. For
example, the additional layer may include layers having three types of discrete structures
whose areas sequentially vary in the z-axis direction.
[0136] In order to obtain a wider complete photonic bandgap, the number of layers having
discrete structures may be four or more. In such a case, however, since the production
process becomes complex, the number of layers having discrete structures may be selected
according to the intended purpose of the waveguide structure.
[0137] As described above, layers having discrete structures that are discretely arrayed
are provided between layers having columnar structures that are periodically disposed,
thereby obtaining a wide complete photonic bandgap compared with known structures.
Third Embodiment
[0138] Figs. 25A to 25D are schematic views of a waveguide structure I in which linear defects
are provided inside the woodpile structure A. The waveguide structure I includes a
first linear defect 120 and second linear defects 1200, 1201, 1202, and 1203 that
extend in the y-axis direction inside the woodpile structure A.
[0139] The first linear defect 120 is an area where one of the columnar structures is removed
in the first layer 101. The second linear defects 1200, 1201, 1202, and 1203 are disposed
in layers different from the layer having the first linear defect 120 and formed by
shifting the position of some of the columnar structures extending in the y-axis direction
in the layer.
[0140] Fig. 25A is an x-z cross-sectional view of the waveguide structure I. Figs. 25B to
25D are x-y cross-sectional views of the waveguide structure I. In this embodiment,
as shown in Figs. 25C and 25D, a description will be made of a structure including
the second linear defects 1200, 1201, 1202, and 1203 formed by shifting some of the
columnar structures extending in the y-axis direction by 0.10P in the x-axis direction.
[0141] Table 9 shows the structural parameters of the waveguide structure I. The center
of the first linear defect 120 in the x-z cross-section is defined as the origin of
the coordinates. The length of the first linear defect 120 in the x-axis direction
in the layer is defined as defect width. The length of the first linear defect 120
in the stacking direction is defined as the defect height.
[0142] Furthermore, in the layers having the second linear defects, the length ranging from
the central coordinates of a columnar structure before displacement to the central
coordinates of the columnar structure after the displacement is defined as an amount
of displacement. Regarding the sign of the direction, the direction approaching the
origin in the x-axis direction is defined as the positive direction, whereas the direction
away from the origin in the x-axis direction is defined as the negative direction.
In Table 9 and Figs. 25A and 25B, the defect width is represented by 120W, the defect
height is represented by 120h, and the amounts of displacement are represented by
1200Δx, 1201Δx, 1202Δx, and 1203Δx.
Table 9
| ◆Waveguide structure I |
| · Photonic crystal structure |
| Refractive index |
2.4 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.4P |
| Columnar structure width |
0.35P |
| Columnar structure height |
0.35P |
| · First linear defect 120 |
| Central coordinates (x, z) |
(0.00P, 0.00P) |
| Refractive index |
1.0 |
| Defect width 120w |
0.35P |
| Defect height 120h |
0.35P |
| · Second linear defect 1200 |
| Central coordinates (x, z) |
(-0.40P, 0.70P) |
| Amount of displacement 1200Δx |
0.10P |
| · Second linear defect 1201 |
| Central coordinates (x, z) |
(0.40P, 0.70P) |
| Amount of displacement 1201Δx |
0.10P |
| · Second linear defect 1202 |
| Central coordinates (x, z) |
(-0.40P, -0.70P) |
| Amount of displacement 1202Δx |
0.10P |
| · Second linear defect 1203 |
| Central coordinates (x, z) |
(0.40P, -0.70P) |
| Amount of displacement 1203Δx |
0.10P |
[0143] Fig. 26A is a graph showing the waveguide mode of the waveguide structure I calculated
by the FDTD method. In Fig. 26A, the abscissa of the graph represents the dimension
of a component in the waveguide direction (y-axis direction) of the wavenumber vector
normalized by the lattice period P. The ordinate of the graph represents the frequency
normalized by the lattice period P (normalized frequency). The frequency ranges shown
by areas a in Fig. 26A show the frequency range other than the complete photonic bandgap.
The mode present in the complete photonic bandgap shows defect modes due to the defects.
The frequency range shown by area b in Fig. 26A shows the frequency range in which
light can be guided in a single mode among the defect modes. As shown in Fig. 26A,
the frequency range in which light can be guided in single mode is in the range of
0.434 to 0.449. When the waveguide mode in the case where only the first linear defect
120 is provided and the second linear defects 1200 to 1203 are not provided in the
waveguide structure I is calculated by the FDTD method, the frequency range in which
light can be guided in a single mode is in the range of 0.433 to 0.440. These results
show that the formation of the second linear defects 1200 to 1203 can provide a waveguide
that can guide light in a single mode over a wide frequency range.
[0144] Fig. 26B shows the electromagnetic field intensity distribution in the x-z cross-section
of the waveguide mode in the frequency range in which light can be guided in a single
mode in the waveguide structure I. The parts shown by the white area represent the
area having high electromagnetic field intensity. This result shows that the waveguide
mode has a single-peaked electromagnetic field intensity distribution in which the
electromagnetic field intensity is highly concentrated near the center of the waveguide.
[0145] Fig. 27 shows the change in the frequency range in which light can be guided in a
single mode in the case where the amounts of displacement 1200Δx, 1201Δx, 1202Δx,
and 1203Δx of the second linear defects in the waveguide structure I are changed by
the same amount at the same time. The abscissa represents the amount of displacement
and the ordinate represents the normalized frequency. The continuous line and the
broken line that join the points in Fig. 27 represent the high frequency and the low
frequency, respectively, in the frequency range in which light can be guided in a
single mode. By changing the amounts of displacement 1200Δx, 1201Δx, 1202Δx, and 1203Δx
in the positive direction or the negative direction, the frequency range in which
light can be guided in a single mode is changed. Accordingly, in the waveguide structure
I, the frequency range in which light can be guided in a single mode can be controlled
by changing the amount of displacement of the second linear defects.
[0146] In this embodiment, layers that include columnar structures extending in the same
direction as the first linear defect and that are disposed nearest to the first linear
defect are selected, and the second linear defects are provided at columnar structures
disposed nearest to the first linear defect. Alternatively, the defects may be provided
at other columnar structures. For example, layers that include columnar structures
extending in the same direction as the first linear defect and that are disposed nearest
to the first linear defect are selected, and the second linear defects may be provided
at columnar structures disposed at positions more distant from the first linear defect.
In this case, the same advantages can be achieved. Alternatively, the second linear
defects may be provided at columnar structures disposed in layers that are more distant
from the first linear defect in the stacking direction. In this case, the same advantages
can be achieved. It is effective if the distance between the first linear defect and
the second linear defects in the stacking direction is in the range of 0.5 to 1.5
times the out-of-plane lattice period. The reason for this is as follows. At positions
nearer than 0.5 times the out-of-plane lattice period, it is difficult to obtain the
waveguide mode in which the electromagnetic field intensity distribution in the plane
perpendicular to the waveguide direction is a single-peaked distribution. At positions
farther than 1.5 times the out-of-plane lattice period, the electromagnetic field
of the waveguide mode is weak. Therefore, even when the second linear defects are
provided, the second linear defects do not significantly affect the waveguide mode.
[0147] The number of columnar structures having the second linear defects is not limited
to that given in this embodiment. When a plurality of linear defects are provided,
the amounts of displacement and the directions of displacement of the linear defects
may be different from each other. The frequency of the waveguide mode can be controlled
more precisely by controlling the number and the position of the second linear defects.
[0148] Furthermore, the fact that the advantages of the present invention can be achieved
regardless of the refractive index of the medium of the columnar structures constituting
the photonic crystal will be described. A description will be made of a waveguide
structure J that is composed of a three-dimensional photonic crystal having columnar
structures composed of a medium with a refractive index of 3.6 and that has the same
structure as the waveguide structure I (Figs. 25A to 25D). Table 10 shows the structural
parameters of the waveguide structure J.
Table 10
| ◆Waveguide structure J |
| · Photonic crystal structure |
| Refractive index |
3.6 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.2P |
| Columnar structure width |
1.70P |
| Columnar structure height |
0.30P |
| · First linear defect 120 |
| Central coordinates (x, z) |
(0.00P, 0.00P) |
| Refractive index |
1.0 |
| Defect width 120w |
0.30P |
| Defect height 120h |
0.30P |
| · Second linear defect 1200 |
| Central coordinates (x, z) |
(-0.65P to -0.35P, 0.60P) |
| Amount of displacement 1200Δx |
-0.15P to 0.15P |
| · Second linear defect 1201 |
| Central coordinates (x, z) |
(0.65P to 0.35P, 0.60P) |
| Amount of displacement 1201Δx |
-0.15P to 0.15P |
| · Second linear defect 1202 |
| Central coordinates (x, z) |
(-0.65P to -0.35P, -0.60P) |
| Amount of displacement 1202Δx |
-0.15P to 0.15P |
| · Second linear defect 1203 |
| Central coordinates (x, z) |
(0.65P to 0.35P, -0.60P) |
| Amount of displacement 1203Δx |
-0.15P to 0.15P |
[0149] Fig. 28 shows the change in the frequency range in which light can be guided in a
single mode in the case where the amounts of displacement 1200Δx, 1201Δx, 1202Δx,
and 1203Δx in the waveguide structure J are changed by the same amount at the same
time.
[0150] In Fig. 28, the abscissa represents the amount of displacement and the ordinate represents
the normalized frequency. The continuous line and the broken line that join the points
in Fig. 28 represent the high frequency and the low frequency, respectively, in the
frequency range in which light can be guided in a single mode. The waveguide mode
was calculated by the FDTD method. As shown in Fig. 28, by changing the amounts of
displacement 1200Δx, 1201Δx, 1202Δx, and 1203Δx in the positive direction or the negative
direction, the frequency range in which light can be guided in a single mode is changed.
Accordingly, regardless of the refractive index of the medium constituting the three-dimensional
photonic crystal structure, the frequency range in which light can be guided in a
single mode can be controlled by changing the amount of displacement of the second
linear defects.
Fourth Embodiment
[0151] Figs. 29A to 29D are schematic views showing a waveguide structure K in which linear
defects are provided inside the three-dimensional photonic crystal structure D. The
waveguide structure K includes a first linear defect 140 and second linear defects
1400, 1401, 1402, and 1403 that extend in the y-axis direction inside the three-dimensional
photonic crystal structure D. The second linear defects 1400, 1401, 1402, and 1403
are disposed in layers different from the layer having the first linear defect 140
and formed by shifting the position of some of the columnar structures extending in
the y-axis direction in the layer.
[0152] This embodiment describes a structure including the second linear defects 1400, 1401,
1402, and 1403 formed by shifting some of the columnar structures extending in the
y-axis direction by 0.10P in the x-axis direction. Table 11 shows the structural parameters
of the waveguide structure K. A height 140h of the first linear defect 140 is the
sum of the height of the first layer 301 and that of the two adjacent layers disposed
on the first layer 301 and the two adjacent layers disposed under the first layer
301. A width 140w of the first linear defect 140 corresponds to the discrete structure
width Dw1 of the third layer 303. The center of the first linear defect 140 in the
x-z cross-section is defined as the origin of the coordinates. The length of the first
linear defect in the x-axis direction in the layer is defined as defect width. The
length of the first linear defect in the stacking direction is defined as defect height.
In the layers having the second linear defects, the length ranging from the central
coordinates of a columnar structure before displacement to the central coordinates
of the columnar structure after the displacement is defined as an amount of displacement.
Regarding the sign of the direction, the direction approaching the origin in the x-axis
direction is defined as the positive direction, whereas the direction away from the
origin in the x-axis direction is defined as the negative direction. In Table 11 and
Figs. 29A and 29B, the defect width is represented by 140W, the defect height is represented
by 140h, and the amounts of displacement are represented by 1400Δx, 1401Δx, 1402Δx,
and 1403Δx.
Table 11
| ◆Waveguide structure K |
| · Photonic crystal structure D |
| Refractive index |
2.4 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.4P |
| Columnar structure width |
0.30P |
| Columnar structure height |
0.25P |
| Discrete structure width Dw1 |
0.60P |
| Discrete structure width Dw2 |
0.40P |
| Discrete structure height Dh |
0.05P |
| · First linear defect 140 |
| Central coordinates (x, z) |
(0.00P, 0.00P) |
| Refractive index |
1.0 |
| Defect width 140w |
0.60P |
| Defect height 140h |
0.45P |
| · Second linear defect 1400 |
| Central coordinates (x, z) |
(-0.45P, 0.70P) |
| Amount of displacement 1400Δx |
0.05P |
| · Second linear defect 1401 |
| Central coordinates (x, z) |
(0.45P, 0.70P) |
| Amount of displacement 1401Δx |
0.05P |
| · Second linear defect 1402 |
| Central coordinates (x, z) |
(-0.45P, -0.70P) |
| Amount of displacement 1402Δx |
0.05P |
| · Second linear defect 1403 |
| Central coordinates (x, z) |
(0.45P, -0.70P) |
| Amount of displacement 1403Δx |
0.05P |
[0153] Fig. 30A is a graph showing the waveguide mode of the waveguide structure K calculated
by the FDTD method. The abscissa of the graph represents the dimension of a component
in the waveguide direction (y-axis direction) of the wavenumber vector normalized
by the lattice period P. The ordinate of the graph represents the frequency normalized
by the lattice period P (normalized frequency). The frequency ranges shown by areas
a in Fig. 30A show the frequency ranges other than the complete photonic bandgap.
The frequency range shown by area b in Fig. 30A shows the frequency range in which
light can be guided in a single mode among waveguide modes. The frequency range in
which light can be guided in a single mode is in the range of 0.454 to 0.471. When
the waveguide mode in the case where only the first linear defect 140 is provided
and the second linear defects 1400 to 1403 are not provided in the waveguide structure
K is calculated by the FDTD method, the frequency range in which light can be guided
in a single mode is in the range of 0.452 to 0.466. These results show that the formation
of the second linear defects 1400 to 1403 can provide a waveguide that can guide light
in a single mode over a wider frequency range.
[0154] Fig. 30B shows the electromagnetic field intensity distribution in the x-z cross-section
of the waveguide mode in the frequency range in which light can be guided in a single
mode in the waveguide structure K. The parts shown by the whiter area represent the
area having higher electromagnetic field intensity. This result shows that the waveguide
mode has a single-peaked electromagnetic field intensity distribution in which the
electromagnetic field intensity is highly concentrated near the center of the waveguide.
[0155] Fig. 31 shows the change in the frequency range in which light can be guided in a
single mode in the case where the amounts of displacement 1400Δx, 1401Δx, 1402Δx,
and 1403Δx of the second linear defects in the waveguide structure K are changed by
the same amount at the same time. In Fig. 31, the abscissa represents the amount of
displacement and the ordinate represents the normalized frequency. The continuous
line and the broken line that join the points in Fig. 31 represent the high frequency
and the low frequency, respectively, in the frequency range in which light can be
guided in a single mode. By changing the amounts of displacement 1400Δx, 1401Δx, 1402Δ,
and 1403Δ in the positive direction or the negative direction, the frequency range
in which light can be guided in a single mode is changed. Accordingly, in the waveguide
structure K, the frequency range in which light can be guided in a single mode can
be controlled by changing the amount of displacement of the second linear defects.
[0156] The waveguide structure K of this embodiment can control the frequency range in which
light can be guided in a single mode, and provide a substantially single-peaked intensity
distribution in the plane perpendicular to the waveguide direction. The reason for
this is the same as in the third embodiment.
[0157] In this embodiment, layers that include columnar structures extending in the same
direction as the first linear defect and that are disposed nearest to the first linear
defect are selected, and the second linear defects are provided at columnar structures
disposed nearest to the first linear defect. Alternatively, the defects may be provided
at other columnar structures. For example, layers that include columnar structures
extending in the same direction as the first linear defect and that are disposed nearest
to the first linear defect are selected, and the second linear defects may be provided
at columnar structures disposed at positions further from the first linear defect.
In this case, the same advantages can be achieved. Alternatively, the second linear
defects may be provided at columnar structures disposed in layers that are further
from the first linear defect in the stacking direction. In this case, the same advantages
can be achieved.
[0158] It is effective if the distance between the first linear defect and the second linear
defects in the stacking direction is in the range of 0.5 to 1.5 times the out-of-plane
lattice period. The reason for this is as follows. At positions nearer than 0.5 times
the out-of-plane lattice period, it is difficult to obtain the waveguide mode in which
the electromagnetic field intensity distribution in the plane perpendicular to the
waveguide direction is a single-peaked distribution. At positions farther than 1.5
times the out-of-plane lattice period, the electromagnetic field of the waveguide
mode is weak. Therefore, even when the second linear defects are provided, the second
linear defects do not significantly affect the waveguide mode. The number of the second
linear defects is not limited to that given in this embodiment. When a plurality of
linear defects are provided, the amounts of displacement and the directions of displacement
of the linear defects may be different from each other. The frequency of the waveguide
mode can be controlled by controlling the number, the position, and the amount of
displacement of the second linear defects.
[0159] Next, a description will be made of an embodiment including the three-dimensional
photonic crystal structure D in which second linear defects are provided not only
at columnar structures extending in the same direction as a first linear defect but
also at discrete structures. The fact that this structure can control the frequency
range in which light can be guided in a single mode will be described. A waveguide
structure L includes a first linear defect 150 and second linear defects 1500, 1501,
1502, and 1503 that extend in the y-axis direction inside the three-dimensional photonic
crystal structure D. The area filling the first linear defect 150 is air. The second
linear defects 1500, 1501, 1502, and 1503 are formed by shifting the position of some
of discrete structures disposed in layers different from the layer having the first
linear defect 150 in the in-plane direction. Figs. 32C and 32D show a structure including
the second linear defects 1500, 1501, 1502, and 1503 formed by shifting discrete structures
disposed nearest to the first linear defect 150 in the x-axis direction. Table 12
shows the structural parameters of the waveguide structure L. A height 150h of the
first linear defect 150 is the sum of the height of the first layer 301 and that of
the two adjacent layers disposed on the first layer 301 and the two adjacent layers
disposed under the first layer 301. In the layers having the second linear defects,
the length ranging from the central coordinates of a discrete structure before displacement
to the central coordinates of the discrete structure after the displacement is defined
as an amount of displacement. Regarding the sign of the direction, the direction approaching
the origin in the x-axis direction is defined as the positive direction, whereas the
direction away from the origin in the x-axis direction is defined as the negative
direction. In Table 12 and Figs. 32A and 32B, the defect width of the first linear
defect 150 is represented by 150W, the defect height of the first linear defect 150
is represented by 150h, and the amounts of displacement are represented by 1500Δx,
1501Δx, 1502Δx, and 1503Δx. The waveguide mode was calculated by the FDTD method as
in the above embodiments.
Table 12
| ◆Waveguide structure L |
| · Photonic crystal structure D |
| Refractive index |
2.4 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.4P |
| Columnar structure width |
0.30P |
| Columnar structure height |
0.25P |
| Discrete structure width Dw1 |
0.60P |
| Discrete structure width Dw2 |
0.40P |
| Discrete structure height Dh |
0.05P |
| · First linear defect 150 |
| Central coordinates (x, z) |
(0.00P, 0.00P) |
| Refractive index |
1.0 |
| Defect width 150w |
0.60P |
| Defect height 150h |
0.45P |
| · Second linear defect 1500 |
| Central coordinates (x, z) |
(-1.00P to 0.00P, 0.90P) |
| Amount of displacement 1500Δx |
-0.50P to 0.50P |
| · Second linear defect 1501 |
| Central coordinates (x, z) |
(1.00P to 0.00P, 0.90P) |
| Amount of displacement 1501Δx |
-0.50P to 0.50P |
| · Second linear defect 1502 |
| Central coordinates (x, z) |
(-1.00P to 0.00P, -0.90P) |
| Amount of displacement 1502Δx |
-0.50P to 0.50P |
| · Second linear defect 1503 |
| Central coordinates (x, z) |
(1.00P to 0.00P, -0.90P) |
| Amount of displacement 1503Δx |
-0.50P to 0.50P |
[0160] Fig. 33 shows the change in the frequency range in which light can be guided in a
single mode in the case where the amounts of displacement 1500Δx, 1501Δx, 1502Δx,
and 1503Δx in the waveguide structure L are changed by the same amount at the same
time. In Fig. 33, the abscissa represents the amount of displacement and the ordinate
represents the normalized frequency. The continuous line and the broken line that
join the points in Fig. 33 represent the high frequency and the low frequency, respectively,
in the frequency range in which light can be guided in a single mode. As shown in
Fig. 33, by changing the amounts of displacement 1500Δx, 1501Δx, 1502Δ, and 1503Δ
in the positive direction or the negative direction, the frequency range in which
light can be guided in a single mode is changed.
[0161] As described above, the second linear defects are provided at some of the discrete
structures disposed in layers different from the layer having the first linear defect,
and the positions of the second linear defects are shifted in the direction perpendicular
to the direction of extension of the first linear defect. Thereby, the frequency range
in which light can be guided in a single mode can be controlled.
[0162] In this embodiment, the second linear defects are provided at discrete structures
that are disposed in layers different from the layer having the first linear defect
and that are disposed nearest to the first linear defect. Alternatively, the second
linear defects may be provided at other discrete structures.
[0163] For example, the second linear defects may be provided at discrete structures that
are disposed in layers different from the layer having the first linear defect and
that are disposed at positions further from the first linear defect or discrete structures
that are disposed in layers further from the first linear defect in the stacking direction.
Alternatively, the second linear defects may be provided at discrete structures adjacent
to columnar structures extending in the y-axis direction. In these cases, the same
advantages can be achieved. It is effective if the distance between the first linear
defect and the second linear defects in the stacking direction is in the range of
0.5 to 1.5 times the out-of-plane lattice period. Furthermore, the second linear defects
may be provided at both the columnar structures and the discrete structures described
above. The number of the second linear defects is not limited to that given in this
embodiment. When a plurality of linear defects are provided, the amounts of displacement
and the directions of displacement of the linear defects may be different from each
other. The first linear defect in this embodiment is formed by removing a columnar
structure and discrete structures contained in additional layers adjacent to the columnar
structure. Alternatively, the first linear defect may be formed by removing a columnar
structure, or some of columnar structures and some of discrete structures.
[0164] Furthermore, the advantages of the present invention can be achieved regardless of
the refractive index of the medium constituting the photonic crystal. A waveguide
structure M having the same structure as the waveguide structure K shown in Figs.
29A to 29D is formed using a photonic crystal composed of a medium with a refractive
index of 3.6. A description will be made of the fact that the frequency range in which
light can be guided in a single mode can be controlled in this case. Table 13 shows
the structural parameters of the waveguide structure M. The waveguide mode was calculated
by the FDTD method.
Table 13
| ◆Waveguide structure M |
| · Photonic crystal structure D |
| Refractive index |
3.6 |
| In-plane lattice period |
P |
| Out-of-plane lattice period |
1.4P |
| Columnar structure width |
0.25P |
| Columnar structure height |
0.25P |
| Discrete structure width Dw1 |
0.60P |
| Discrete structure width Dw2 |
0.40P |
| Discrete structure height Dh |
0.05P |
| · First linear defect 140 |
| Central coordinates (x, z) |
(0.00P, 0.00P) |
| Refractive index |
1.0 |
| Defect width 140w |
0.60P |
| Defect height 140h |
0.45P |
| · Second linear defect 1400 |
| Central coordinates (x, z) |
(-0.40P to -0.30P, 0.70P) |
| Amount of displacement 1400Δx |
-0.10P to 0.10P |
| · Second linear defect 1401 |
| Central coordinates (x, z) |
(0.40P to 0.30P, 0.70P) |
| Amount of displacement 1401Δx |
-0.10P to 0.10P |
| · Second linear defect 1402 |
| Central coordinates (x, z) |
(-0.40P to -0.30P, -0.70P) |
| Amount of displacement 1402Δx |
-0.10P to 0.10P |
| · Second linear defect 1403 |
| Central coordinates (x, z) |
(0.40P to 0.30P, -0.70P) |
| Amount of displacement 1403Δx |
-0.10P to 0.10P |
[0165] Fig. 34 shows the change in the frequency range in which light can be guided in a
single mode in the case where the amounts of displacement 1400Δx, 1401Δx, 1402Δx,
and 1403Δx are changed by the same amount at the same time. In Fig. 34, the abscissa
represents the amount of displacement and the ordinate represents the normalized frequency.
The continuous line and the broken line that join the points in Fig. 34 represent
the high frequency and the low frequency, respectively, in the frequency range in
which light can be guided in a single mode. The frequency range therebetween represents
a frequency range in which light can be guided in a single mode. By changing the amounts
of displacement 1400Δx, 1401Δx, 1402Δ, and 1403Δ, the frequency range in which light
can be guided in a single mode is changed. Accordingly, regardless of the refractive
index of the medium constituting the three-dimensional photonic crystal structure,
the frequency range in which light can be guided in a single mode can be controlled
by changing the amount of displacement of the second linear defects provided in layers
different from the layer having the first linear defect.
[0166] As described above, according to the waveguide structures of the present invention,
a waveguide that can guide light in a mode that is a single mode and that has a desired
intensity distribution over a desired frequency range can be realized.
[0167] The medium that can constitute the above-described waveguide structures using the
three-dimensional photonic crystal and a process for producing the three-dimensional
photonic crystal are the same as those given in the third embodiment. The present
embodiment describes a three-dimensional photonic crystal in which each additional
layer includes two layers having discrete structures, but the three-dimensional photonic
crystal is not limited thereto. For example, the three-dimensional photonic crystal
may have a structure in which each additional layer includes one layer or three layers
having discrete structures. Alternatively, the three-dimensional photonic crystal
may have a structure in which discrete structures are provided at one side of a columnar
structure. In these cases, the same advantages can also be achieved by forming linear
defects at the positions described above.
Fifth Embodiment
[0168] Embodiments of a device including a waveguide of the present invention will now be
described.
[0169] First, a light-emitting device will be described. A point defect and a linear defect
are provided in a three-dimensional photonic crystal. By optimizing the shape and
the medium of the point defect, a resonator having a resonant mode at a desired frequency
in the photonic bandgap can be produced.
[0170] A luminescent medium whose emission spectrum includes the resonant wavelength is
disposed inside the resonator, and energy is supplied by means of electromagnetic
waves, current, or the like, to the luminescent medium from the outside. Thereby,
light-emitting devices such as a laser and an LED that have a very high efficiency
can be realized. When a waveguide formed by a linear defect is provided in the vicinity
of the point defect resonator and the waveguide has a waveguide mode at a frequency
included in the resonant mode of the resonator, light generated inside the resonator
is coupled with the waveguide mode and is extracted outside the resonator. The extracted
light propagates inside the waveguide as the waveguide mode and is coupled with a
mode propagating in a free space outside the three-dimensional photonic crystal at
an end of the waveguide. Thereby, the light can be guided outside the three-dimensional
photonic crystal.
[0171] Fig. 19 includes schematic views of a light-emitting device 700 including a waveguide
of the present invention and a point defect having an active part that emits light
by carrier injection. The light-emitting device 700 includes a resonator 701a formed
by providing a point defect 701 in a three-dimensional photonic crystal structure,
a p-type electrode 702, a p-type carrier conduction path 703, an n-type electrode
704, and an n-type carrier conduction path 705.
[0172] The resonator 701a includes the active part that emits light by carrier injection.
Holes are supplied to the resonator 701a through the p-type electrode 702 and the
p-type carrier conduction path 703, and electrons are supplied to the resonator 701a
through the n-type electrode 704 and the n-type carrier conduction path 705. The holes
and the electrons are coupled inside the resonator 701a, resulting in light emission
and laser oscillation.
[0173] A waveguide 706 is provided to guide the light to the outside of the resonator 701a.
The waveguide 706 is formed by providing a first linear defect 707 and second linear
defects 708 and 709. The first linear defect 707 is formed by removing some of columnar
structures of the three-dimensional photonic crystal. The second linear defects 708
and 709 are disposed in layers different from the layer having the first linear defect
707. Optimization of the shape of the second linear defects 708 and 709 can provide
a waveguide 706 having a waveguide mode in which light can be guided in a single mode
at a frequency included in the resonant mode of the resonator 701a. When the waveguide
706 is disposed at an appropriate position with respect to the position of the resonator
701a, the resonant mode of the resonator 701a is effectively converted to the waveguide
mode, and the light can be guided outside the three-dimensional photonic crystal from
an end of the waveguide. The use of such a waveguide structure can control the waveguide
mode so that the frequency of the resonant mode corresponds to the frequency range
in which the light is guided in a single mode of the waveguide.
[0174] Furthermore, the waveguide 706 has a waveguide mode in which the electromagnetic
field intensity is highly concentrated at the center of the waveguide in the plane
perpendicular to the waveguide direction. Consequently, light in which the electromagnetic
field intensity distribution does not have asymmetric distortion can be obtained from
the end of the waveguide.
[0175] As described above, with the use of the waveguide according to one of the embodiments
and a point defect resonator, a light-emitting device having a high performance can
be realized.
[0176] Next, Fig. 20 shows an example of a light-emitting device 800 including a waveguide
in which an active medium is provided in a linear defect of a waveguide including
the linear defect of the present invention, and an excitation device that excites
the active medium.
[0177] A waveguide 806 is provided in a three-dimensional photonic crystal. In Fig. 20,
the waveguide 806 includes a first linear defect 807 formed by removing some of the
columnar structures. The waveguide 806 includes second linear defects 808 and 809
formed by changing the shape of some of the columnar structures that are disposed
in layers different from the layer having the first linear defect 807 and extend in
the same direction as the first linear defect 807. In this structure, three-dimensional
photonic crystals 810 and 811 are disposed outside the waveguide so that both ends
of the waveguide are high reflection planes. Furthermore, an active part 801 that
emits light by carrier injection is provided inside the first linear defect 807. The
light-emitting device 800 includes a p-type electrode 802, a p-type carrier conduction
path 803, an n-type electrode 804, and an n-type carrier conduction path 805. Holes
are supplied to the active part 801 through the p-type electrode 802 and the p-type
carrier conduction path 803, and electrons are supplied to the active part 801 through
the n-type electrode 804 and the n-type carrier conduction path 805. The holes and
the electrons are coupled inside the active part 801, resulting in light emission.
The emitted light is guided in the first linear defect 807, and reflected on end faces
of the waveguide. Thus, the emitted light propagates in a reciprocating manner in
the first linear defect 807. In this case, the length of the waveguide 806 in the
waveguide direction and the structural parameters thereof are appropriately designed
so that the resonance condition is satisfied for the waveguide mode of the light emitted
from the active part 801. In this case, the emitted light resonates in the first linear
defect 807 and laser oscillation is performed.
[0178] The waveguide of this embodiment has a waveguide mode in which the electromagnetic
field intensity is highly concentrated at the center of the waveguide in the plane
perpendicular to the waveguide direction. Consequently, light in which the electromagnetic
field intensity distribution does not have asymmetric distortion can be obtained from
an end of the waveguide.
[0179] Furthermore, the waveguide mode can be controlled by changing the shape of the second
linear defects 808 and 809. Therefore, the resonance condition is satisfied for light
having an arbitrary wavelength to perform laser oscillation.
[0180] As described above, a light-emitting device including a waveguide having an active
medium provided in a linear defect of the waveguide according to this embodiment,
and an excitation device that excites the active medium can be used for realizing
a laser device having a high performance.
[0181] Fig. 21 shows an example of an optical branching circuit 900 produced by combining
a linear defect waveguide of the present invention and point defect resonators. A
waveguide is provided in a three-dimensional photonic crystal. A waveguide shown in
Fig. 21 includes a first linear defect 901 formed by removing some of the columnar
structures and second linear defects 902 and 903 formed by changing the shape of some
of the columnar structures that are disposed in layers different from the layer having
the first linear defect 901 and extend in the same direction as the first linear defect
901. Furthermore, resonator structures 904 to 907 composed of points defects are provided
in the vicinity of the waveguide. A desired optical branching can be realized by forming
n resonators when the number of wavelengths to be branched is n. The resonator structures
904 to 907 are designed so that each of the resonator structures operates at a resonant
wavelength different to that of the others. The waveguide structure is designed so
that light is guided in a single mode in a wavelength range including the wavelengths
at which optical branching is performed. By changing the combination of the position,
the number, and the shape of the second linear defects, the waveguide mode can be
controlled so that light is guided in a single mode in a range including the resonant
wavelengths.
[0182] A beam of light including resonant wavelengths λ1, λ 2, λ3, ···, and λn of the individual
point defect resonators, whose spectrum is shown in Fig. 22, is led to such a waveguide
structure. In this case, a beam of light having the wavelength component corresponding
to each resonant wavelength can be taken up in each resonator. On the other hand,
multiplexing can also be performed from the resonators into the waveguide. Such an
optical device is particularly useful for an optical add-drop device used in the optical
communication band.
[0183] As described above, the use of a wavelength filter including a linear defect waveguide
and point defect resonators according to this embodiment can realize an optical add-drop
circuit having a high performance.
Sixth Embodiment
[0184] Fig. 35 includes schematic views of a light-emitting device 1600 including a waveguide
of the present invention and a point defect having an active part that emits light
by carrier injection. The light-emitting device 1600 includes a resonator formed by
providing a point defect 1601 in a three-dimensional photonic crystal structure, a
p-type electrode 1602, a p-type carrier conduction path 1603, an n-type electrode
1604, and an n-type carrier conduction path 1605. The active part that emits light
by carrier injection is provided inside the resonator. Holes are supplied to the resonator
through the p-type electrode 1602 and the p-type carrier conduction path 1603, and
electrons are supplied to the resonator through the n-type electrode 1604 and the
n-type carrier conduction path 1605. The holes and the electrons are coupled inside
the resonator, resulting in light emission and laser oscillation. A waveguide 1606
according to the present invention is provided to guide the light to the outside of
the resonator. The waveguide 1606 is formed by providing a first linear defect 1607
and second linear defects 1608 and 1609. The first linear defect 1607 is formed by
removing some of the columnar structures of the three-dimensional photonic crystal.
The second linear defects 1608 and 1609 are disposed in layers different from the
layer having the first linear defect 1607. By shifting the positions of the second
linear defects 1608 and 1609 to optimize the amount of displacement, a waveguide having
a waveguide mode in which light can be guided in a single mode at a frequency included
in the resonant mode of the resonator can be obtained. When the waveguide is disposed
at an appropriate position with respect to the position of the resonator, the resonant
mode of the resonator is effectively converted to the waveguide mode and the light
can be guided outside the three-dimensional photonic crystal from an end of the waveguide.
Thus, the use of the waveguide structure according to the present invention can control
the waveguide mode so that the frequency of the resonant mode corresponds to the frequency
range in which the light is guided in a single mode of the waveguide. Furthermore,
the waveguide of the present invention has a waveguide mode in which the electromagnetic
field intensity is highly concentrated at the center of the waveguide in the plane
perpendicular to the waveguide direction. Consequently, light in which the electromagnetic
field intensity distribution does not have asymmetric distortion can be obtained from
the end of the waveguide. As described above, with the use of the waveguide according
to the present invention and a point defect resonator, a laser device having a high
performance can be realized.
[0185] Next, Fig. 36 shows an example of a light-emitting device 1700 including a waveguide
in which an active medium is provided in a linear defect of a linear defect waveguide
according to the present invention, and an excitation device that excites the active
medium.
[0186] A waveguide 1706 according to the present invention is provided in a three-dimensional
photonic crystal. In Fig. 36, the waveguide 1706 includes a first linear defect 1707
formed by removing some of the columnar structures. The waveguide 1706 includes second
linear defects 1708 and 1709 formed by shifting the position of some of the columnar
structures that are disposed in layers different from the layer having the first linear
defect 1707 and extend in the same direction as the first linear defect 1707. In this
structure, three-dimensional photonic crystals 1710 and 1711 are disposed outside
the waveguide so that both ends of the waveguide are high reflection planes.
[0187] Furthermore, an active part 1701 that emits light by carrier injection is provided
inside the first linear defect 1707. The light-emitting device 1700 includes a p-type
electrode 1702, a p-type carrier conduction path 1703, an n-type electrode 1704, and
an n-type carrier conduction path 1705. Holes are supplied to the active part 1701
through the p-type electrode 1702 and the p-type carrier conduction path 1703, and
electrons are supplied to the active part 1701 through the n-type electrode 1704 and
the n-type carrier conduction path 1705. The holes and the electrons are coupled inside
the active part 1701, resulting in light emission. The emitted light is guided in
the first linear defect 1707, and reflected on end faces of the waveguide. Thus, the
emitted light propagates in a reciprocating manner in the first linear defect 1707.
In this case, the length of the waveguide 1706 in the waveguide direction and the
structural parameters thereof are appropriately designed so that the resonance condition
is satisfied for the waveguide mode of the light emitted from the active part 1701.
In this case, the emitted light resonates in the first linear defect 1707 and laser
oscillation is performed. The waveguide of this embodiment has a waveguide mode in
which the electromagnetic field intensity is highly concentrated at the center of
the waveguide in the plane perpendicular to the waveguide direction. Consequently,
light in which the electromagnetic field intensity distribution does not have asymmetric
distortion can be obtained from an end of the waveguide.
[0188] Furthermore, the wavelength of the waveguide mode can be controlled by changing the
amount of displacement of the second linear defects 1708 and 1709. Therefore, the
resonance condition is satisfied for light having an arbitrary wavelength to perform
laser oscillation. As described above, a light-emitting device including a waveguide
having an active medium provided in a linear defect of the waveguide according to
the present invention, and an excitation device that excites the active medium can
be used for realizing a laser device having a high performance.
[0189] Various media can be used as the luminescent medium described in the above embodiments
according to a desired resonant wavelength. Examples of the luminescent medium that
can be used include compound semiconductors, inorganic luminescent materials, organic
luminescent materials, polymer luminescent materials, quantum dots, and nanocrystals.
Examples of a method of excitation include photoexcitation using an outer light source,
and excitation by current injection. When excitation by current injection is performed,
the luminescent medium may be sandwiched between electrodes composed of a metal such
as Al or Cr or a transparent conductive material such as indium tin oxide (ITO) to
perform light emission. Furthermore, electrodes that independently operate may be
prepared for a plurality of resonator structures, thereby separately controlling light
emitted from each resonator.
[0190] These devices can be suitably used as light sources for display, light sources for
optical communication, light sources for THz, and light sources for optical pickup
of DVDs, next-generation blue optical recording medium, or the like.
[0191] Fig. 37 shows an example of an optical branching circuit 1800 produced by combining
a linear defect waveguide of the present invention and point defect resonators. A
waveguide of the present invention is provided in a three-dimensional photonic crystal.
A waveguide shown in Fig. 37 includes a first linear defect 1801 formed by removing
some of the columnar structures and second linear defects 1802 and 1803 formed by
shifting the position of some of the columnar structures that are disposed in layers
different from the layer having the first linear defect 1801 and extend in the same
direction as the first linear defect 1801. Furthermore, point defect resonator structures
1804 to 1807 are provided in the vicinity of the waveguide. A desired optical branching
can be realized by forming n resonators when the number of the types of wavelength
to be branched is n. The resonator structures 1804 to 1807 are designed so that each
of the resonator structures operates at a resonant wavelength different that of the
others. The waveguide structure is designed so that light is guided in a single mode
in a wavelength range including the wavelengths at which optical branching is performed.
By changing the combination of the position, the number, and the amount of displacement
of the second linear defects, the waveguide mode can be controlled so that light is
guided in a single mode in a range including the resonant wavelengths.
[0192] A beam of light including resonant wavelengths λ1, λ 2, λ3, ···, and λn of the individual
point defect resonators, whose spectrum is shown in Fig. 38, is led to such a waveguide
structure. In this case, a beam of light having the wavelength component corresponding
to each resonant wavelength can be taken up in each resonator. On the other hand,
multiplexing can also be performed from the resonators into the waveguide. Such an
optical device is particularly useful for an optical add-drop device used in the optical
communication band.
[0193] As described above, the use of a wavelength filter including a linear defect waveguide
and point defect resonators according to the present invention can realize an optical
add-drop circuit having a high performance.
[0194] While the present invention has been described with reference to exemplary embodiments,
it is to be understood that the invention is not limited to the disclosed exemplary
embodiments. The scope of the following claims is to be accorded the broadest interpretation
so as to encompass all modifications, equivalent structures and functions.