(19)
(11) EP 1 788 492 B8

(12) CORRECTED EUROPEAN PATENT SPECIFICATION
Note: Bibliography reflects the latest situation

(15) Correction information:
Corrected version no 1 (W1 B1)

(48) Corrigendum issued on:
07.03.2012 Bulletin 2012/10

(45) Mention of the grant of the patent:
19.10.2011 Bulletin 2011/42

(21) Application number: 05110794.4

(22) Date of filing: 16.11.2005
(51) International Patent Classification (IPC): 
G06F 17/30(2006.01)

(54)

Apparatus and method for searching for 3-dimensional shapes

Vorrichtung und Verfahren zum Suchen von dreidimensionalen Formen

Appareil et procédé pour la recherche de formes tridimensionnelles

(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

(43) Date of publication of application:
23.05.2007 Bulletin 2007/21

(73) Proprietor: Korea Institute of Industrial Technology
Chungnam 330-825 (KR)

(72) Inventors:
  • Choi, Jeongkil
    420-031, Gyeonggi-do (KR)
  • Lee, Youngchul
    406-772, Incheon (KR)
  • Lim, Chaeho
    406-777, Incheon (KR)

(74) Representative: Molnia, David 
df-mp Fünf Höfe Theatinerstrasse 16
80333 München
80333 München (DE)


(56) References cited: : 
US-A1- 2004 103 093
   
  • WEIBIN LIU ET AL: "Interactive Visual Retrieval System for Large Scale 3D Models Database" PROCEEDINGS OF THE 11TH INTERNATIONAL MULTIMEDIA MODELLING CONFERENCE, HONOLULU, HI, US, 12 January 2005 (2005-01-12), pages 458-463, XP010765671 IEEE, PISCATAWAY, NJ, US ISBN: 0-7695-2164-9
  • MAHMOUDI S ET AL: "3D models retrieval by using characteristic views" PROCEEDINGS, 16TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION, QUEBEC CITY, QUE., CA, vol. 2, 11 August 2002 (2002-08-11), pages 457-460, XP010613918 IEEE COMPUT. SOC, LOS ALAMITOS, CA, US ISBN: 0-7695-1695-X
  • PU JIANTAO ET AL: "3D model retrieval based on 2D slice similarity measurements" PROCEEDINGS, 2ND INTERNATIONAL SYMPOSIUM ON 3D DATA PROCESSING, VISUALIZATION AND TRANSMISSION, THESSALONIKI, GR, 6 September 2004 (2004-09-06), pages 95-101, XP010725088 IEEE, PISCATAWAY, NJ, US ISBN: 0-7695-2223-8
   
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