(19)
(11) EP 1 794 855 A1

(12)

(43) Date of publication:
13.06.2007 Bulletin 2007/24

(21) Application number: 05798659.8

(22) Date of filing: 20.09.2005
(51) International Patent Classification (IPC): 
H01S 5/14(2006.01)
H01S 5/026(2006.01)
G01J 3/26(2006.01)
G02B 26/00(2006.01)
H01S 5/0683(2006.01)
G01J 3/10(2006.01)
G02B 5/28(2006.01)
(86) International application number:
PCT/US2005/033712
(87) International publication number:
WO 2006/039154 (13.04.2006 Gazette 2006/15)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

(30) Priority: 29.09.2004 US 953046
29.09.2004 US 953043

(71) Applicant: Axsun Technologies, Inc.
Billerica, MA 01821 (US)

(72) Inventors:
  • FLANDERS, Dale C.
    Lexington, Massachusetts 02420 (US)
  • ATIA, Walid, A.
    Lexington, Massachusetts 02420 (US)
  • KUZNETSOV, Mark, E.
    Lexington, Massachusetts 02421 (US)

(74) Representative: Ganahl, Bernhard et al
Huber & Schüssler Patentanwälte Truderinger Strasse 246
81825 München
81825 München (DE)

   


(54) METHOD AND SYSTEM FOR NOISE CONTROL IN SEMICONDUCTOR SPECTROSCOPY SYSTEM