Abnormality diagnosing method for sound or vibration and abnormality diagnosing apparatus for sound or vibration.

(19)

(11)

EP 1 816 451 A3

(12)	EUROPEAN PATENT APPLICATION

(88)	Date of publication A3:
	14.03.2012 Bulletin 2012/11

(43)	Date of publication A2:
	08.08.2007 Bulletin 2007/32

(21)	Application number: 07290125.9

(22)	Date of filing: 31.01.2007

(51)

International Patent Classification (IPC):

G01H 3/00^(2006.01)

G01H 3/12^(2006.01)

(84)	Designated Contracting States:
	AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR
	Designated Extension States:
	AL BA HR MK RS

(30)

Priority:

01.02.2006 JP 2006025154

(71)	Applicant: JTEKT Corporation
	Osaka-shi Osaka 542-8502 (JP)

(72)	Inventors:
	Ishii Hideaki Jtekt Corporation Osaka-shi, 542-8502 Osaka (JP) Zhang Zhong Toyohashi-shi, 441-8105 Aici (JP) Uemura Hiroshi Jtekt Corporation Osaka-shi, 542-8502 Osaka (JP)

(74)	Representative: Bertrand, Didier
	S.A. Fedit-Loriot 38 Avenue Hoche 75008 Paris 75008 Paris (FR)

(54)	Abnormality diagnosing method for sound or vibration and abnormality diagnosing apparatus for sound or vibration.

(57) A noise detection signal detected at an evaluation point is filtered by a low pass filter, so that an evaluation waveform signal is extracted. A real signal mother wavelet of complex type is derived from the extracted evaluation waveform signal. Using this mother wavelet, an abnormal waveform signal stored in advance is processed by wavelet transformation. Then, a correlation value is calculated between the abnormal waveform signal and the mother wavelet. The correlation value is compared with a predetermined criterion, so that the presence or absence of abnormality in a sound source or vibration source corresponding to each abnormal waveform signal is determined.

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