(19)
(11) EP 1 826 778 B8

(12) CORRECTED EUROPEAN PATENT SPECIFICATION
Note: Bibliography reflects the latest situation

(15) Correction information:
Corrected version no 1 (W1 B1)

(48) Corrigendum issued on:
13.08.2014 Bulletin 2014/33

(45) Mention of the grant of the patent:
07.05.2014 Bulletin 2014/19

(21) Application number: 07003676.9

(22) Date of filing: 22.02.2007
(51) International Patent Classification (IPC): 
A61N 5/10(2006.01)

(54)

Charged particle beam irridiation system and charged particle beam extraction method

Bestrahlungssystem mit geladenem Teilchenstrahl und Extraktionsverfahren für einen geladenen Teilchenstrahl

Système d'irradiation par faisceau de particules chargées et procédé d'extraction d'un faisceau de particules chargées

(84) Designated Contracting States:
DE FR GB IT SE

(30) Priority: 24.02.2006 JP 2006047676

(43) Date of publication of application:
29.08.2007 Bulletin 2007/35

(73) Proprietor: Hitachi, Ltd.
Chiyoda-ku Tokyo 100-8280 (JP)

(72) Inventors:
  • Nihongi, Hideaki
    Chiyoda-ku, Tokyo 100-8220 (JP)
  • Matsuda, Koji
    Chiyoda-ku, Tokyo 100-8220 (JP)
  • Hiramoto, Kazuo
    Chiyoda-ku, Tokyo 100-8220 (JP)
  • Akiyama, Hiroshi
    Chiyoda-ku, Tokyo 100-8220 (JP)

(74) Representative: Strehl Schübel-Hopf & Partner 
Maximilianstrasse 54
80538 München
80538 München (DE)


(56) References cited: : 
EP-A1- 1 541 194
US-A1- 2004 200 983
 EP-A2- 1 763 293
   
       
    Note: Within nine months from the publication of the mention of the grant of the European patent, any person may give notice to the European Patent Office of opposition to the European patent granted. Notice of opposition shall be filed in a written reasoned statement. It shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).