(19)
(11) EP 1 849 038 A2

(12)

(88) Date of publication A3:
05.07.2007

(43) Date of publication:
31.10.2007 Bulletin 2007/44

(21) Application number: 06719077.7

(22) Date of filing: 19.01.2006
(51) International Patent Classification (IPC): 
G03B 17/48(2006.01)
(86) International application number:
PCT/US2006/002109
(87) International publication number:
WO 2006/083581 (10.08.2006 Gazette 2006/32)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR
Designated Extension States:
AL BA HR MK YU

(30) Priority: 31.01.2005 US 648747 P
31.01.2005 US 648951 P
31.01.2005 US 648952 P

(71) Applicant: Cascade Microtech, Inc.
Beaverton, OR 97006 (US)

(72) Inventors:
  • ANDREWS, Peter
    Beaverton, Oregon 97007 (US)
  • HESS, David
    Beaverton, Oregon 97006 (US)
  • NEW, Robert
    Portland, Oregon 97225 (US)

(74) Representative: Beyer, Andreas et al
Wuesthoff & Wuesthoff Patent- und Rechtsanwälte Schweigerstrasse 2
81541 München
81541 München (DE)

   


(54) MICROSCOPE SYSTEM FOR TESTING SEMICONDUCTORS