(19)
(11) EP 1 872 508 A1

(12)

(43) Date of publication:
02.01.2008 Bulletin 2008/01

(21) Application number: 06747345.4

(22) Date of filing: 12.04.2006
(51) International Patent Classification (IPC): 
H04L 9/00(2006.01)
(86) International application number:
PCT/KR2006/001328
(87) International publication number:
WO 2006/112631 (26.10.2006 Gazette 2006/43)
(84) Designated Contracting States:
DE FR GB

(30) Priority: 22.04.2005 KR 20050033544

(71) Applicant: Samsung Electronics Co., Ltd.
Suwon-si 442-742 Gyeonggi-do (KR)

(72) Inventors:
  • HAN, Sung-Hyu, 102-1006 Family 1-danji Apt.
    Seoul 138-767 (KR)
  • KIM, Myung-Sun
    Gyeonggi-do 437-769 (KR)
  • YOON, Young-Sun
    Suwon-si, Gyeonggi-do 441-742 (KR)
  • LEE, Sun-Nam
    Suwon-si, Gyeonggi-do 443-848 (KR)
  • KIM, Bong-Seon, 903-411 Jugong 9-danji Apt.
    Seongnam-si, Gyeonggi-do 463-724 (KR)
  • LEE, Jae-Heung
    Suwon-si, Gyeonggi-do 443-848 (KR)

(74) Representative: Robinson, Ian Michael 
Appleyard Lees 15 Clare Road
Halifax HX1 2HY
Halifax HX1 2HY (GB)

   


(54) METHOD OF MEASURING ROUND TRIP TIME AND PROXIMITY CHECKING METHOD USING THE SAME