(19)
(11) EP 1 919 121 B8

(12) CORRECTED EUROPEAN PATENT SPECIFICATION
Note: Bibliography reflects the latest situation

(15) Correction information:
Corrected version no 1 (W1 B1)

(48) Corrigendum issued on:
31.05.2017 Bulletin 2017/22

(45) Mention of the grant of the patent:
15.03.2017 Bulletin 2017/11

(21) Application number: 07254316.8

(22) Date of filing: 31.10.2007
(51) International Patent Classification (IPC): 
H04L 7/033(2006.01)

(54)

Determining oversampled data to be included in unit intervals

Bestimmung von überabgetasteten Daten, die in Einheitsintervallen eingefügt sein sollten

Détermination de données de suréchantillonnage à être inclus dans des intervalles d'unité

(84) Designated Contracting States:
DE FR GB TR

(30) Priority: 03.11.2006 US 592792

(43) Date of publication of application:
07.05.2008 Bulletin 2008/19

(73) Proprietor: Lattice Semiconductor Corporation
Portland OR 97204 (US)

(72) Inventor:
  • Choi, Hoon
    Mountain View, CA 94040 (US)

(74) Representative: Viering, Jentschura & Partner mbB Patent- und Rechtsanwälte 
Am Brauhaus 8
01099 Dresden
01099 Dresden (DE)


(56) References cited: : 
US-A1- 2003 115 542
US-A1- 2004 066 864
US-B1- 6 529 148
 US-A1- 2003 215 038
US-A1- 2006 062 327
   
       
    Note: Within nine months from the publication of the mention of the grant of the European patent, any person may give notice to the European Patent Office of opposition to the European patent granted. Notice of opposition shall be filed in a written reasoned statement. It shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).