MEASUREMENT ARRANGEMENT FOR DETERMINING THE CHARACTERISTIC LINE PARAMETERS BY MEASURING SCATTERING PARAMETERS - Patent 1963872

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EP 1 963 872 A1

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(43)	Date of publication:
	03.09.2008 Bulletin 2008/36

(21)	Application number: 06819717.7

(22)	Date of filing: 23.11.2006

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International Patent Classification (IPC):

G01R 27/32^(2006.01)

G01R 31/28^(2006.01)

(86)	International application number:
	PCT/EP2006/068838

(87)	International publication number:
	WO 2007/071519 (28.06.2007 Gazette 2007/26)

(84)	Designated Contracting States:
	AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

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Priority:

21.12.2005 EP 05112641

(71)	Applicant: International Business Machines Corporation
	Armonk, NY 10504 (US)

(72)	Inventors:
	LUDWIG, Thomas 71063 Sindelfingen (DE) SCHETTLER, Helmut 72135 Dettenhausen (DE) WINKEL, Thomas-Michael, 71101 Schönaich (DE)

(74)	Representative: Jauregui Urbahn, Kristian
	IBM Deutschland GmbH Patentwesen u. Urheberrecht Postfach 70569 Stuttgart 70569 Stuttgart (DE)

(54)	MEASUREMENT ARRANGEMENT FOR DETERMINING THE CHARACTERISTIC LINE PARAMETERS BY MEASURING SCATTERING PARAMETERS