(19)
(11) EP 1 991 991 A2

(12)

(88) Date of publication A3:
13.12.2007

(43) Date of publication:
19.11.2008 Bulletin 2008/47

(21) Application number: 07751343.0

(22) Date of filing: 20.02.2007
(51) International Patent Classification (IPC): 
G12B 21/20(2006.01)
G01N 13/10(2006.01)
(86) International application number:
PCT/US2007/004574
(87) International publication number:
WO 2007/098237 (30.08.2007 Gazette 2007/35)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

(30) Priority: 20.02.2006 US 743321 P

(71) Applicant: VEECO INSTRUMENTS INC.
Plainview, NY 11803 (US)

(72) Inventors:
  • DAHLEN, Gregory, A.
    Santa Barbara, CA 93101 (US)
  • LIU, Hao-chih
    Goleta, CA 93117 (US)

(74) Representative: Winter, Brandl, Fürniss, Hübner Röss, Kaiser, Polte Partnerschaft Patent- und Rechtsanwaltskanzlei 
Bavariaring 10
80336 München
80336 München (DE)

   


(54) METHOD AND APPARATUS FOR CHARACTERIZING A PROBE TIP