METHOD AND SYSTEM OF TANDEM MASS SPECTROMETRY WITHOUT PRIMARY MASS SELECTION FOR MULTICHARGED IONS - Patent 2044612

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EP 2 044 612 A1

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(43)	Date of publication:
	08.04.2009 Bulletin 2009/15

(21)	Application number: 07765764.1

(22)	Date of filing: 02.07.2007

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International Patent Classification (IPC):

H01J 49/00^(2006.01)

H01J 49/40^(2006.01)

(86)	International application number:
	PCT/EP2007/056655

(87)	International publication number:
	WO 2008/003684 (10.01.2008 Gazette 2008/02)

(84)	Designated Contracting States:
	AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC MT NL PL PT RO SE SI SK TR
	Designated Extension States:
	AL BA HR MK RS

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Priority:

03.07.2006 FR 0605985
12.04.2007 WO PCT/EP2007/053573
24.05.2007 FR 0703661

(71)	Applicant: Physikron
	92100 Boulogne-Billancourt (FR)

(72)	Inventor:
	SCIGOCKI, David 06460 Saint Vallier De Thiey (FR)

(74)	Representative: Le Forestier, Eric et al
	Cabinet Régimbeau 20, rue de Chazelles 75847 Paris Cedex 17 75847 Paris Cedex 17 (FR)

(54)	METHOD AND SYSTEM OF TANDEM MASS SPECTROMETRY WITHOUT PRIMARY MASS SELECTION FOR MULTICHARGED IONS