[0001] The present invention relates to a deformable mirror system composed of a deformable
mirror configured to deform a shape of a reflection surface by using an electrostatic
drive and of a deformable mirror drive device for driving the deformable mirror, and
to a deformable mirror drive device for use in the system.
[0002] In recent years, a deformable mirror configured to deform a reflection surface by
using electrostatic drive, by applying a, so-called, micro-electromechanical system
(MEMS) technique using a semiconductor manufacturing technology has been widely noticed.
[0003] In such a deformable mirror, it is required for obtaining desired reflection to measure
a deformation quantity of the reflection surface. As regards a method for measuring
a deformation quantity, a method for measuring a change in capacitance is disclosed;
for example, in
U.S. Patent No. 7,190,500.
[0004] A deformable mirror disclosed in the U.S. Patent is provided with a flexible thin
film and a control electrode. The flexible thin film includes a reflection surface
to be deformed by electrostatic attractive force and an upper electrode. The control
electrode is an electrode which is arranged facing the thin film and partly works
for control and for detecting capacitance. Applying a voltage between the upper electrode
and the control electrode generates electrostatic drive force and deforms the reflection
surface. A capacitance detection circuit measures capacitance between the upper electrode
and the control electrode to calculate the deformation quantity of the reflection
surface.
[0005] The U.S. Patent discloses the following detection method. The method applies a high
voltage from a constant voltage source to the control electrode through a resistor.
Here, applying a high-frequency voltage from a high-frequency power source to a capacitance
detection electrode that is the control electrode varies potential at the control
electrode. These variations are monitored as changes in electric current by means
of the capacitance detection circuit through the upper electrode. The capacitance,
namely, the deformation quantity of the reflection surface is detected based on a
phase and amplitude of the current detect.
[0006] The U.S. Patent discloses the foregoing method for detecting the deformation quantity
of the reflection surface. However, the U.S. Patent does not disclose a way how to
control a voltage to be applied between the upper electrode and the control electrode
of the deformable mirror by using the detected magnitude of the deformation.
[0007] The present invention has been made in consideration of the above point, and an object
of the invention is to provide a deformable mirror system and a deformable mirror
drive device which are configured to precisely drive a deformable mirror by detecting
the deformation quantity of a reflection surface and by controlling the voltage to
be applied between electrodes by using the detected deformation quantity.
[0008] According to one aspect of the invention, there is provided a deformable mirror system
comprising:
a deformable mirror which comprises a deformation part with a reflection surface formed
thereon, a fixing part fixing the deformation part, and a pair of electrodes disposed
facing the deformation part and the fixing part, respectively;
drive means for generating drive force so as to deform the deformation part; and
capacitance detection means for detecting capacitance between the pair of electrodes,
characterized by further comprising:
conversion means for converting a target deformation quantity signal into a target
capacitance signal on the basis of a relationship between the capacitance and deformation
quantity of the deformation part; and
control means for deciding drive force generated from the drive means so as to coincide
an output from the conversion means with an output from the capacitance detection
means.
[0009] According to another aspect of the invention, there is provided a deformable mirror
drive device comprising:
drive means for generating drive force so as to deform a deformation part of a deformable
mirror which includes the deformation part with a reflection surface formed thereon,
a fixing part fixing the deformation part, and a pair of electrodes disposed so as
to face the deformation part and the fixing part, respectively; and
capacitance detection means for detecting capacitance between the pair of the electrodes
of the deformable mirror, characterized by further comprising:
conversion means for converting a target deformation quantity signal into a target
capacitance signal on the basis of a relationship between the capacitance and deformation
quantity of the deformation part; and
control means for deciding drive force generated from the drive means so as to coincide
an output from the conversion means with an output from the capacitance detection
means.
[0010] The invention can be more fully understood from the following detailed description
when taken in conjunction with the accompanying drawings, in which:
FIG. 1A is an exemplary upper surface view of a deformable mirror in a deformable
mirror system of a first embodiment of the invention;
FIG. 1B is an exemplary cross-sectional view taken on line B-B' of FIG. 1A;
FIG. 2 is an exemplary decomposition view of the deformable mirror;
FIG. 3 is an exemplary view depicting a configuration of the deformable mirror system
of the first embodiment;
FIG. 4 is an exemplary view depicting a configuration example of a compensator in
FIG. 3;
FIG. 5 is an exemplary view depicting another configuration example of the compensator
in FIG. 3;
FIG. 6 is an exemplary view depicting a configuration of a modification example of
the deformable mirror system of the first embodiment;
FIG. 7 is an exemplary view depicting a configuration of another modification example
of the deformable mirror system of the first embodiment;
FIG. 8 is an exemplary view depicting a configuration of further modification example
of the deformable mirror system of the first embodiment;
FIG. 9 is an exemplary view depicting a configuration of a deformable mirror system
of a second embodiment;
FIG. 10 is an exemplary view depicting a configuration of a modification example of
the deformable mirror system of the second embodiment;
FIG. 11 is an exemplary view depicting a configuration of another modification example
of the deformable mirror system of the second embodiment; and
FIG. 12 is an exemplary view depicting a configuration of further modification example
of the deformable mirror system of the second embodiment.
[0011] Hereinafter, excellent embodiments for performing the present invention will be described
with reference to the drawings.
(First Embodiment)
[Description of Device Structure]
[0012] A device structure of a deformable mirror of a deformable mirror system of a first
embodiment of the invention will be firstly described with reference to FIGS. 1A,
1B and 2.
[0013] As shown in these FIGS., a deformable mirror 10 is composed of an electrode substrate
11 and a mirror substrate 12. The electrode substrate 11 and the mirror substrate
12 are fixed through a spacer 13.
[0014] A second electrode 14 and a third electrode 15 are arranged on the electrode substrate
11. The second electrode 14 is electrically connected to a second lead-out electrode
17 by means of wiring 16, and the third electrode 15 is electrically connected to
a third lead-out electrode 19 by means of wiring 18.
[0015] The mirror substrate 12 is composed of a support unit 20 and a deformation part 21.
The support unit 20 supports the deformation part 21 and also operates as a fixation
unit for fixing the mirror substrate 12 to the electrode substrate 11 through the
spacer 13. In this case, the fixation unit fixes the deformation part 21 formed on
the mirror substrate 12 so as to be placed in the position facing the second and the
third electrodes 14, 15.
[0016] Further, a conductive material such as metal is formed on a whole of a surface facing
the second and the third electrodes 14, 15 on the mirror substrate 12, and the conductive
material is used as a first electrode 22. The surface with the first electrode 22
formed thereon is set as a rear surface, and a reflection surface 23 forming a film
of metal on the deformation part 21 is formed on the surface of the mirror substrate
12. While the material to be formed as the film as the reflection surface 23 differs
in specification of the deformable mirror 10, aluminum, gold or a dielectric multilayer
film may be used frequently. The surface of an oxidative metal such as aluminum is
further applied coating with silicon oxide, etc.
[0017] The spacer 13 is used for fixing the electrode substrate 11 and the mirror substrate
12 while deciding the interval therebetween. An inorganic material, such as a glass
and a silicon substrate or metal, may be frequently used for the spacer 13; however,
organic adhesive containing beads for deciding the interval may be used.
[0018] The first electrode 22 of the mirror substrate 12 is electrically connected to a
first lead-out electrode 24 formed on the electrode substrate 11. Therefore, a part
of the first electrode 22 disposed at the support unit 20 on the mirror substrate
12 is set as a connection unit 25. For fixing the mirror substrate 12, the connection
unit 25 is electrically connected to a conductive material for electrical connection
26 formed on the electrode substrate 11. The connection unit 25 may be connected through
pressure welding of metal, and may be connected with conductive paste, etc. As a result,
the first electrode 22 on the mirror substrate 12 and the first lead-out electrode
24 on the electrode substrate 11 are electrically connected.
[0019] Electrical connection (not shown) from the first, second and third lead-out electrodes
24, 17, 19 to an external drive device for the deformable mirror is performed through
wire bonding usually.
[Description of Drive Principle]
[0020] The following will describe a deformable mirror drive device 27 driving the deformable
mirror 10 structured as mentioned above.
[0021] The deformable mirror 10 of the structure described above adopts an electrostatic
drive system deforming the reflection surface 23 on the deformation part 21 by electrostatic
force. The deformable mirror drive device 27, as shown in FIG. 3, applies a voltage
to the third electrode 15 of the deformable mirror 10 by means of an amplifier 28
to generate a potential difference between the first electrode 22 and the third electrode
15. Thereby, attractive force caused by the electrostatic force occurs to deform the
reflection surface 23 together with the deformation part 21 toward the electrode substrate
11 of the deformable mirror 10.
[0022] The deformation quantity of the reflection surface 23 may be varied in accordance
with the potential difference applied between the first electrode 22 and the third
electrode 15.
[0023] The space between the electrode 11 and the mirror substrate 12 decided in accordance
with the height of the spacer 13 may be decided from a maximum deformation quantity
of the reflection surface 23. Generally, a substrate space of about three times or
more of the maximum deformation quantity is required.
[Description of Capacitance Detection]
[0024] Applying a potential difference between the first electrode 22 and the third electrode
15 to deform the deformation part 21 reduces the space (an electrostatic gap) between
the first electrode 22 and the second electrode 14. With the reduction in electrostatic
gap, capacitance of the first electrode 22 and the second electrode 14 (capacitance
of the deformable mirror 10) increases. Thus, detecting the capacitance of the deformable
mirror 10 to derive the electrostatic gap enables detecting the deformation quantity
of the reflection face 23.
[0025] A deformation quantity Δd of the reflection surface 23 and the capacitance of the
deformable mirror 10 are in inverse proportion to each other as expressed by the following
equation (1), and also a capacitance C detected has nonlinearity to the deformation
quantity Δd.

[0026] Wherein ε is a dielectric constant, A is an area of an electrode, d
0 is an initial magnitude of a space between electrodes, Δd is a deformation magnitude
of the reflection surface 23.
[0027] In the deformable mirror drive device 27 of the embodiment, a capacitance detector
29 for detecting capacitance is connected to the second electrode 14. A reference
signal generator 30 generating a reference signal required to detect the capacitance
is connected to the first electrode 22. The capacitance detector 29 detects the capacitance
of the deformable mirror 10 (the capacitance between the first electrode 22 and the
second electrode 14) to output a capacitance signal 31. The reference signal supplied
to the first electrode 22 is a periodical signal, and the use, for example, of a sine
wave, a rectangular wave, a triangle wave, and further, a periodical arbitrary wave
form is a possible approach. Supplying such a reference signal to a capacitance, detecting
an electric current flowing in the capacitance by means of the capacitance detector
29, or detecting electric charges charged in the capacitance by means of the capacitance
detector 29 make it possible to detect a capacitance.
[0028] The reference signal generates the drive force, as well as works as the detector
of the capacitance. Accordingly, it is necessary to make the frequency of the reference
signal sufficiently higher than a frequency band capable of driving the deformation
part 21, and it is desired to be set so as to avoid high order resonance frequencies
of the deformation part 21.
[Description of Control Unit]
[0029] A target deformation quantity signal 32 inputted from outside is converted into a
target capacitance signal 33 by means of a compensator 34. That is, the compensator
34 converts to output the target capacitance signal 33 indicating the capacitance
of the deformable mirror 10 at the deformation quantity corresponding to the input
target deformation quantity signal 32 on the basis of the relationship having the
non-linearity between the capacitance of the deformable mirror 10 and the deformation
quantity of the deformation part 21 expressed by the equation (1).
[0030] Hereinafter, while an example of a configuration of the compensator 34 will be described,
it is needless to say that the invention is not limited to the example of this configuration.
[0031] That is the compensator 34 is composed of an analog-to-digital converter 35, a memory
36, and a digital-to-analog converter 37, as shown in FIG. 4. The analog-to-digital
converter 35 digitizes the target deformation quantity signal 32, and inputs a digitized
target deformation quantity signal 38 as an address to the memory 36. From the output
of the memory 36, a digitized target capacitance signal 39 is output. The digital-to-analog
converter 37 converts the value of the digitized target capacitance signal 39 into
an analog signal to output as a target capacitance signal 33.
[0032] The relationship between the capacitance and the deformation quantity of the deformable
mirror 10 has been written as a conversion table in the memory 36 in advance. More
specifically, at an address corresponding to the digitized deformation quantity, the
capacitance in the time of the quantity of the deformation is digitized to write.
Thereby, deciding the address of the memory 36 by the digitized target deformation
quantity signal 38 enables obtaining the digitized target capacitance signal 39 from
the output of the memory 36. Thus, the target capacitance signal 33 that is the capacitance
corresponding to the target deformation signal 32 which has been input to the compensator
34 may be obtained.
[0033] Alternatively, the compensator 34 may adopt a form composed of the analog-to-digital
converter 35, the digital-to-analog converter 37, a computation unit 40 and a memory
41, as shown in FIG. 5. That is, the analog-to-digital converter 35 digitizes the
target deformation signal 32, and sets the digitized target deformation signal 38
as an input value to the computation unit 40. Meanwhile, parameters of the computation
unit 40 are stored in the memory 41. The computation unit 40 computes the input value
by using the parameter values in the memory 41, and outputs the computation result
as the digitized target capacitance signal 39. The digital-to-analog converter 37
converts the digitized target capacitance signal 39 into an analog signal to result
in the target capacitance signal 33, and the target capacitance signal 33 is output
from the compensator 34.
[0034] Here, the computation unit 40 has been set in advance so as to compute in accordance
with the equation (1). The dielectric constant ε, the area of the electrode A, and
the initial magnitude d
0 have been stored in the memory 41. Thereby, the target capacitance signal 33 that
is the capacitance corresponding to the target deformation quantity signal 32 input
to the compensator 34 may be obtained.
[0035] The target capacitance signal 33 from the compensator 34 is input to a comparator
42. The comparator 42 compares the target capacitance signal 33 from the compensator
34 with the capacitance signal 31 from the capacitance detector 29, and outputs the
difference as a capacitance-value error 44 to an integrator 43.
[0036] The integrator 43 integrates the capacitance-value error 44 input from the comparator
42. The integration result is amplified by the amplifier 28 to be output to the third
electrode 15 of the deformable mirror 10.
[0037] According to the foregoing configuration of the deformable mirror drive device 27,
in a state in which a sufficient time for operating the integrator 43 has elapsed,
the voltage of the third electrode 15 of the deformable mirror 10 is defined so that
the capacitance-value error 44 becomes zero. In other words, the state is a case in
which the target capacitance signal 33 and the capacitance signal 31 coincides with
each other, the voltage of the third electrode 15 is decided so that the deformation
quantity corresponding to the target deformation quantity signal 32 is obtained at
the deformable mirror 10.
[0038] According to the configuration of the above, the deformable mirror system of the
embodiment detects the deformation quantity by using the capacitance, also corrects
the non-linearity existing in the relationship between the capacitance and the deformation
quantity, and may perform control which is excellent in linearity. Thus, the system
may precisely drive the deformable mirror 10 as well.
[0039] In a case in which the system performs control so as to follow the target signal
through such feedback control performed in the embodiment, an operational frequency
band of a feedback loop is generally needed to become sufficiently wider than the
frequency band of the target signal. However, in the embodiment, the system disposes
the compensator 34 outside the feedback loop. Therefore, even if the operation speed
of the compensator 34 is slower than the case in which the system disposes the compensator
34 inside the feedback loop, the system may perform feedback control having excellent
linearity. As long as the magnitude of the target deformation quantity signal 32 does
not vary, the magnitude of the target capacitance signal 33 corresponding to the target
deformation quantity signal 32 also does not vary. Thus, the system may be configured
to operate the compensator 34 only when the target deformation quantity signal 32
has varied. Also in such a configuration, the operation speed of the compensator 34
may be set to a low speed.
[0040] Configuration of the conversion table for use in the compensation by the compensator
34 which is composed of a memory capable of rewriting the memory 36 enables appropriately
updating the conversion table in accordance with a property change of the deformable
mirror 10. For instance, using a measuring instrument (not shown) measuring the deformation
quantity of the deformation part 21 of the deformable mirror 10 to write the relationship
between the output from the measurement instrument and the output value from the capacitance
detector 29 in the memory 36 composing the conversion table of the compensator 34
enables updating the compensation table. This update of the compensation table may
be executed in shipment of the deformable mirror 10 from a factory, and may be executed
as a calibration operation right after the power is turned on when the compensation
table is in use.
[0041] In the same way, configuration of the memory 41 by using a rewritable memory, enables
updating the parameters ε, A, d
0 of the computation unit 40 of the memory 41.
[0042] Disposing a plurality of the second electrodes 14 on the electrode substrate 11 to
connect the capacitance detector 29 to each of the second electrodes 14 makes it possible
to detect the deformation quantities at a plurality of points of the deformable mirror
10. Further, disposing a plurality of third electrodes 15 on the electrode substrate
11 and connecting the amplifier 28 to each of the third electrodes 15 makes it possible
to change the deformation shape of the deformation part 21 of the deformable mirror
10.
[Modification Example]
[0043] While the embodiment has been described the case in which the first electrode 22
is arranged at the deformation part 21, the second and the third electrodes 14, 15
are arranged on the electrode substrate 11, it is also possible to dispose the second
and the third electrodes 14, 15 on the deformation part 21 and the first electrode
22 on the electrode substrate 11 as shown in FIG. 6. In this case, the deformation
part 21 is deformed due to the voltage applied to the third electrode 15, and the
second electrode 14 moves while the deformation part 21 is deformed. Therefore, the
deformable mirror drive device can detect the deformation quantity of the deformation
part 21 by detecting the capacitance between the first electrode 22 and the second
electrode 14. Other operations are implemented in the ways mentioned above.
[0044] As shown in FIG. 7, the configuration in which the first and the third electrode
22, 15 are arranged on the electrode substrate 11, and the second electrode 14 is
arranged at the deformation part 21 may produce a similar effect. In this case, the
capacitance detector 29 is connected to the second electrode 14, and the potential
of the second electrode 14 is fixed to zero potential or fixed potential. The potential
applied to the third electrode 15 generates a potential difference between the second
and the third electrodes 14, 15 to deform the deformation part 21. With deformation,
the capacitance between the first electrode 22 and the second electrode 14 changes,
and the capacitance detector 29 detects the change.
[0045] As shown in FIG. 8, the configuration which arranges the first and the third electrodes
22, 15 at the deformation part 21 and arranges the second electrode 14 on the electrode
substrate 11 also produces a similar effect on the deformable mirror drive device.
(Second Embodiment)
[0046] A deformable mirror system of a second embodiment of the invention will be described.
However, descriptions of the components identical to those of the first embodiment
will be eliminated.
[0047] In the deformable mirror system of the second embodiment, the deformable mirror 10
arranges, as shown in FIG. 9, the second electrode 14 at the deformation part 21,
and arranges the first electrode 22 on the electrode substrate 11.
[0048] In the deformable mirror drive device 27, an output from the amplifier 28 is connected
to the first electrode 22 of the deformable mirror 10 through a coupling resistor
45, and the reference signal generator 30 is also connected thereto through a coupling
capacitor 46. The capacitance detector 29 is connected to the second electrode 14
of the deformable mirror 10, and the second electrode 14 is fixed to zero potential
or fixed potential by the capacitance detector 29.
[0049] The coupling resistor 45 and the coupling capacitor 46 apply a signal in which the
reference signal that is the output from the reference signal generator 30 is overlapped
with the drive signal output from the amplifier 28 to the first electrode 22. In the
low-frequency band in which the drive signal generated from the amplifier 28 is present,
since the coupling capacitor 46 may be assumed to be almost open, the drive signal
is supplied to the first electrode 22. In the high-frequency band in which the reference
signal is present, since the impedance of the coupling capacitor 46 becomes fully
lower than the resistance of the coupling resistor 45, the reference signal is supplied
to the first electrode 22. Taking an entire frequency band into account by putting
together the descriptions above overlaps the drive signal in the low frequency with
the reference signal of the high frequency, and makes it equivalent to the case that
the overlapped signal is applied to the second electrode 14.
[0050] In the deformable mirror system of the configuration shown in FIG. 9, in a low-frequency
band, a potential difference occurs between the first electrode 22 and the second
electrode 14 due to the drive signal output from the amplifier 28 to deform the deformation
part 21 of the deformable mirror 10 by electrostatic power. In a high-frequency band,
detecting the electric current flowing to the capacitance by means of the capacitance
detector 29, or detecting the electric charge charged in the capacitance by means
of the capacitance detector 29 makes it possible to detect the capacitance between
the first electrode 22 and the second electrode 14.
[0051] As described above, using the coupling resistor 45 and the coupling capacitor 46
enables easily applying the high voltage and detecting the capacitance to and from
the same electrode (in this case, the first electrode 22) without using an operational
amplifier of high breakdown voltage.
[0052] The target deformation quantity signal 32 input from outside is converted into the
target capacitance signal 33 through the compensator 34, in the same way of the first
embodiment. The comparator 42 compares the target capacitance signal 33 and the capacitance
signal 31 detected by the capacitance detector 29 to output the comparison result
to the integrator 43. The output from the integrator 43 is amplified by means of the
amplifier 28 to be applied to the first electrode 22 through the coupling resistor
45.
[0053] According to the aforementioned configuration, the deformable mirror system of the
second embodiment decides the voltage of the first electrode 22 so as to obtain the
deformation quantity equivalent to the target deformation quantity signal 32 from
the deformation quantity of the deformable mirror 10. Thus, the system may compensate
the non-linearity existing in the relationship between the capacitance and the deformation
quantity, perform control with excellent linearity, and precisely drive the deformable
mirror 10 as well.
[Modification Example]
[0054] A configuration, shown in FIG. 10, which arranges the first electrode 22 at the deformation
part 21 and arranges the second electrode 14 on the electrode substrate 11, may produce
the same effect.
[0055] As shown FIG. 11, the reference signal generator 30 may be connected to the first
electrode 22 arranged at the deformation part 21, the output from the amplifier 28
may be connected to the second electrode 14 arranged on the electrode 11 through the
coupling resistor 45, and also the capacitance detector 29 may be connected to the
second electrode 14 through the coupling capacitor 46. In this configuration produces
the same effect. In a case of this configuration, in the low-frequency band in which
the drive signal generated from the amplifier 28 is present, since the coupling capacitor
46 may be assumed to the almost open, the drive signal is not supplied to the capacitance
detector 29 but supplied to the second electrode 14. In the high-frequency band in
which the reference signal generated from the reference signal generator 30, the impedance
of the coupling capacitor 46 becomes fully lower than the resistance of the coupling
resistor 45. Therefore, the current signal flowing to the capacitance and an electric
charge thereof which is intended to detect by the capacitance detector 29 is input
to the capacitance detector 29 through the coupling capacitor 46. Taking the entire
frequency band by putting the above descriptions together into account makes the deformable
mirror system supply the drive signal of the low frequency to the second electrode
14 without supplying the drive signal to the capacitance detector 29, and makes the
system supply the detection signal such as a current signal output from the second
electrode 14 to the capacitance detector 29 without flowing to the amplifier 28. Thus
the system may detect the applying of the high voltage and the capacitance for the
same electrode (in this case, the second electrode 14).
[0056] As shown in FIG. 12, a configuration which disposes the first electrode 22 on the
electrode substrate 11 and disposes the second electrode 14 at the deformation part
21 produces the same effect.
[0057] While the invention has been described on the basis of the embodiments, the invention
is not limited to the foregoing embodiments, various modifications and applications
also may be achieved without departing from the substance of the invention.
[0058] For instance, the target deformation quantity signal 32 which is input from outside
is not limited to the analog signal, if the signal 32 is input as digital data; it
is needless to say that the analog-to-digital converter 35 of the compensator 34 can
be eliminated.
1. A deformable mirror system comprising:
a deformable mirror (10) which comprises a deformation part (21) with a reflection
surface (23) formed thereon, a fixing part (11) fixing the deformation part, and a
pair of electrodes (22, 14) disposed facing the deformation part and the fixing part,
respectively;
drive means (28) for generating drive force so as to deform the deformation part;
and
capacitance detection means (29) for detecting capacitance between the pair of electrodes,
characterized by further comprising:
conversion means (34) for converting a target deformation quantity signal (32) into
a target capacitance signal (33) on the basis of a relationship between the capacitance
and deformation quantity of the deformation part; and
control means (42, 43) for deciding drive force generated from the drive means so
as to coincide an output from the conversion means with an output from the capacitance
detection means.
2. The system according to claim 1, characterized in that
the conversion means includes storage means (36) for storing a table of a relationship
between the capacitance and the deformation quantity of the deformation part.
3. The system according to claim 1, characterized in that
the conversion means includes storage means (41) for storing parameters of a function
showing the relationship between the capacitance and the deformation quantity of the
deformation part; and computation means (40) for performing computation of the capacitance
and the deformation quantity of the deformation part by using the parameters stored
in the storage means.
4. The system according to one of claims 1 to 3,
characterized in that
the pair of the electrodes includes a first electrode (22) disposed at the deformation
part and a second electrode (14) disposed on the fixing part so as to face the first
electrode,
the deformable mirror system further comprises reference signal generation means (30),
which is connected to the first electrode, for generating a reference signal for use
in detection of capacitance, and
the capacitance detection means is connected to the second electrode to detect capacitance
between the first electrode and the second electrode.
5. The system according to one of claims 1 to 3,
characterized in that
the pair of the electrodes includes a first electrode (22) disposed on the fixing
part and a second electrode (14) disposed on the deformation part so as to face the
first electrode,
the deformable mirror system further comprises reference signal generation means (30),
which is connected to the first electrode, for generating a reference signal for use
in detection of the capacitance, and
the capacitance detection means is connected to the second electrode to detect capacitance
between the first electrode and the second electrode.
6. The system according to claim 4 or 5,
characterized in that
the deformable mirror further includes a third electrode (15) which is disposed on
the fixing part or the deformation part so as to face the first electrode, and
the drive means drives the deformation part by applying a voltage to the third electrode.
7. The system according to claim 4 or 5,
characterized in that
the deformable mirror further comprises a third electrode (15) which is disposed on
the fixing part or the deformation part so as to face the second electrode, and
the drive means drives the deformation part by applying a voltage to the third electrode.
8. The system according to claim 4 or 5,
characterized in that
the reference signal generation means is connected to the first electrode though a
capacitor (46), and
the drive means is connected to the first electrode through a resistor (45) to drive
the deformation part by applying a voltage to the first electrode.
9. The system according to claim 4 or 5,
characterized in that
the capacitance detection means is connected to the second electrode through a capacitor
(46), and
the drive means is connected to the second electrode through a resistor (45) to drive
the deformation part by applying a voltage to the second electrode.
10. A deformable mirror drive device (27) comprising:
drive means (28) for generating drive force so as to deform a deformation part (21)
of a deformable mirror (10) which includes the deformation part with a reflection
surface (23) formed thereon, a fixing part (11) fixing the deformation part, and a
pair of electrodes (22, 14) disposed so as to face the deformation part and the fixing
part, respectively; and
capacitance detection means (29) for detecting capacitance between the pair of the
electrodes of the deformable mirror, characterized by further comprising:
conversion means (34) for converting a target deformation quantity signal (32) into
a target capacitance signal (33) on the basis of a relationship between the capacitance
and deformation quantity of the deformation part; and
control means (42, 43) for deciding drive force generated from the drive means so
as to coincide an output from the conversion means with an output from the capacitance
detection means.