(19)
(11) EP 2 118 630 A2

(12)

(88) Date of publication A3:
11.12.2008

(43) Date of publication:
18.11.2009 Bulletin 2009/47

(21) Application number: 08709002.3

(22) Date of filing: 14.02.2008
(51) International Patent Classification (IPC): 
G01L 5/00(2006.01)
G01L 5/18(2006.01)
(86) International application number:
PCT/EP2008/051810
(87) International publication number:
WO 2008/098993 (21.08.2008 Gazette 2008/34)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MT NL NO PL PT RO SE SI SK TR

(30) Priority: 14.02.2007 WO PCT/BE2007/000017

(71) Applicant: Université Catholique de Louvain
1348 Louvain-la-Neuve (BE)

(72) Inventors:
  • PARDOEN, Thomas
    B-1435 Mont Saint Guibert (BE)
  • RASKIN, Jean-Pierre
    B-5310 Saint Germain (BE)
  • CARBONNELLE, Pierre
    B-1200 Woluwe Saint Lambert (BE)
  • GRAVIER, Sébastien
    F-38220 Vizille (FR)

(74) Representative: Bird, William Edward 
Bird Goën & Co. Klein Dalenstraat 42A
3020 Winksele
3020 Winksele (BE)

   


(54) IMPOSING AND DETERMINING STRESS IN SUB-MICRON SAMPLES