(19)
(11) EP 2 168 130 A2

(12)

(88) Date of publication A3:
18.06.2009

(43) Date of publication:
31.03.2010 Bulletin 2010/13

(21) Application number: 08773243.4

(22) Date of filing: 19.06.2008
(51) International Patent Classification (IPC): 
G21K 1/06(2006.01)
(86) International application number:
PCT/CZ2008/000072
(87) International publication number:
WO 2009/012732 (29.01.2009 Gazette 2009/05)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MT NL NO PL PT RO SE SI SK TR
Designated Extension States:
AL BA MK RS

(30) Priority: 20.07.2007 CZ 20070494

(71) Applicant: Ceské Vysoké Ucení Technické V Praze
115 19 Praha (CZ)

(72) Inventor:
  • CHADZITASKOS, Goce
    251 65 Ondrejov (CZ)

(74) Representative: Duskova, Hana et al
Czech Technical University in Prague Patent Centre Zikova 4
166 36 Praha 6
166 36 Praha 6 (CZ)

   


(54) OPTICAL ELEMENT FOR X-RAY MICROSCOPY