| (84) |
Designated Contracting States: |
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DE FR IT |
| (30) |
Priority: |
31.07.2002 JP 2002223343
|
| (43) |
Date of publication of application: |
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14.04.2010 Bulletin 2010/15 |
| (60) |
Divisional application: |
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15150440.4 / 2863430 |
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15150443.8 / 2863431 |
| (62) |
Application number of the earlier application in accordance with Art. 76 EPC: |
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03016553.4 / 1387404 |
| (73) |
Proprietor: Fujitsu Semiconductor Limited |
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Kohoku-ku, Yokohama-shi
Kanagawa 222-0033 (JP) |
|
| (72) |
Inventor: |
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- Watanabe, Kenichi
Kanagawa 211-8588 (JP)
|
| (74) |
Representative: Hoffmann Eitle |
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Patent- und Rechtsanwälte PartmbB
Arabellastraße 30 81925 München 81925 München (DE) |
| (56) |
References cited: :
JP-A- 3 089 548 JP-A- 11 054 705
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JP-A- 5 175 198 JP-A- 2000 124 403
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- WADA J ET AL: "Low resistance dual damascene process by new Al reflow using Nb liner",
VLSI TECHNOLOGY, 1998. DIGEST OF TECHNICAL PAPERS. 1998 SYMPOSIUM ON HONOLULU, HI,
USA 9-11 JUNE 1998, NEW YORK, NY, USA,IEEE, US, 9 June 1998 (1998-06-09), pages 48-49,
XP010291151, DOI: DOI:10.1109/VLSIT.1998.689194 ISBN: 978-0-7803-4770-0
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