| (84) |
Designated Contracting States: |
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AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MT NL NO PL
PT RO SE SI SK TR |
| (30) |
Priority: |
11.10.2007 US 979240 P
|
| (43) |
Date of publication of application: |
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21.07.2010 Bulletin 2010/29 |
| (73) |
Proprietor: 3M Innovative Properties Company |
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St. Paul, MN 55133-3427 (US) |
|
| (72) |
Inventors: |
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- GATES, Brian J.
Saint Paul, Minnesota 55133-3427 (US)
- SYKORA, Craig R.
Saint Paul, Minnesota 55133-3427 (US)
- FAKLIS, Dean
Wayland
New York 14572 (US)
- MURNAN, Andrew J.
Saratoga Springs
New York 12866 (US)
- FARMIGA, Nestor O.
Rocherster
New York 14618-3408 (US)
|
| (74) |
Representative: Vossius & Partner
Patentanwälte Rechtsanwälte mbB |
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Siebertstrasse 3
81675 München
81675 München (DE) |
| (56) |
References cited: :
WO-A2-2007/073482
US-B1- 6 713 718
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US-B1- 6 674 572
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- LEL V V ET AL: "Local thickness and wave velocity measurement of wavy films with a
chromatic confocal imaging method and a fluorescence intensity technique", EXPERIMENTS
IN FLUIDS ; EXPERIMENTAL METHODS AND THEIR APPLICATIONS TO FLUID FLOW, SPRINGER, BERLIN,
DE, vol. 39, no. 5, 1 November 2005 (2005-11-01), pages 856-864, XP019338279, ISSN:
1432-1114, DOI: DOI:10.1007/S00348-005-0020-X
- KORNER K ET AL: "NEW APPROACHES IN DEPTH-SCANNING OPTICAL METROLOGY", PROCEEDINGS
OF SPIE, SPIE, USA, vol. 5457, no. 1, 1 April 2004 (2004-04-01), pages 320-333, XP009084995,
ISSN: 0277-786X, DOI: DOI:10.1117/12.554754
- KEBIN SHI ET AL.: 'Chromatic confocal microscopy using supercontinuum light' OPTICS
EXPRESS vol. 12, no. 10, 17 May 2004, pages 2096 - 2101, XP008133695
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