A probe for testing electrical properties of a test sample

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(11)

EP 2 293 086 A8

(12)	CORRECTED EUROPEAN PATENT APPLICATION
	Note: Bibliography reflects the latest situation

(15)	Correction information:
	Corrected version no 1 (W1 A1)

(48)	Corrigendum issued on:
	18.01.2012 Bulletin 2012/03

(43)	Date of publication:
	09.03.2011 Bulletin 2011/10

(21)	Application number: 10012000.5

(22)	Date of filing: 31.10.2006

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International Patent Classification (IPC):

G01R 1/067^(2006.01)

(84)	Designated Contracting States:
	AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

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Priority:

31.10.2005 EP 05388093

(62)	Application number of the earlier application in accordance with Art. 76 EPC:
	06805543.3 / 1946124

(71)	Applicant: Capres A/S
	2800 Lyngby (DK)

(72)	Inventor:
	Petersen, Dirch Hjort 2870 Dyssegard (DK)

(74)	Representative: Nielsen, Henrik Sten et al
	Budde Schou A/S Vester Søgade 10 1601 Copenhagen V 1601 Copenhagen V (DK)


	Remarks:
	This application was filed on 30-09-2010 as a divisional application to the application mentioned under INID code 62.

(54)	A probe for testing electrical properties of a test sample

(57) The present invention relates to a probe (502) for testing electrical properties of test samples (508). The probe may comprise a body (504) having a probe arm (506) defining a proximal and an opposite distal end, the probe arm extending from the body at the proximal end of the probe arm, a first axis defined by the proximal and the distal end. Further, the probe arm may define a geometry allowing flexible movement of the probe arm along the first axis and along a second axis perpendicularly to the first axis and along a third axis orthogonal to a plane defined by the first axis and second axis.