(19)
(11) EP 2 328 682 A2

(12)

(88) Date of publication A3:
18.03.2010

(43) Date of publication:
08.06.2011 Bulletin 2011/23

(21) Application number: 09765927.0

(22) Date of filing: 19.06.2009
(51) International Patent Classification (IPC): 
B01L 3/00(2006.01)
(86) International application number:
PCT/EP2009/057694
(87) International publication number:
WO 2009/153348 (23.12.2009 Gazette 2009/52)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK TR
Designated Extension States:
AL BA RS

(30) Priority: 19.06.2008 EP 08158551

(71) Applicant: Eppendorf Array Technologies SA
5000 Namur (BE)

(72) Inventors:
  • VAN HUFFEL, Christophe
    B-1170 Watermael-boitsfort (BE)
  • LIEDECKER, Jens
    D-21039 Escheburg (DE)
  • HAMELS, Sandrine
    B-6280 Joncret (BE)
  • DE LONGUEVILLE, Françoise
    B-5360 Natoye (BE)

(74) Representative: pronovem 
Office Van Malderen Avenue Josse Goffin 158
1082 Bruxelles
1082 Bruxelles (BE)

   


(54) DEVICE FOR MULTIPARAMETRIC ASSAYS