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<ep-patent-document id="EP11005887A3" file="EP11005887NWA3.xml" lang="de" country="EP" doc-number="2422927" kind="A3" date-publ="20170802" status="n" dtd-version="ep-patent-document-v1-5">
<SDOBI lang="de"><B000><eptags><B001EP>ATBECHDEDKESFRGBGRITLILUNLSEMCPTIESILTLVFIROMKCYALTRBGCZEEHUPLSKBAHRIS..MTNORSMESM..................</B001EP><B005EP>J</B005EP><B007EP>BDM Ver 0.1.63 (23 May 2017) -  1620000/0</B007EP></eptags></B000><B100><B110>2422927</B110><B120><B121>EUROPÄISCHE PATENTANMELDUNG</B121></B120><B130>A3</B130><B140><date>20170802</date></B140><B190>EP</B190></B100><B200><B210>11005887.2</B210><B220><date>20110719</date></B220><B250>de</B250><B251EP>de</B251EP><B260>de</B260></B200><B300><B310>102010035147</B310><B320><date>20100823</date></B320><B330><ctry>DE</ctry></B330></B300><B400><B405><date>20170802</date><bnum>201731</bnum></B405><B430><date>20120229</date><bnum>201209</bnum></B430></B400><B500><B510EP><classification-ipcr sequence="1"><text>B24B   5/42        20060101AFI20170626BHEP        </text></classification-ipcr><classification-ipcr sequence="2"><text>B24B  49/04        20060101ALI20170626BHEP        </text></classification-ipcr></B510EP><B540><B541>de</B541><B542>Meßvorrichtung</B542><B541>en</B541><B542>Measuring device</B542><B541>fr</B541><B542>Dispositif de mesure</B542></B540><B590><B598>2C</B598></B590></B500><B700><B710><B711><snm>JENOPTIK Industrial Metrology Germany GmbH</snm><iid>101374296</iid><irf>820245 EP</irf><adr><str>Alte Tuttlinger Strasse 20</str><city>78056 Villingen-Schwenningen</city><ctry>DE</ctry></adr></B711></B710><B720><B721><snm>Volk, Raimund</snm><adr><str>Narzissenweg 19</str><city>78056 Villingen-Schwenningen</city><ctry>DE</ctry></adr></B721></B720><B740><B741><snm>Wagner, Carsten</snm><sfx>et al</sfx><iid>101597741</iid><adr><str>Patentanwaltskanzlei 
Am Buchenhof 3</str><city>31303 Burgdorf</city><ctry>DE</ctry></adr></B741></B740></B700><B800><B840><ctry>AL</ctry><ctry>AT</ctry><ctry>BE</ctry><ctry>BG</ctry><ctry>CH</ctry><ctry>CY</ctry><ctry>CZ</ctry><ctry>DE</ctry><ctry>DK</ctry><ctry>EE</ctry><ctry>ES</ctry><ctry>FI</ctry><ctry>FR</ctry><ctry>GB</ctry><ctry>GR</ctry><ctry>HR</ctry><ctry>HU</ctry><ctry>IE</ctry><ctry>IS</ctry><ctry>IT</ctry><ctry>LI</ctry><ctry>LT</ctry><ctry>LU</ctry><ctry>LV</ctry><ctry>MC</ctry><ctry>MK</ctry><ctry>MT</ctry><ctry>NL</ctry><ctry>NO</ctry><ctry>PL</ctry><ctry>PT</ctry><ctry>RO</ctry><ctry>RS</ctry><ctry>SE</ctry><ctry>SI</ctry><ctry>SK</ctry><ctry>SM</ctry><ctry>TR</ctry></B840><B844EP><B845EP><ctry>BA</ctry></B845EP><B845EP><ctry>ME</ctry></B845EP></B844EP><B880><date>20170802</date><bnum>201731</bnum></B880></B800></SDOBI>
<abstract id="abst" lang="de">
<p id="pa01" num="0001">Eine Meßvorrichtung 2, insbesondere zur Inprozeß-Messung an Prüflingen während eines Bearbeitungsvorganges an einer Bearbeitungsmaschine, insbesondere einer Schleifmaschine, weist einen Meßkopf 12 auf, der relativ zu einem Grundkörper 18 der Meßvorrichtung 2 zwischen einer Ruheposition und einer Meßposition, in der sich der Meßkopf 12 in Meßkontakt mit dem Prüfling befindet, beweglich ist. Erfindungsgemäß ist dem Meßkopf 12 wenigstens ein Winkelsensor 55 zugeordnet, zur Erfassung der Winkellage des Meßkopfes 12, insbesondere von Winkellageänderungen des Meßkopfes 12 relativ zu dem Prüfling, während eines Meßvorganges.
<img id="iaf01" file="imgaf001.tif" wi="123" he="93" img-content="drawing" img-format="tif"/></p>
</abstract>
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 The search report data in XML is provided for the users' convenience only. It might differ from the search report of the PDF document, which contains the officially published data. The EPO disclaims any liability for incorrect or incomplete data in the XML for search reports.
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