| (84) |
Designated Contracting States: |
|
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL
NO PL PT RO SE SI SK SM TR |
| (30) |
Priority: |
03.08.2009 US 230968 P
|
| (43) |
Date of publication of application: |
|
13.06.2012 Bulletin 2012/24 |
| (73) |
Proprietor: SOF-TEK Integrators, Inc. dba OP-Test |
|
Redding, CA 96003-1479 (US) |
|
| (72) |
Inventors: |
|
- MORROW, Daniel, Creighton
Redding
CA 96003 (US)
- DUMMER, Jonathan, Leigh
Redding
CA 96002 (US)
|
| (74) |
Representative: Barker Brettell LLP |
|
100 Hagley Road
Edgbaston Birmingham B16 8QQ Birmingham B16 8QQ (GB) |
| (56) |
References cited: :
US-A- 3 932 847 US-A- 5 065 007 US-A1- 2008 205 482 US-B1- 7 047 181 US-B2- 7 227 639
|
US-A- 5 059 889 US-A1- 2003 133 491 US-A1- 2009 179 652 US-B2- 7 030 642
|
|
| |
|
|
- KEPPENS A ET AL: "High power light-emitting diode junction temperature determination
from current-voltage characteristics", JOURNAL OF APPLIED PHYSICS, AMERICAN INSTITUTE
OF PHYSICS, US, vol. 104, no. 9, 4 November 2008 (2008-11-04), pages 93104-93104,
XP012118015, ISSN: 0021-8979, DOI: 10.1063/1.3009966
- TREVISANELLO L ET AL: "Accelerated Life Test of High Brightness Light Emitting Diodes",
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, IEEE SERVICE CENTER, PISCATAWAY,
NJ, US, vol. 8, no. 2, 1 June 2008 (2008-06-01), pages 304-311, XP011347917, ISSN:
1530-4388, DOI: 10.1109/TDMR.2008.919596
|
|