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<SDOBI lang="en"><B000><eptags><B001EP>ATBECHDEDKESFRGBGRITLILUNLSEMCPTIESILTLVFIROMKCYALTRBGCZEEHUPLSK..HRIS..MTNO....SM..................</B001EP><B003EP>*</B003EP><B005EP>J</B005EP><B007EP>BDM Ver 0.1.50 (10 Nov 2016) -  2999001/0</B007EP></eptags></B000><B100><B110>2462559</B110><B120><B121>CORRECTED EUROPEAN PATENT SPECIFICATION</B121></B120><B130>B8</B130><B132EP>B1</B132EP><B140><date>20170329</date></B140><B150><B151>W1</B151><B153>73</B153><B155><B1551>de</B1551><B1552>Bibliographie</B1552><B1551>en</B1551><B1552>Bibliography</B1552><B1551>fr</B1551><B1552>Bibliographie</B1552></B155></B150><B190>EP</B190></B100><B200><B210>10740111.9</B210><B220><date>20100802</date></B220><B240><B241><date>20120223</date></B241><B242><date>20140924</date></B242></B240><B250>en</B250><B251EP>en</B251EP><B260>en</B260></B200><B300><B310>231454 P</B310><B320><date>20090805</date></B320><B330><ctry>US</ctry></B330></B300><B400><B405><date>20170329</date><bnum>201713</bnum></B405><B430><date>20120613</date><bnum>201224</bnum></B430><B450><date>20161019</date><bnum>201642</bnum></B450><B452EP><date>20160511</date></B452EP><B472><B475><date>20161019</date><ctry>LV</ctry></B475></B472><B480><date>20170329</date><bnum>201713</bnum></B480></B400><B500><B510EP><classification-ipcr sequence="1"><text>G06T   7/00        20170101AFI20110224BHEP        </text></classification-ipcr></B510EP><B540><B541>de</B541><B542>SYSTEM UND VERFAHREN ZUR DREIDIMENSIONALEN PAKETÜBERWACHUNG UND -ANALYSE</B542><B541>en</B541><B542>SYSTEM AND METHOD FOR THREE-DIMENSIONAL PARCEL MONITORING AND ANALYSIS</B542><B541>fr</B541><B542>SYSTÈME ET PROCÉDÉ DE SURVEILLANCE ET D'ANALYSE DE COLIS TRIDIMENSIONNEL</B542></B540><B560><B561><text>WO-A2-00/59648</text></B561><B561><text>WO-A2-2007/117535</text></B561><B561><text>US-A1- 2009 084 716</text></B561><B561><text>US-B1- 6 963 662</text></B561><B562><text>NEWMAN T S ET AL: "A SURVEY OF AUTOMATED VISUAL INSPECTION" COMPUTER VISION AND IMAGE UNDERSTANDING, ACADEMIC PRESS, US LNKD- DOI:10.1006/CVIU.1995.1017, vol. 61, no. 2, 1 March 1995 (1995-03-01), pages 231-262, XP000644611 ISSN: 1077-3142</text></B562></B560></B500><B700><B720><B721><snm>SALEMIZADEH, Abdul Hamid</snm><adr><str>10401 Shadow Valley Court</str><city>Burleson
Texas 76028</city><ctry>US</ctry></adr></B721></B720><B730><B731><snm>Siemens Industry, Inc.</snm><iid>101615776</iid><irf>2009P14008WE</irf><adr><str>100 Technology Drive</str><city>Alpharetta, GA 30005</city><ctry>US</ctry></adr></B731></B730><B740><B741><snm>Maier, Daniel Oliver</snm><sfx>et al</sfx><iid>100997719</iid><adr><str>Siemens AG 
Postfach 22 16 34</str><city>80506 München</city><ctry>DE</ctry></adr></B741></B740></B700><B800><B840><ctry>AL</ctry><ctry>AT</ctry><ctry>BE</ctry><ctry>BG</ctry><ctry>CH</ctry><ctry>CY</ctry><ctry>CZ</ctry><ctry>DE</ctry><ctry>DK</ctry><ctry>EE</ctry><ctry>ES</ctry><ctry>FI</ctry><ctry>FR</ctry><ctry>GB</ctry><ctry>GR</ctry><ctry>HR</ctry><ctry>HU</ctry><ctry>IE</ctry><ctry>IS</ctry><ctry>IT</ctry><ctry>LI</ctry><ctry>LT</ctry><ctry>LU</ctry><ctry>LV</ctry><ctry>MC</ctry><ctry>MK</ctry><ctry>MT</ctry><ctry>NL</ctry><ctry>NO</ctry><ctry>PL</ctry><ctry>PT</ctry><ctry>RO</ctry><ctry>SE</ctry><ctry>SI</ctry><ctry>SK</ctry><ctry>SM</ctry><ctry>TR</ctry></B840><B860><B861><dnum><anum>US2010044060</anum></dnum><date>20100802</date></B861><B862>en</B862></B860><B870><B871><dnum><pnum>WO2011017241</pnum></dnum><date>20110210</date><bnum>201106</bnum></B871></B870><B880><date>20120613</date><bnum>201224</bnum></B880></B800></SDOBI>
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