(19)
(11) EP 2 569 646 A2

(12)

(88) Date of publication A3:
01.03.2007

(43) Date of publication:
20.03.2013 Bulletin 2013/12

(21) Application number: 06739525.1

(22) Date of filing: 23.03.2006
(51) International Patent Classification (IPC): 
G01R 31/26(2006.01)
H01L 21/66(2006.01)
(86) International application number:
PCT/US2006/010779
(87) International publication number:
WO 2006/104886 (05.10.2006 Gazette 2006/40)
(84) Designated Contracting States:
DE FR GB

(30) Priority: 28.03.2005 US 665676 P
27.04.2005 US 116884

(71) Applicant: Texas Instruments Incorporated
Dallas, TX 75265-5474 (US)

(72) Inventor:
  • STILLMAN, Daniel, J.
    Garland, Texas 75044 (US)

(74) Representative: Holt, Michael 
Texas Instruments Limited European Patents Department 800 Pavilion Drive
Northampton NN4 7YL
Northampton NN4 7YL (GB)

   


(54) RESILIENT PROBES FOR ELECTRICAL TESTING