(19)
(11)
EP 2 569 646 A2
(12)
(88)
Date of publication A3:
01.03.2007
(43)
Date of publication:
20.03.2013
Bulletin 2013/12
(21)
Application number:
06739525.1
(22)
Date of filing:
23.03.2006
(51)
International Patent Classification (IPC):
G01R
31/26
(2006.01)
H01L
21/66
(2006.01)
(86)
International application number:
PCT/US2006/010779
(87)
International publication number:
WO 2006/104886
(
05.10.2006
Gazette 2006/40)
(84)
Designated Contracting States:
DE FR GB
(30)
Priority:
28.03.2005
US 665676 P
27.04.2005
US 116884
(71)
Applicant:
Texas Instruments Incorporated
Dallas, TX 75265-5474 (US)
(72)
Inventor:
STILLMAN, Daniel, J.
Garland, Texas 75044 (US)
(74)
Representative:
Holt, Michael
Texas Instruments Limited European Patents Department 800 Pavilion Drive
Northampton NN4 7YL
Northampton NN4 7YL (GB)
(54)
RESILIENT PROBES FOR ELECTRICAL TESTING