(19)
(11)
EP 2 622 691 A1
(12)
(43)
Date of publication:
07.08.2013
Bulletin 2013/32
(21)
Application number:
11754647.3
(22)
Date of filing:
01.09.2011
(51)
International Patent Classification (IPC):
H01R
13/24
(2006.01)
G01R
27/14
(2006.01)
G01R
1/04
(2006.01)
H01R
13/405
(2006.01)
(86)
International application number:
PCT/EP2011/065146
(87)
International publication number:
WO 2011/141582
(
17.11.2011
Gazette 2011/46)
(84)
Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
(30)
Priority:
30.09.2010
MY PI2010004583
(71)
Applicant:
ISMECA Semiconductor Holding SA
2300 La Chaux-de-Fonds (CH)
(72)
Inventors:
CHENG, Kian Aik
77000 Jasin Melaka (MY)
CHONG, Sek Hoi
75250 Melaka (MY)
(54)
AN ELECTRICAL CONTACT AND TESTING PLATFORM