(19)
(11) EP 2 622 691 A1

(12)

(43) Date of publication:
07.08.2013 Bulletin 2013/32

(21) Application number: 11754647.3

(22) Date of filing: 01.09.2011
(51) International Patent Classification (IPC): 
H01R 13/24(2006.01)
G01R 27/14(2006.01)
G01R 1/04(2006.01)
H01R 13/405(2006.01)
(86) International application number:
PCT/EP2011/065146
(87) International publication number:
WO 2011/141582 (17.11.2011 Gazette 2011/46)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

(30) Priority: 30.09.2010 MY PI2010004583

(71) Applicant: ISMECA Semiconductor Holding SA
2300 La Chaux-de-Fonds (CH)

(72) Inventors:
  • CHENG, Kian Aik
    77000 Jasin Melaka (MY)
  • CHONG, Sek Hoi
    75250 Melaka (MY)

   


(54) AN ELECTRICAL CONTACT AND TESTING PLATFORM