(19)
(11) EP 2 734 836 A2

(12)

(88) Date of publication A3:
07.03.2013

(43) Date of publication:
28.05.2014 Bulletin 2014/22

(21) Application number: 12814396.3

(22) Date of filing: 20.07.2012
(51) International Patent Classification (IPC): 
G01N 23/20(2006.01)
(86) International application number:
PCT/US2012/047568
(87) International publication number:
WO 2013/013134 (24.01.2013 Gazette 2013/04)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

(30) Priority: 21.07.2011 US 201161510280 P
19.04.2012 US 201261635685 P

(71) Applicant: The Trustees of Columbia University in the City of New York
New York, New York 10027 (US)

(72) Inventors:
  • BILLINGE, Simon
    Brooklyn, NY 11215 (US)
  • FARROW, Christopher
    Austin, TX 78749 (US)
  • KANATZIDIS, Mercouri
    Wilmette, IL 60091 (US)
  • GORELIK, Tatiana, E.
    D-55118 Mainz (DE)
  • SCHMIDT, Martin, U.
    D-65931 Frankfurt Am Main (DE)

(74) Representative: Vanzini, Christian et al
Jacobacci & Partners S.p.A. Corso Emilia 8
10152 Torino
10152 Torino (IT)

   


(54) METHOD OF COLLECTING AND PROCESSING ELECTRON DIFFRACTION DATA