ATBECHDEDKESFRGBGRITLILUNLSEMCPTIESILTLVFIROMKCYALTRBGCZEEHUPLSKBAHRIS..MTNORSMESM..................JDIM360 Ver 2.41 (21 Oct 2013) - 1620000/02767848EUROPEAN PATENT APPLICATIONA320141029EP13194141.12013112220131122enenen1315522020130214EP2014102920144420140820201434G01S 13/87 20060101AFI20140923BHEP G01S 13/74 20060101ALI20140923BHEP G01S 7/40 20060101ALI20140923BHEP G01S 13/34 20060101ALI20140923BHEP G01S 7/35 20060101ALI20140923BHEP deEntferenungsmessungs- und PositionierungssystemenRanging and positioning systemfrSystème de positionnement et de télémétrie11Semtech Corporation100218221XMS-15-EP200 Flynn RoadCamarillo, CA 93012USSeller, Olivier Bernard André7. Ch des Bassetries Les Grandes Rivières17220 Sainte SoulleFRP&TS SA (AG, Ltd.)101224761Av. J.-J. Rousseau 4 P.O. Box 28482001 NeuchâtelCHALATBEBGCHCYCZDEDKEEESFIFRGBGRHRHUIEISITLILTLULVMCMKMTNLNOPLPTRORSSESISKSMTRBAME20141029201444

A ranging and positioning system comprising transmitters and receiver nodes communicating together by chirp-modulated radio signals, that have a ranging mode in which ranging exchange of signals takes place between a master device and a slave device that leads to the evaluation of the range between them. The slave is arranged for recognizing a ranging request and transmit back a ranging response containing chirps that precisely aligned in time and frequency with the chirps in the ranging requests, whereupon the master can receive the ranging response, analyze the time and frequency the chirps contained therein with respect to his own time reference, and estimate a range to the slave.

XMS-15-EPEP13194141.1Semtech Corporation11MN20140122G01SUS2006232463A1BURTON DALE E [US] ET AL BURTON DALE EDWARD [US] ET AL20061019X1,3-7,10-15* paragraph [0028] - paragraph [0033]; figures 3,4 *Y2DE10310157A1SIEMENS AG [DE]20040923X1,3-7,10-15* paragraph [0035] - paragraph [0036]; figures 3a-3c *Y2
REIMAR PFEIL ET ALOptimized Parameter Estimation for the LPM Local Positioning SystemIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, IEEE SERVICE CENTER, PISCATAWAY, NJ, US2013010162110.1109/TIM.2012.22125930018-9456153166XP011477116
X1* Section II - III;page 154 - page 157 *US2011273334A1KARR LAWRENCE J [US]20111110Y2* paragraphs [0041], [0058] *US7843379B2MENZER LARS [US] ET AL20101130Y2* column 40, line 22 - line 35 *US5550549APROCTER JR JAMES A [US] ET AL19960827A1* column 2, line 29 - column 4, line 35; figures 1,2 *EP2278724A1NANOSCALE LABS [FR]20110126A1* paragraph [0082] - paragraph [0083]; figure 1 *Fanjul Caudevilla, JMunich20140923US2006232463A120061019AT410703T20081015EP1717600A120061102KR20060110229A20061024US2006232463A120061019DE10310157A120040923NONEUS2011273334A120111110NONEUS7843379B220101130EP1815267A120070808KR20070086252A20070827US2008231498A120080925WO2006051119A120060518US5550549A19960827NONEEP2278724A120110126CN102474297A20120523EP2278724A120110126EP2449690A120120509JP2012531869A20121210KR20120041210A20120430US2011064119A120110317