(19)
(11) EP 2 775 295 B8

(12) CORRECTED EUROPEAN PATENT SPECIFICATION
Note: Bibliography reflects the latest situation

(15) Correction information:
Corrected version no 1 (W1 B1)

(48) Corrigendum issued on:
18.05.2016 Bulletin 2016/20

(45) Mention of the grant of the patent:
02.03.2016 Bulletin 2016/09

(21) Application number: 13157864.3

(22) Date of filing: 05.03.2013
(51) International Patent Classification (IPC): 
G01N 23/207(2006.01)

(54)

An X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus.

Röntgenstrahlbrechungsverfahren zum Abbilden von Kornstrukturen in einer kristallinen Materialprobe und Röntgenstrahlbrechungsvorrichtung

Procédé de mise en correspondance de structures de grain par diffraction des rayons X dans un échantillon de matériau cristallin et appareil de diffraction des rayons X

(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

(43) Date of publication of application:
10.09.2014 Bulletin 2014/37

(73) Proprietor: Danmarks Tekniske Universitet
2800 Lyngby (DK)

(72) Inventors:
  • Lauridsen, Erik
    4652 Hårlev (DK)
  • Poulsen, Stefan Othmar
    2200 Copenhagen N (DK)
  • Holzner, Christian
    91631 Wettringen (DE)
  • Feser, Michael
    94563 Orinda California (US)

(74) Representative: Awapatent A/S 
Rigensgade 11
1316 Copenhagen K
1316 Copenhagen K (DK)


(56) References cited: : 
US-A- 5 193 104
   
  • LYNCH P ET AL: "A laboratory based system for Laue micro x-ray diffraction", REVIEW OF SCIENTIFIC INSTRUMENTS, AIP, MELVILLE, NY, US, vol. 78, no. 2, 9 February 2007 (2007-02-09), pages 23904-23904, XP012103777, ISSN: 0034-6748, DOI: 10.1063/1.2437777
  • LUDWIG W ET AL: "Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis", REVIEW OF SCIENTIFIC INSTRUMENTS, AIP, MELVILLE, NY, US, vol. 80, no. 3, 19 March 2009 (2009-03-19) , pages 33905-33905, XP012128160, ISSN: 0034-6748, DOI: 10.1063/1.3100200
  • MATTHIAS STOCKMEIER ET AL: "A focusing Laue diffractometer for the investigation of bulk crystals", JOURNAL OF APPLIED CRYSTALLOGRAPHY, vol. 41, no. 4, 1 August 2008 (2008-08-01) , pages 754-760, XP055059573, ISSN: 0021-8898, DOI: 10.1107/S0021889808012417
  • HOFMANN F ET AL: "High energy transmission micro-beam Laue synchrotron X-ray diffraction", MATERIALS LETTERS, NORTH HOLLAND PUBLISHING COMPANY. AMSTERDAM, NL, vol. 64, no. 11, 15 June 2010 (2010-06-15) , pages 1302-1305, XP026995754, ISSN: 0167-577X [retrieved on 2010-03-10]
   
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