(19)
(11) EP 2 797 034 A3

(12) EUROPEAN PATENT APPLICATION

(88) Date of publication A3:
24.08.2016 Bulletin 2016/34

(43) Date of publication A2:
29.10.2014 Bulletin 2014/44

(21) Application number: 14165471.5

(22) Date of filing: 22.04.2014
(51) International Patent Classification (IPC): 
G06K 9/62(2006.01)
G06F 11/00(2006.01)
G06N 7/00(2006.01)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA ME

(30) Priority: 22.04.2013 JP 2013089031

(71) Applicant: Yokogawa Electric Corporation
Tokyo 180-8750 (JP)

(72) Inventors:
  • Liu, Zhuo
    Tokyo, 180-8750 (JP)
  • Sakuraba, Yuichi
    Tokyo, 180-8750 (JP)

(74) Representative: Henkel, Breuer & Partner 
Patentanwälte Maximiliansplatz 21
80333 München
80333 München (DE)

   


(54) Event analyzer and computer-readable storage medium


(57) An event analyzer includes an event log collection module configured to collect an event log, an event log storage module configured to convert the event log into an event matrix and to store the event matrix, an event occurrence-order determination module configured to determine occurrenee-order of device events based on the event matrix, a Bayesian network generation module configured to specify device events serving as parent node candidates, to calculate evaluation values corresponding to each specified parent node candidate at a virtual device event obtained by shifting the device event serving as a processing object each unit time, and to select an device event serving as a parent node together with a shift amount, and an analysis module configured to output an device event estimated as a cause of an device event to be analyzed, or an device event estimated to occur later based on the shift amount.







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Search report