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<ep-patent-document id="EP12876054A1" file="EP12876054NWA1.xml" lang="en" country="EP" doc-number="2846423" kind="A1" date-publ="20150311" status="n" dtd-version="ep-patent-document-v1-5">
<SDOBI lang="en"><B000><eptags><B001EP>ATBECHDEDKESFRGBGRITLILUNLSEMCPTIESILTLVFIROMKCYALTRBGCZEEHUPLSKBAHRIS..MTNORSMESM..................</B001EP><B005EP>J</B005EP><B007EP>JDIM360 Ver 1.28 (29 Oct 2014) -  1100000/0</B007EP></eptags></B000><B100><B110>2846423</B110><B120><B121>EUROPEAN PATENT APPLICATION</B121><B121EP>published in accordance with Art. 153(4) EPC</B121EP></B120><B130>A1</B130><B140><date>20150311</date></B140><B190>EP</B190></B100><B200><B210>12876054.3</B210><B220><date>20120501</date></B220><B240><B241><date>20141029</date></B241></B240><B250>ja</B250><B251EP>en</B251EP><B260>en</B260></B200><B400><B405><date>20150311</date><bnum>201511</bnum></B405><B430><date>20150311</date><bnum>201511</bnum></B430></B400><B500><B510EP><classification-ipcr sequence="1"><text>H01S   5/022       20060101AFI20131118BHEP        </text></classification-ipcr><classification-ipcr sequence="2"><text>H01L  31/02        20060101ALI20131118BHEP        </text></classification-ipcr></B510EP><B540><B541>de</B541><B542>HALBLEITERGEHÄUSE</B542><B541>en</B541><B542>SEMICONDUCTOR PACKAGE</B542><B541>fr</B541><B542>BOÎTIER À SEMICONDUCTEUR</B542></B540><B590><B598>1</B598></B590></B500><B700><B710><B711><snm>Mitsubishi Electric Corporation</snm><iid>101323123</iid><irf>TJ347-P30746EP</irf><adr><str>7-3 Marunouchi 2-chome 
Chiyoda-ku</str><city>Tokyo 100-8310</city><ctry>JP</ctry></adr></B711></B710><B720><B721><snm>MATSUSUE, Akihiro</snm><adr><str>c/o Melco Advanced Device Corporation
970 Higashihirabaru
Takaki-cho</str><city>Isahaya-shi, Nagasaki 859-0133</city><ctry>JP</ctry></adr></B721></B720><B740><B741><snm>Prüfer &amp; Partner GbR 
European Patent Attorneys</snm><iid>101042742</iid><adr><str>Sohnckestraße 12</str><city>81479 München</city><ctry>DE</ctry></adr></B741></B740></B700><B800><B840><ctry>AL</ctry><ctry>AT</ctry><ctry>BE</ctry><ctry>BG</ctry><ctry>CH</ctry><ctry>CY</ctry><ctry>CZ</ctry><ctry>DE</ctry><ctry>DK</ctry><ctry>EE</ctry><ctry>ES</ctry><ctry>FI</ctry><ctry>FR</ctry><ctry>GB</ctry><ctry>GR</ctry><ctry>HR</ctry><ctry>HU</ctry><ctry>IE</ctry><ctry>IS</ctry><ctry>IT</ctry><ctry>LI</ctry><ctry>LT</ctry><ctry>LU</ctry><ctry>LV</ctry><ctry>MC</ctry><ctry>MK</ctry><ctry>MT</ctry><ctry>NL</ctry><ctry>NO</ctry><ctry>PL</ctry><ctry>PT</ctry><ctry>RO</ctry><ctry>RS</ctry><ctry>SE</ctry><ctry>SI</ctry><ctry>SK</ctry><ctry>SM</ctry><ctry>TR</ctry></B840><B844EP><B845EP><ctry>BA</ctry></B845EP><B845EP><ctry>ME</ctry></B845EP></B844EP><B860><B861><dnum><anum>JP2012061536</anum></dnum><date>20120501</date></B861><B862>ja</B862></B860><B870><B871><dnum><pnum>WO2013164876</pnum></dnum><date>20131107</date><bnum>201345</bnum></B871></B870></B800></SDOBI>
<abstract id="abst" lang="en">
<p id="pa01" num="0001">A metallic ring (2) is provided on the multilayer ceramic substrate (1). An optical semiconductor laser (6) is provided on the multilayer ceramic substrate (1) inside the metallic ring (1). A metallic cap (10) with a window (9) is joined to the metallic ring (2). The metallic ring (2) covers the optical semiconductor laser (6). An external heat sink (11) is joined to an external side surface of the metallic cap (10). These features make it possible to improve high-frequency characteristic, producibility and heat dissipation.<img id="iaf01" file="imgaf001.tif" wi="120" he="108" img-content="drawing" img-format="tif"/></p>
</abstract>
<description id="desc" lang="en"><!-- EPO <DP n="1"> -->
<heading id="h0001">Technical Field</heading>
<p id="p0001" num="0001">The present invention relates to a semiconductor package for optical communication.</p>
<heading id="h0002">Background Art</heading>
<p id="p0002" num="0002">Conventional semiconductor packages for optical communication include metal packages and CAN packages. A metal package is a combination of a multilayer ceramic substrate and a metallic box. A CAN package has a metal plate, a metallic rod passed through an open hole in the metal plate and hermetically sealed and insulated with glass, and a welded cap with a window.</p>
<p id="p0003" num="0003">The metal package has an excellent high-frequency characteristic because of use of the multilayer ceramic substrate. The metal package, however, has a complicated structure and a large number of parts and is high in cost. Also, because of its box form, parts can be mounted only from the opening side (upper side) before the package is closed.</p>
<p id="p0004" num="0004">In the case of the CAN package, parts can be mounted from all directions onto the upper surface of the metal plate, and the metal plate and the cap can be joined to each other in an instance by electric welding. The CAN package therefore has high producibility. However, since the lead for supplying a signal is fixed by glass sealing on the metal plate, it is difficult to achieve impedance matching thereat and the CAN package is inferior in high-frequency characteristic.</p>
<p id="p0005" num="0005">A semiconductor package has been proposed which has an optical semiconductor element mounted in a recess in an upper surface of a multilayer ceramic substrate and covered with a metallic cap with a window (see, for example, Patent Literature 1)</p>
<heading id="h0003">Citation List</heading>
<heading id="h0004">Patent Literature</heading><!-- EPO <DP n="2"> -->
<p id="p0006" num="0006">Patent Literature 1: Japanese Patent Laid-Open No. <patcit id="pcit0001" dnum="JP2003163382A"><text>2003-163382</text></patcit></p>
<heading id="h0005">Summary of Invention</heading>
<heading id="h0006">Technical Problem</heading>
<p id="p0007" num="0007">The material of the multilayer ceramic substrate is alumina ceramic. This means that the multilayer ceramic substrate has lower heat dissipation in comparison with the CAN package whose base portion is made of a metal.</p>
<p id="p0008" num="0008">The present invention has been achieved to solve the above-described problem, and an object of the present invention is to obtain a semiconductor package capable of being improved in high-frequency characteristic, producibility and heat dissipation.</p>
<heading id="h0007">Means for Solving the Problems</heading>
<p id="p0009" num="0009">A semiconductor package according to the present invention includes a multilayer ceramic substrate; a metallic ring on the multilayer ceramic substrate; an optical semiconductor element on the multilayer ceramic substrate inside the metallic ring; a metallic cap with a window, the metallic cap joined to the metallic ring and covering the optical semiconductor element; and an external heat sink joined to an external side surface of the metallic cap.</p>
<heading id="h0008">Advantageous Effects of Invention</heading>
<p id="p0010" num="0010">The present invention makes it possible to improve high-frequency characteristic, producibility and heat dissipation.</p>
<heading id="h0009">Brief Description of the Drawings</heading>
<p id="p0011" num="0011">
<ul id="ul0001" list-style="none" compact="compact">
<li><figref idref="f0001">Figure 1</figref> is a side view showing parts inside a cap of the semiconductor package according to Embodiment 1 of the present invention.<!-- EPO <DP n="3"> --></li>
<li><figref idref="f0001">Figures 2</figref> and <figref idref="f0002">3</figref> are sectional views each showing a state where the external heat sink of the semiconductor package according to Embodiment 1 of the present invention is joined to an external frame.</li>
<li><figref idref="f0003">Figure 4</figref> is a side view showing parts inside the cap in a modified example 1 of the semiconductor package according to Embodiment 1 of the present invention.</li>
<li><figref idref="f0003">Figure 5</figref> is a sectional view showing a state where the external heat sink in a modified example 2 of the semiconductor package according to Embodiment 1 of the present invention is joined to an external frame.</li>
<li><figref idref="f0004">Figure 6</figref> is a side view showing parts inside a cap of a semiconductor package according to Embodiment 2 of the present invention.</li>
<li><figref idref="f0004">Figure 7</figref> is a side view showing parts inside a cap of a semiconductor package according to Embodiment 3 of the present invention.</li>
</ul></p>
<heading id="h0010">Description of Embodiments</heading>
<p id="p0012" num="0012">A semiconductor package according to the embodiments of the present invention will be described with reference to the drawings. The same components will be denoted by the same symbols, and the repeated description thereof may be omitted.</p>
<heading id="h0011">Embodiment 1</heading>
<p id="p0013" num="0013"><figref idref="f0001">Figure 1</figref> is a side view showing parts inside a cap of the semiconductor package according to Embodiment 1 of the present invention. A metallic ring 2 made of Fe or Ni for example is provided on a multilayer ceramic substrate 1 formed of alumina or the like. An electrode 3 is provided on the multilayer ceramic substrate 1 inside the metallic ring 2. The electrode 3 is connected to a via 4 formed through the multilayer ceramic substrate 1. An internal heat sink 5 is provided on the multilayer ceramic substrate 1 inside the metallic ring 2.</p>
<p id="p0014" num="0014">A surface-emitting type of semiconductor laser 6 is provided on the internal heat sink 5. A surface-receiving type of light receiving element may be used in place of the surface-emitting type of semiconductor laser 6. Wiring 7 is provided on a surface of the internal heat sink 5. The semiconductor laser 6 and the wiring 7 are connected to each other by a wire.<!-- EPO <DP n="4"> --></p>
<p id="p0015" num="0015">The internal heat sink 5 is placed on the multilayer ceramic substrate 1 so that a portion of the electrode 3 and a portion of the wiring 7 are superposed on each other. The portion of the electrode 3 and the portion of the wiring 7 are joined to each other by an electrically conductive joint material 8 such as solder or an electrically conductive resin. Because of this nonuse of wire bonding, a high-frequency transmission loss at the joint between the electrode 3 and the wiring 7 can be reduced to improve a high-frequency characteristic. Since the need for a wire bonding step can be eliminated, the producibility can be improved.</p>
<p id="p0016" num="0016">A metallic cap 10 with a glass window 9 is electrically welded to the metallic ring 2. The metallic cap 10 is thinly formed of a Fe or Fe-Ni alloy. The metallic ring 2 covers the internal heat sink 5 and the semiconductor laser 6. An external heat sink 11 is joined to an external side surface of the metallic cap 10. A gap therebetween is filled with an adhesive 12 or solder. The gap therebetween may be filled with heat sink grease or the like after the metallic cap 10 and the external heat sink 11 have been welded to each other.</p>
<p id="p0017" num="0017">The external heat sink 11 extends to a lower surface of the multilayer ceramic substrate 1. The external heat sink 11 has flat joint surfaces 13 and 14 to be joined to an external frame. The flat joint surface 13 exists at a side surface of the external heat sink 11. The flat joint surface 14 exists at the lower surface side of the multilayer ceramic substrate 1.</p>
<p id="p0018" num="0018"><figref idref="f0001">Figures 2</figref> and <figref idref="f0002">3</figref> are sectional views each showing a state where the external heat sink of the semiconductor package according to Embodiment 1 of the present invention is joined to an external frame. Referring to <figref idref="f0001">Figure 2</figref>, the flat joint surface 13, which is a side surface of the external heat sink 11, is joined to a frame 15 at a customer's site. Referring to <figref idref="f0002">Figure 3</figref>, the flat joint surface 14, which is a lower surface of the external heat sink 11 is joined to the frame 15 at a customer's site. The gap between the external heat sink 11 and the frame 15 is filled with heat sink grease 16 or a soft heat sink sheet. Heat generated from the semiconductor laser 6 is released to the external frame 15 through the internal heat sink 5, the multilayer ceramic substrate 1, the metallic ring 2, the metallic cap 10 and the external heat sink 11.</p>
<p id="p0019" num="0019"><!-- EPO <DP n="5"> --> In the present embodiment, an improvement in high-frequency characteristic can be achieved by using the multilayer ceramic substrate 1. Also, the metallic ring 2 on the multilayer ceramic substrate 1 and the metallic cap 10 can be electrically welded to each other in an instant. There are no obstacles such as side walls on the multilayer ceramic substrate 1 before the metallic cap 10 is welded. Therefore, components including the semiconductor laser 6 can easily be mounted, thus improving the producibility.</p>
<p id="p0020" num="0020">The metallic cap 10 itself also functions as a kind of a heat sink, but its heat dissipation effect is low because the material thereof is thin. Contrarily, in the present embodiment, because the external heat sink 11 is welded to the metallic cap 10, the heat dissipation effect can be improved.</p>
<p id="p0021" num="0021"><figref idref="f0003">Figure 4</figref> is a side view showing parts inside the cap in a modified example 1 of the semiconductor package according to Embodiment 1 of the present invention. In the modified example 1, the surface-emitting type of semiconductor laser 6 (or a surface-receiving type of light receiving element) is directly mounted on the multilayer ceramic substrate 1. Even in such a case, where the internal heat sink 5 is removed, the same effect as that described above can be obtained.</p>
<p id="p0022" num="0022"><figref idref="f0003">Figure 5</figref> is a sectional view showing a state where the external heat sink in a modified example 2 of the semiconductor package according to Embodiment 1 of the present invention is joined to an external frame. In a case where the flat joint surface 13, which is a side surface of the external heat sink 11, is joined to the frame 15 at a customer's site, it is not required that the lower surface of the external heat sink 11 and the lower surface of the multilayer ceramic substrate 1 be flush with each other. In the modified example 2, these surfaces are not made flush with each other; the heat dissipation effect is improved by increasing the size of the external heat sink 11.</p>
<heading id="h0012">Embodiment 2</heading>
<p id="p0023" num="0023"><figref idref="f0004">Figure 6</figref> is a side view showing parts inside a cap of a semiconductor package according to Embodiment 2 of the present invention. In the present embodiment, the metallic ring 2 is<!-- EPO <DP n="6"> --> made thicker than the electrode 3. The effect of heat dissipation by release of heat from the product side surfaces can be improved in this way.</p>
<p id="p0024" num="0024">Also, an inner end portion of the metallic ring 2 is in contact with the internal heat sink 5. This construction enables heat to be conducted from the internal heat sink 5 to the metallic ring 2 having high heat conductivity instead of being conducted through the multilayer ceramic substrate 1 having low heat conductivity. The heat dissipation effect can thereby be further improved.</p>
<p id="p0025" num="0025">The outer end portion of the metallic ring 2 is made flush with the outer end portion of the multilayer ceramic substrate 1. The heat dissipation effect can be further improved by increasing the area of the metallic ring 2 so that it is equal to that of the multilayer ceramic substrate 1.</p>
<heading id="h0013">Embodiment 3</heading>
<p id="p0026" num="0026"><figref idref="f0004">Figure 7</figref> is a side view showing parts inside a cap of a semiconductor package according to Embodiment 3 of the present invention. In the present embodiment, the same external heat sink 11 as that in Embodiment 1 is added to the arrangement according to Embodiment 2. The external heat sink 11 is joined to an external side surface of the metallic cap 10 and to an outer end portion of the metallic ring 2. The heat dissipation effect can thereby be further improved.</p>
<p id="p0027" num="0027">In Embodiments 1 to 3, it is preferable to use AlN higher in heat conductivity than alumina as the material of the multilayer ceramic substrate 1. AlN has heat conductivity eight times or more higher than that of alumina. A semiconductor package improved in heat dissipation can therefore be obtained by using AlN.</p>
<p id="p0028" num="0028">In the case where the optical semiconductor element is the semiconductor laser 6, the glass window 9 may be replaced with a lens. Light emitted from the semiconductor laser 6 diffuses with the distance from the semiconductor laser 6 but can be condensed by the lens. The optical coupling efficiency can thereby be improved.</p>
<heading id="h0014">Description of Symbols</heading><!-- EPO <DP n="7"> -->
<p id="p0029" num="0029">
<dl id="dl0001" compact="compact">
<dt>1</dt><dd>multilayer ceramic substrate</dd>
<dt>2</dt><dd>metallic ring</dd>
<dt>3</dt><dd>electrode</dd>
<dt>5</dt><dd>internal heat sink</dd>
<dt>6</dt><dd>semiconductor laser(optical semiconductor element)</dd>
<dt>7</dt><dd>wiring</dd>
<dt>9</dt><dd>glass window (window)</dd>
<dt>10</dt><dd>metallic cap</dd>
<dt>11</dt><dd>external heat sink</dd>
<dt>13,14</dt><dd>flat joint surface</dd>
<dt>15</dt><dd>frame</dd>
</dl></p>
</description>
<claims id="claims01" lang="en"><!-- EPO <DP n="8"> -->
<claim id="c-en-0001" num="0001">
<claim-text>A semiconductor package comprising:
<claim-text>a multilayer ceramic substrate;</claim-text>
<claim-text>a metallic ring on the multilayer ceramic substrate;</claim-text>
<claim-text>an optical semiconductor element on the multilayer ceramic substrate inside the metallic ring;</claim-text>
<claim-text>a metallic cap with a window, the metallic cap joined to the metallic ring and covering the optical semiconductor element; and</claim-text>
<claim-text>an external heat sink joined to an external side surface of the metallic cap.</claim-text></claim-text></claim>
<claim id="c-en-0002" num="0002">
<claim-text>The semiconductor package according to claim 1, wherein the external heat sink has a flat joint surface to be joined to an external frame.</claim-text></claim>
<claim id="c-en-0003" num="0003">
<claim-text>The semiconductor package according to claim 2, wherein the external heat sink extends to a lower surface of the multilayer ceramic substrate, and the flat joint surface exists at a lower surface side of the multilayer ceramic substrate.</claim-text></claim>
<claim id="c-en-0004" num="0004">
<claim-text>A semiconductor package comprising:
<claim-text>a multilayer ceramic substrate;</claim-text>
<claim-text>a metallic ring on the multilayer ceramic substrate;</claim-text>
<claim-text>an electrode on the multilayer ceramic substrate inside the metallic ring;</claim-text>
<claim-text>an optical semiconductor element on the multilayer ceramic substrate inside the metallic ring and connected to the electrode; and</claim-text>
<claim-text>a metallic cap with a window, the metallic cap joined to the metallic ring and covering the optical semiconductor element,</claim-text>
<claim-text>wherein the metallic ring is thicker than the electrode.</claim-text></claim-text></claim>
<claim id="c-en-0005" num="0005">
<claim-text><!-- EPO <DP n="9"> --> The semiconductor package according to claim 4, further comprising an internal heat sink on the multilayer ceramic substrate inside the metallic ring,<br/>
the optical semiconductor element is provided on the internal heat sink, and an inner end portion of the metallic ring is in contact with the internal heat sink.</claim-text></claim>
<claim id="c-en-0006" num="0006">
<claim-text>A semiconductor package comprising:
<claim-text>a multilayer ceramic substrate;</claim-text>
<claim-text>a metallic ring on the multilayer ceramic substrate;</claim-text>
<claim-text>an internal heat sink on the multilayer ceramic substrate inside the metallic ring;</claim-text>
<claim-text>an optical semiconductor element on the internal heat sink; and</claim-text>
<claim-text>a metallic cap with a window, the metallic cap joined to the metallic ring and covering the optical semiconductor element,</claim-text>
<claim-text>wherein an inner end portion of the metallic ring is in contact with the internal heat sink.</claim-text></claim-text></claim>
<claim id="c-en-0007" num="0007">
<claim-text>The semiconductor package according to any one of claims 4 to 6, wherein an outer end portion of the metallic ring is made flush with an outer end portion of the multilayer ceramic substrate.</claim-text></claim>
<claim id="c-en-0008" num="0008">
<claim-text>The semiconductor package according to any one of claims 4 to 7, further comprising an external heat sink joined to an outer end portion of the metallic ring.</claim-text></claim>
</claims>
<drawings id="draw" lang="en"><!-- EPO <DP n="10"> -->
<figure id="f0001" num="1,2"><img id="if0001" file="imgf0001.tif" wi="147" he="233" img-content="drawing" img-format="tif"/></figure><!-- EPO <DP n="11"> -->
<figure id="f0002" num="3"><img id="if0002" file="imgf0002.tif" wi="158" he="178" img-content="drawing" img-format="tif"/></figure><!-- EPO <DP n="12"> -->
<figure id="f0003" num="4,5"><img id="if0003" file="imgf0003.tif" wi="160" he="233" img-content="drawing" img-format="tif"/></figure><!-- EPO <DP n="13"> -->
<figure id="f0004" num="6,7"><img id="if0004" file="imgf0004.tif" wi="156" he="233" img-content="drawing" img-format="tif"/></figure>
</drawings>
<search-report-data id="srep" lang="en" srep-office="EP" date-produced=""><doc-page id="srep0001" file="srep0001.tif" wi="165" he="232" type="tif"/><doc-page id="srep0002" file="srep0002.tif" wi="165" he="230" type="tif"/></search-report-data>
<ep-reference-list id="ref-list">
<heading id="ref-h0001"><b>REFERENCES CITED IN THE DESCRIPTION</b></heading>
<p id="ref-p0001" num=""><i>This list of references cited by the applicant is for the reader's convenience only. It does not form part of the European patent document. Even though great care has been taken in compiling the references, errors or omissions cannot be excluded and the EPO disclaims all liability in this regard.</i></p>
<heading id="ref-h0002"><b>Patent documents cited in the description</b></heading>
<p id="ref-p0002" num="">
<ul id="ref-ul0001" list-style="bullet">
<li><patcit id="ref-pcit0001" dnum="JP2003163382A"><document-id><country>JP</country><doc-number>2003163382</doc-number><kind>A</kind></document-id></patcit><crossref idref="pcit0001">[0006]</crossref></li>
</ul></p>
</ep-reference-list>
</ep-patent-document>
