(19)
(11) EP 2 883 067 B8

(12) CORRECTED EUROPEAN PATENT SPECIFICATION
Note: Bibliography reflects the latest situation

(15) Correction information:
Corrected version no 1 (W1 B1)

(48) Corrigendum issued on:
20.03.2019 Bulletin 2019/12

(45) Mention of the grant of the patent:
16.01.2019 Bulletin 2019/03

(21) Application number: 13756337.5

(22) Date of filing: 08.08.2013
(51) International Patent Classification (IPC): 
G01R 31/317(2006.01)
 G01R 29/26(2006.01)
(86) International application number:
PCT/EP2013/066668
(87) International publication number:
WO 2014/023811 (13.02.2014 Gazette 2014/07)

(54)

EFFICIENT POWER SUPPLY NOISE MEASUREMENT BASED ON TIMING UNCERTAINTY

EFFIZIENTE STROMVERSORGUNGS-RAUSCHMESSUNG AUF BASIS VON TIMING-UNSICHERHEITEN

MESURE DE BRUIT D'UNE ALIMENTATION ÉLECTRIQUE EFFICACE SUR LA BASE DE L'INCERTITUDE DE LA SYNCHRONISATION

(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

(30) Priority: 08.08.2012 EP 12305986
15.10.2012 US 201261714162 P

(43) Date of publication of application:
17.06.2015 Bulletin 2015/25

(73) Proprietor: Telefonaktiebolaget LM Ericsson (publ)
164 83 Stockholm (SE)

(72) Inventors:
  • VALKA, Miroslav
    F-38200 La Verpilliere (FR)
  • BOSIO, Alberto
    F-34090 Montpellier (FR)
  • BROUTIN, Mickael
    F-38170 Seyssinet Pariset (FR)
  • DEBAUD, Philippe
    F-38410 St Martin D'uriage (FR)
  • GIRARD, Patrick
    F-34400 Villetelle (FR)
  • GUILHOT, Stéphane
    F-38320 Herbeys (FR)

(74) Representative: Grünecker Patent- und Rechtsanwälte PartG mbB 
Leopoldstraße 4
80802 München
80802 München (DE)


(56) References cited: : 
US-A1- 2012 146 665
   
  • S. SUNTER ET AL: "On-chip digital jitter measurement, from megahertz to gigahertz", IEEE DESIGN & TEST OF COMPUTERS, vol. 21, no. 4, 1 July 2004 (2004-07-01), pages 314-321, XP055085079, ISSN: 0740-7475, DOI: 10.1109/MDT.2004.38
  • JUI-JER HUANG ET AL: "Low-cost jitter measurement technique for BIST applications", TEST SYMPOSIUM, 2003. ATS 2003. 12TH ASIAN 16-19 NOV. 2003, PISCATAWAY, NJ, USA,IEEE, 16 November 2003 (2003-11-16), pages 336-339, XP010672509, DOI: 10.1109/ATS.2003.1250833 ISBN: 978-0-7695-1951-7 cited in the application
  • FRANCH R ET AL: "On-chip timing uncertainty measurements on IBM microprocessors", INTERNATIONAL TEST CONFERENCE 2007, 23-25 OCT.2007, SANTA CLARA, CA, USA, IEEE, PISCATAWAY, NJ, USA, 1 October 2007 (2007-10-01), pages 1-7, XP031206942, DOI: 10.1109/TEST.2007.4437560 ISBN: 978-1-4244-1127-6 cited in the application
   
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