(19)
(11) EP 2 912 512 A1

(12)

(43) Date of publication:
02.09.2015 Bulletin 2015/36

(21) Application number: 13851247.0

(22) Date of filing: 29.10.2013
(51) International Patent Classification (IPC): 
G02B 21/14(2006.01)
G02B 21/00(2006.01)
(86) International application number:
PCT/SE2013/051257
(87) International publication number:
WO 2014/070082 (08.05.2014 Gazette 2014/19)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA ME

(30) Priority: 29.10.2012 US 201213663069

(71) Applicant: General Electric Company
Schenectady, New York 12345 (US)

(72) Inventors:
  • KIM, Evgenia, Mikhailovna
    Niskayuna, New York 12309 (US)
  • YAZDANFAR, Siavash
    Niskayuna, New York 12309 (US)
  • DYLOV, Dmitry, Vladimirovich
    Niskayuna, New York 12309 (US)

(74) Representative: Serjeants LLP 
Dock 75 Exploration Drive
Leicester, LE4 5NU
Leicester, LE4 5NU (GB)

   


(54) QUANTITATIVE PHASE MICROSCOPY FOR LABEL-FREE HIGH-CONTRAST CELL IMAGING