Field of the Invention
[0001] The present invention is directed to environmentally friendly gold electroplating
compositions and methods. More specifically, the present invention is directed to
environmentally friendly gold electroplating compositions and methods where soft gold
may be electroplated over broad current density ranges to provide bright soft gold
deposits even under jet and pulse current plating conditions.
Background of the Invention
[0002] Electrolytic gold is typically used in connectors and electronic finishing because
of the exceptional performance of gold for these particular uses. Gold is one of the
most reliable materials for electronic components because of its anticorrosion properties,
electrical conductivity and thermal stability. Substantially pure gold is generally
electroplated from cyanide electrolytic plating baths containing several additives
and metallic brighteners. Some of those additives such as hydrazine are toxic and
are now restricted by many national and international regulations. Most commercial
pure gold baths contain free-cyanide and one or more grain refiner such as arsenic,
thallium and lead which are known to be toxic to the environment, thus disposal of
waste from such gold plating baths must be discrete and is also time consuming and
costly to the industry. In addition, such gold electroplating baths present undue
hazards to workers using the baths.
[0003] U.S. 5,277,790 to Morrissey discloses a cyanide-free gold electroplating bath where gold is provided as a soluble
sulfite complex. Although the gold electroplating bath is cyanide-free, it undesirably
generates sulfur dioxide at elevated temperatures. Sulfur dioxide is a toxic gas with
a pungent odor. To address the problem even more sulfites are added to the plating
solution. In addition, the gold is plated at relatively low plating rates from near
0 to 30 mA/cm
2. Accordingly, there is a need for an improved gold electroplating bath which is environmentally
friendly and can plate over broad current density ranges.
Summary of the Invention
[0004] Gold electroplating compositions including one or more sources of gold ions from
gold-cyanide salts, one or more sources of phosphate ions, one or more sources of
phosphonic acids or salts thereof, sodium potassium tartrate and one or more sources
of antimony (III) ions, the gold electroplating compositions are substantially free
of free-cyanide.
[0005] Method of electroplating gold include providing a gold electroplating composition
including one or more sources of gold ions from gold-cyanide salts, one or more sources
of phosphate ions, one or more sources of phosphonic acids or salts thereof, sodium
potassium tartrate and one or more sources of antimony (III) ions, the gold electroplating
compositions are substantially free of free-cyanide; contacting a substrate with the
gold electroplating composition; and electroplating gold on the substrate using direct
current or pulse current at a current density of 0.03 ASD or greater.
[0006] The gold electroplating compositions are environmentally friendly and may plate bright
soft gold deposits over broad current density ranges including under high speed jet
plating conditions. The soft gold deposits also have fine grain structures. The electroplating
gold compositions may be used to plate gold strike layers on electronic components
and may be used to electroplate soft gold layers in the formation of contacts for
connectors and gold layers on switches or printed circuit boards. The gold electroplating
compositions may also be used to deposit soft gold layers on decorative articles.
The gold deposits also have fine grain structures. Small grain size reduces porosity
in thin film. The brightness of the deposits is also a direct consequence of this
small grain size. Generally, the roughness of matte or semi bright deposit is high
as compared to bright deposits which are smooth.
Brief Description of the Drawings
[0007]
Figure 1 is a SEM at 20,000 magnification showing the microstructure of a soft gold
deposit electroplated with a gold electroplating composition containing antimony (III)
ions.
Figure 2 is a SEM at 20,000 magnification showing the microstructure of a gold deposit
electroplated with a conventional gold electroplating bath containing lead as a grain
refiner.
Detailed Description of the Invention
[0008] As used throughout this specification, the following abbreviations shall have the
following meanings, unless the context clearly indicates otherwise: °C = degrees Centigrade;
g = gram; mg = milligrams; L = liter; mL = milliliters; cm = centimeters; mm = millimeters;
µm = microns = micrometers; ppb = parts per billion; ms = milliseconds; DC = direct
current; ASD = amperes/decimeter squared = A/dm
2 and ASTM = American Standard Testing Method.
[0009] The terms "electroplating" and "plating" are used interchangeably throughout this
specification. The terms "composition", "solution" and "bath" are used interchangeably
throughout the specification. The terms "a" and "an" refer to both the singular and
the plural.
[0010] All percentages are by weight, unless otherwise noted. All numerical ranges are inclusive
and combinable in any order, except where it is logical that such numerical ranges
are constrained to add up to 100%.
[0011] Compositions include gold ions from one or more gold-cyanide salts such as alkali
gold cyanide compounds such as potassium gold cyanide, sodium gold cyanide and ammonium
gold cyanide. Preferably the alkali gold cyanide compound is potassium gold cyanide.
Although gold ions are provided by gold-cyanide salts, there is no free-cyanide added
in the gold electroplating compositions such as cyanide alkali metal salts or any
salt, except gold salts, which may provide free cyanide ligands.
[0012] In addition to the gold-cyanide salts, additional gold ions may be provided by alkali
gold thiosulfate compounds such as trisodium gold thiosulfate and tripotassium gold
thiosulfate, gold halides such as gold chloride, hydrogen tetrachloroaurate and gold
trichloride. Preferably gold ions are provided only from gold-cyanide salts. Such
gold compounds are generally commercially available from a variety of suppliers or
may be prepared by methods well known in the art.
[0013] The amount of gold salts added to the compositions is in amounts which provide gold
ions at desired concentrations. In general, gold ions are in amounts of 4 g/L to 20
g/L, preferably from 8 g/L to 20 g/L, more preferably from 15 g/L to 20 g/L. The amount
of gold ions in the electroplating compositions depends on the type of plating, such
as jet, rack or barrel plating.
[0014] Conducting inorganic acid and salts thereof are included in the gold electroplating
compositions. Such conducting acids, include, but are not limited to phosphoric acid,
sulfuric acid and hydrochloric acid and salts thereof. Preferably, the conducting
inorganic acid and salts thereof are chosen from phosphoric acid and potassium dihydrogen
phosphate, sodium dihydrogen phosphate, potassium phosphate, sodium phosphate and
mixtures thereof. Preferably, phosphoric acid is added when using potassium phosphate
[0015] Alkaline compounds also may be added to maintain the pH of the compositions at desired
levels of 5 to 6.8, preferably 5.8 to 6.7, more preferably from 6 to 6.3. Such alkaline
compounds include, but are not limited to, hydroxides, carbonates, and other salts
of sodium, potassium and magnesium. For example, NaOH, KOH, K
2CO
3, Na
2CO
3, NaHCO
3 and mixtures thereof are suitable alkaline compounds. Typically, the alkaline materials
are included in amounts of 1 g/L to 100 g/L.
[0016] Organophosphorus compounds are included as chelating agents for the gold ions in
the gold electroplating compositions. They deprotonate and chelate with gold ions
in the pH range of the gold electroplating compositions and the chelating capabilities
of these compounds is good enough such that free cyanide from potassium cyanide or
sodium cyanide is not added to stabilize the gold compositions.
[0017] The organophosphorus compounds include those compounds having the following formulation:

wherein n is an integer from 2 to 3, inclusive, M
1 and M
2 may be the same or different and are chosen from hydrogen, ammonium, lower alkyl
amine having 1-9 carbons atoms, preferably 1-5 carbon atoms or an alkali metal cation
such as sodium, potassium and lithium, preferably the alkali metal cation is potassium
or sodium, and Z is a radical equal in valence to n and is a linear or branched, substituted
or unsubstituted (C
1-C
12)alkyl or an N-substituted (C
2-C
3)alkyl where the Z radical has a carbon atom linked to a phosphorus atom of formula
(I). Preferably, Z is a linear or branched, substituted or unsubstituted (C
1-C
4)alkyl where the substituent group is hydroxyl. Such compounds are included in amounts
of 5 g/l to 200 g/L, preferably from 20 g/L to 150 g/L, more preferably from 50 g/l
to 120 g/L.
[0018] A class of compounds falling within the above general formula includes aminotri (lower
alkylidene phosphonic acids). Examples of such compounds include aminotri(methylene
phosphonic acid), aminotri(ethylidene phosphonic acid), aminotri(isopropyllidene phosphonic
acid), aminodi(methylene phosphonic acid) mono (ethylidene phosphonic acid), aminodi(methylene
phosphonic acid) mono(isopropylidene phosphonic acid), aminomono(methylene phosphonic
acid) di(ethylidene phosphonic acid) and aminomono(methylene phosphonic acid) diisopropylidene
phosphonic acid.
[0019] Lower alkylidene diphosphonic acid compounds within the scope of the above formula
are methylene diphosphonic acid, ethylidene diphosphonic acid, isopropylene diphosphonic
acid, isopropylidene diphosphonic acid, 1-hydroxyethylidene diphosphonic acid, 1-hydroxypropylidene
diphosphonic acid, butylidene diphophonic acid.
[0020] Particularly preferred organophosphorus compounds are tetrapotassium 1-hydroxyethylidene
diphosphonate, tetrasodium 1-hydroxyethylidene diphosphonate and hydroxyethylene-1,1-diphosphonic
acid.
[0021] Antimony (III) ions are included as potassium antimony tartrate in combination with
sodium potassium tartrate. Although antimony (III) ions may be added as antimony chloride
or antimony sulfate, antimony (III) is preferably added as antimony tartrate. The
salts of antimony (III) are added to the gold electroplating compositions in amounts
to provide 1 mg/L to 20 mg/L, preferably 5 mg/L to 15 mg/L of antimony (III) ions.
Sodium potassium tartrate is added to the gold electroplating compositions in amounts
of 10 g/l to 50 g/L, preferably from 15 g/l to 35 g/L. Additional tartrate may be
added to the gold electroplating compositions as tartaric acid, potassium tartrate
or other water soluble tartrate salts and compounds in the amounts specified for the
sodium potassium tartrate; however, the most preferred source of tartrate is sodium
potassium tartrate for preventing the antimony (III) ions from oxidizing to antimony
(V) ions. While not being bound by theory, the presence of the antimony (III) ions
may provide for a bright gold deposit even under jet plating conditions. In addition,
antimony may provide for a soft gold deposit.
[0022] Optionally, the gold plating compositions may include one or more organic acids,
such as citric acid, malic acid, oxalic acid, formic acid or polyethylene amino acetic
acid or inorganic acids such as phosphoric acid. Such acids help maintain the pH of
the compositions in the desired range. Typically, the acids are included in amounts
of 1 g/L to 200 g/L.
[0023] Optionally, a wide variety of additional gold chelating or complexing agents may
be included in the compositions. Suitable gold complexing agents include, but are
not limited to thiosulfuric acid, thiosulfate salts such as sodium thiosulfate, potassium
thiosulfate, potassium sorbate and ammonium thiosulfate, ethylenediamine tetraacetic
acid and its salts, iminodiacetic acid and nitrilotriacetic acid.
[0024] The one or more additional chelating or complexing agents may be added in conventional
amounts, or such as in amounts of 1 g/L to 100 g/L, or such as 10 g/L to 50 g/L. The
one or more complexing agents are generally commercially available or may be prepared
from methods well known in the art.
[0025] The compositions also may include one or more surfactants. Any suitable surfactant
may be used in the compositions. Such surfactants include, but are not limited to,
alkoxyalkyl sulfates (alkyl ether sulfates) and alkoxyalkyl phosphates (alkyl ether
phosphates). The alkyl and alkoxy groups typically contain from 10 to 20 carbon atoms.
Examples of such surfactants are sodium lauryl sulfate, sodium capryl sulfate, sodium
myristyl sulfate, sodium ether sulfate of a C
12-C
18 straight chain alcohol, sodium lauryl ether phosphate and corresponding potassium
salts.
[0026] Other suitable surfactants which may be used include, but are not limited to, N-oxide
surfactants. Such N-oxide surfactants include, but are not limited to, cocodimethylamine
N-oxide, lauryldimethylamine N-oxide, oleyldimethylamine N-oxide, dodecyldimethylamine
N-oxide, octyldimethylamine N-oxide, bis-(hydroxyethyl)isodecyloxypropylamine N-oxide,
decyldimethylamine N-oxide, cocamidopropyldimethylamine N-oxide, bis(hydroxyethyl)
C
12-C
15 alkoxypropylamine N-oxide, lauramine N-oxide, laurami-dopropyldimethylamine N-oxide,
C
14-C
16 alkyldimethylamine N-oxide, N,N-diemthyl (hydrogenated tallow alkyl) amine N-oxide,
isostearamidopropyl morpholine N-oxide, and isostearamidopropyl pyridine N-oxide.
[0027] Other suitable surfactants include, but are not limited to, betaines, and alkoxylates
such as the ethylene oxide/propylene oxide (EO/PO) compounds. Such surfactants are
well known in the art.
[0028] Many of the surfactants may be commercially obtained or made by methods described
in the literature. Typically, the surfactants are included in the compositions in
amounts of 0.1 g/L to 20 g/L.
[0029] The components of the compositions may be combined by any suitable method known in
the art. Typically, the components are mixed in any order and the compositions are
brought to a desired volume by adding sufficient water. Some heating may be necessary
to solubilize certain composition components. The gold electroplating compositions
are substantially free of arsenic, lead, thallium, hydrazine and sulfites. In general,
substantially free means that the metals, hydrazine and sulfites are not readily detectable
with most conventional analytical apparatus or, if they are detectable, they are at
levels of 100 ppb or less.
[0030] In general, current density may range from 0.03 ASD and higher using DC or pulse
plating. For barrel plating applications, current densities may be from 0.05 ASD to
2.5 ASD using DC current. Gold ion concentrations preferably range from 4 g/L to 8
g/L. For rack plating applications, current densities may range from 0.05 ASD to 4
ASD using DC current. Gold ion concentrations preferably range from 8 g/L to 12 g/L;
however, the applicable current density may be extend to 6 ASD for rack plating when
using pulse current with ON: OFF times of 1: 3 ms. When jet plating with jet plating
equipment, gold ion concentrations preferably range from 12 g/L to 20 g/L. Bright
deposit may be obtained from 2 ASD to 70 ASD pulse peak current and ON:OFF pulse parameter
of 1:1 to 1:4 ms. The jet agitation can be varied from 100 L/hour to 1000 L/hour depending
on the applied current density. It is preferable to use high agitation at higher pulse
peak current. The soft gold electroplating compositions may be used in rack plating,
barrel plating and high speed jet plating by adjusting the gold concentration and
the plating parameters. Unlike many conventional pure gold electroplating compositions,
the gold electroplating compositions can be used with jet plating equipment for high
speed gold deposition. Jet plating or plating at higher current densities is fast
and provides increased electroplating efficiency on production lines than plating
at lower current densities. Such high speed jet plating methods are highly desirable
for mass production.
[0031] In addition to providing a bright deposit at high current densities, the soft gold
electroplating compositions deposit substantially uniform soft gold deposits. Gold
hardness is typically expressed as knoop hardness values and represents the average
of a number of tests using a 25 gram indenting tool. The knoop hardness is from 91
to 129 a gold class B according to ASTM B488-11 as plated. After annealing the knoop
hardness is 78 or a gold class A. The purity of the gold deposits is 99.9% and is
type III purity.
[0032] Plating times may vary. The amount of time depends on the desired thickness of the
gold on the substrate. Typically, the thickness of the gold is from 0.01 microns to
50 microns, or such as from 0.1 microns to 2 microns, or such as from 0.2 microns
to 0.5 microns.
[0033] Conventional gold plating apparatus may be used to electroplate gold on substrates.
The anodes are insoluble anodes such as stainless steel, platinum, platinum-clad tantalum,
platinized titanium and graphite. Preferably, the anode is a platinized titanium anode.
[0034] The soft gold electroplating compositions may be used to electroplate gold layers
on metals such as nickel, nickel alloys, copper, copper alloys, tin and tin alloys.
Preferably, the gold electroplating compositions are used to electroplate gold on
nickel and nickel alloys such as contacts, connectors, switches and printed circuit
boards. The gold electroplating compositions may also be used to plate gold layers
on decorative articles such as jewelry. The gold electroplating compositions may also
be used to plate strike layers on substrates to improve adhesion between metal layers.
[0035] The soft gold electroplating compositions are environmentally friendly and may plate
bright gold deposits over the applicable current density ranges using DC or pulse
current and under barrel, rack or jet plating conditions. The gold deposits also have
fine grain structures. Small grain size reduces porosity in thin film. The brightness
of the deposits is also a direct consequence of this small grain size. Generally,
the roughness of matte or semi-bright deposit is high as compared to bright deposits
which are smooth.
[0036] The following examples are intended to illustrate the invention, but are not intended
to limit its scope.
Example 1
[0037] An aqueous soft gold electroplating bath having the following composition was prepared:
Table 1
COMPONENT |
AMOUNT |
Gold from potassium gold cyanide |
8 g/L |
Potassium dihydrogenate phosphate |
79 g/L |
Hydroxyethylene-1,1-diphosphonic acid |
113 g/L |
Potassium hydroxide |
64 g/L |
KATHONE™ LXE Biocide1 |
50 mg/L |
Sodium potassium tartrate |
20 g/L |
Antimony (III) from potassium antimony tartrate |
8 mg/L (antimony (III)) |
15-Chlor-2 methyl-4-isothiazol-3-on, magnesium nitrate, copper nitrate and 2-methyl-2H-isothiazol-3-one
available from The Dow Chemical Company, Midland, MI. |
[0038] Five double sided nickel pre-plated copper test panels 15 x 20 mm
2 were immersed in 500 mL baths of the soft gold electroplating bath for 3 minutes
to plate gold on nickel. The anode was a platinized titanium electrode. The baths
were agitated using a magnetic stirrer during the entire 3 minutes. The baths had
a pH of 6.2 and the temperatures of the baths were 55 °C. DC current was applied with
a current density of 1 ASD. After the 3 minute period, the coupons were removed from
the baths, rinsed with deionized water and air dried. The gold deposits were bright.
The thickness of the gold deposits was measured with a FISHERSCOPE™ X-ray apparatus,
model XDV-SD, and was determined to be 1.7 microns. The panels were then analyzed
for the microstructure of the gold deposit using a SEM microscope at 20,000 magnification.
Figure 1 shows one of the SEMs taken with the microscope. The SEM showed small grain
structure.
Example 2 (Comparative)
[0039] An aqueous gold electroplating bath having the following formula was prepared:
Table 2
COMPONENT |
AMOUNT |
Gold from potassium gold cyanide |
8 g/L |
Potassium dihydrogenate phosphate |
79 g/L |
Hydroxyethylene-1,1-diphosphonic acid |
113 g/L |
Potassium hydroxide |
64 g/L |
KATHONE™ LXE Biocide |
50 mg/L |
Acetic acid |
5 g/L |
Lead acetate trihydrate |
6 mg/L as lead |
[0040] Five double sided nickel pre-plated copper test panels 15 x 20 mm
2 were immersed in a 500 mL bath of the gold electroplating baths for 3 minutes to
plate gold on nickel. The anode was a platinized titanium electrode. The baths were
agitated using a magnetic stirrer during the entire 3 minutes. The baths had a pH
of 6.2 and the temperatures of the baths were 55 °C. DC current was applied with a
current density of 1 ASD. After the 3 minute period, the coupons were removed from
the baths, rinsed with deionized water and air dried. The thickness of the gold deposits
was 1.7 microns. The panels were then analyzed for the microstructure of the gold
deposit using a SEM microscope at 20,000 magnification. Figure 2 shows one of the
SEMs taken with the microscope. The SEM showed coarse grain structure. This microstructure
was in agreement with the optical appearance of the deposit which was semi-bright.
The grain structure and the optical appearance of gold plated from Table 2 were inferior
to that of the gold electroplating composition of Example 1 where the test panels
were electroplated with gold from an electroplating bath containing antimony (III)
from potassium antimony tartrate with sodium potassium tartrate and free of lead.
Example 3
[0041] Eight double sided nickel pre-plated copper test panels 15 x 20 mm
2 were immersed separately in 500 mL baths containing gold electroplating baths having
the formulation in Table 1 of Example 1. The anode was a platinized titanium electrode.
Electroplating gold on nickel was done for 3 minutes for each bath. The baths were
agitated using a magnetic stirrer during the entire plating time. The baths had a
pH of 6.2 and the temperatures of the baths were 55 °C. DC current was applied with
varying current densities from one panel to another. The current densities were 0.5
ASD, 1.2 ASD, 1.5 ASD, 2 ASD, 2.5 ASD, 3 ASD, 3.5 ASD and 4 ASD. After plating, the
panels were removed from the baths, rinsed with deionized water and air dried. All
of the gold deposits had a bright appearance.
[0042] The electroplating process described above was repeated except that the gold electroplating
bath of Table 2 of Example 2 was used. After plating, the gold deposits electroplated
from 0.5 ASD to 3 ASD had semi-bright deposits; however, the gold plated at 3.5 ASD
and 4 ASD had a dull-matte appearance. The results showed that the gold electroplating
bath of Table 1 had an improved plating performance in terms of applicable current
density and appearance over the lead containing gold electroplating bath of Table
2.
Example 4
[0043] A soft gold electrolytic plating bath as shown in the table below was prepared:
Table 3
COMPONENT |
AMOUNT |
Gold from potassium gold cyanide |
20 g/L |
Potassium dihydrogenate phosphate |
79 g/L |
Hydroxyethylene-1,1-diphosphonic acid |
113 g/L |
Potassium hydroxide |
64 g/L |
KATHONE™ LXE Biocide |
50 mg/L |
Sodium potassium tartrate |
20 g/L |
Antimony (III) from potassium antimony tartrate |
10 mg/L (antimony (III)) |
[0044] A double sided nickel pre-plated copper test panel 15 x 20mm
2 was mounted on jet plating equipment containing 1000 mL of the soft gold electroplating
bath of Table 3. The anode was a platinized titanium electrode. The baths had a pH
of 6.2 and the temperature of the bath was 60 °C. Pulse current was applied with a
peak current density of 50 ASD with an ON:OFF time of 1:3 ms. This corresponded to
an average current density of 12.5 ASD. The jet agitation or flow rate was set to
800 L/hour. After the 10 second plating period, the panels were removed from the bath,
rinsed with deionized water and air dried. All of the panels had a bright gold deposit.
[0045] The process was repeated with the gold electroplating bath of Table 2 except the
amount of gold ions was 20 g/L gold. The same jet agitation and plating parameters
described above were used. The gold deposits were strongly matte or burned in appearance.
The test was repeated except the pulse peak current density was 30 ASD with the same
flow rate as above. This corresponded to the average current density of 7.5 ASD. All
of the deposits were matte. The electroplating bath of table 2 did not provide a bright
or even a semi-bright gold deposit at high current density under jet agitation, thus
the gold bath was inferior in performance to the gold plating bath of Table 3.
1. A gold electroplating composition comprising one or more sources of gold ions from
gold-cyanide salts, one or more sources of phosphate ions, one or more sources of
phosphonic acids or salts thereof, sodium potassium tartrate and one or more sources
of antimony (III) ions, the gold electroplating composition is free of free-cyanide.
2. The gold electroplating composition of claim 1, wherein the gold-cyanide salts are
chosen from potassium gold cyanide, sodium gold cyanide, and ammonium gold cyanide.
3. The gold electroplating composition of claim 1, wherein the one or more sources of
phosphate ions are chosen from phosphoric acid, sodium dihydrogenate phosphate and
potassium dihydrogenate phosphate.
4. The gold electroplating composition of claim 1, wherein the one or more phosphonic
acids have a formula:

wherein n is an integer from 2 to 3, M
1 and M
2 may be the same or different and are chosen from hydrogen, ammonium, lower alkyl
amine or an alkali metal cation and Z is a radical equal in valence to n and is a
linear or branched, substituted or unsubstituted (C
1-C
12)alkyl or an N-substituted (C
2-C
3)alkyl wherein the Z radical has a carbon atom linked to a phosphorus atom of formula
(I).
5. The gold electroplating composition of claim 1, wherein the one or more sources of
antimony (III) ions are chosen from potassium antimony tartrate, sodium antimony tartrate,
antimony sulfate and antimony chloride.
6. The gold electroplating composition of claim 1, wherein the gold electroplating composition
is substantially free lead, arsenic, thallium, hydrazine and sulfites.
7. A method of electroplating gold comprising:
a. providing a gold electroplating composition comprising one or more sources of gold
ions from gold-cyanide salts, one or more sources of phosphate ions, one or more sources
of phosphonic acids or salts thereof, sodium potassium tartrate and one or more sources
of antimony (III) ions, the gold electroplating composition is substantially free
of free-cyanide;
b. contacting a substrate with the gold electroplating composition; and
c. electroplating gold on the substrate using direct current or pulse current at a
current density of 0.03 ASD or greater.
8. The method of electroplating gold of claim 7, wherein the current density is from
1 ASD to 50 ASD.
9. The method of electroplating gold of claim 7, wherein the gold-cyanide salts are chosen
from potassium gold cyanide, sodium gold cyanide, and ammonium gold cyanide.
10. The method of electroplating gold of claim 7, wherein the one or more sources of phosphate
ions are chosen from phosphoric acid, sodium dehydrogenate phosphate and potassium
dehydrogenate phosphate.
11. The method of electroplating gold of claim 7, wherein the one or more phosphonic acids
have a formula:

wherein n is an integer from 2 to 3, M
1 and M
2 may be the same or different and are chosen from hydrogen, ammonium, lower alkyl
amine or an alkali metal cation and Z is a radical equal in valence to n and is a
linear or branched, substituted or unsubstituted (C
1-C
12)alkyl or an N-substituted (C
2-C
3)alkyl wherein the Z radical has a carbon atom linked to a phosphorus atom of formula
(I).
12. The method of electroplating gold of claim 7, wherein the one or more sources of antimony
(III) ions are chosen from potassium antimony tartrate, sodium antimony tartrate,
antimony sulfate and antimony chloride.
13. The method of electroplating gold of claim 7, wherein the gold electroplating composition
is substantially free of free-cyanide, lead, arsenic, thallium, hydrazine and sulfites.
14. The method of electroplating gold of claim 7, wherein the substrate is a printed circuit
board, a contact for a connector, switch or decorative article.