[0001] This application claims the priority benefit under 35 U.S.C. § 119 to Japanese Patent
Application No.
JP2014-249824 filed on December 10, 2014, which disclosure is hereby incorporated in its entirety by reference.
BACKGROUND
Field
[0002] The presently disclosed subject matter relates to a biaxial optical deflector, a
radar system using the same and its manufacturing method.
Description of the Related Art
[0003] In an automobile safety system, a laser radar system is provided to detect a distance
and angle between the driver's vehicle and its object or preceding vehicle. As a result,
when the distance between the driver's vehicle and its preceding vehicle is smaller,
the driver's vehicle is automatically decelerated for a time or a distance and, at
worst, the driver's vehicle is stopped.
[0004] Such a laser radar system requires a function for scanning an object or a preceding
vehicle at a wide angular view with a high angular resolution to avoid a dead space.
Particularly, when the driver's vehicle is driving, the laser radar system requires
a high speed scanning operation in addition to the high angular resolution. In order
to provide such a high speed scanning operation and such a high angular resolution,
a movable mirror such as a Galvano mirror or a polygon mirror is usually used; however,
a micro electro mechanical system (MEMS) mirror (optical deflector) has recently been
used.
[0005] On the other hand, in order to irradiate a preceding vehicle at a distance of 100
m ahead of the driver's vehicle with a collimated laser beam, the beam-diameter of
the laser beam needs to be larger than about 2 to 3 mm, so that the size of the MEMS
mirror needs to be larger. However, the larger the size of the MEMS mirror, the lower
the operation speed of the MEMS mirror. Note that since the resonant frequency of
the MEMS mirror for a wider angular scanning is about several hundreds of Hz, it is
impossible to operate the MEMS mirror at a high scanning speed.
[0006] Also, in order to introduce a laser beam reflected from the preceding vehicle via
the MEMS mirror to a photo detector, the optical source, the MEMS mirror and the preceding
vehicle object and the photo detector form a coaxial optical system, to alleviate
the effect of noise caused by external disturbances.
[0007] In view of the foregoing, a prior art laser radar system is constructed by a laser
array light source including multiple laser light sources spaced from each other and
a single MEMS mirror (see:
JP 2010-151958A). In this prior art laser radar system, the laser light sources are sequentially
turned on to realize a high speed scanning operation.
[0008] In the above-described prior art laser radar system, however, when the number of
laser light sources is smaller, the angular view and angular resolution are limited.
On the contrary, when the number of laser light sources is larger, the manufacturing
cost would be increased. Also, it is difficult to continuously scan the irradiation
angle of laser beam over the laser light sources, so that irradiation areas or areas
scanned by the laser light sources are discrete, i.e., not continuous.
SUMMARY
[0009] The presently disclosed subject matter seeks to solve the above-described problems.
[0010] According to the presently disclosed subject matter, in a biaxial optical deflector,
multiple mirror units are arranged in an array. Each of the mirror units includes
one mirror and one mirror driver coupled to the mirror for rocking the mirror.
[0011] Also, a radar system includes: the above-mentioned biaxial optical deflector, wherein
the mirror is defined as multiple mirrors and the mirror driver is defined as multiple
mirror drivers; a control unit, connected to the biaxial optical deflector, for synchronously
controlling the mirror drivers; a single light source, connected to the control unit,
for emitting a first light beam to the biaxial optical deflector, so that the first
light beam is reflected by the biaxial optical deflector to emit from the radar system;
and a photo detector (16), connected to the control unit, for receiving a second light
beam reflected by the biaxial optical deflector that receives the second light beam
outside of the radar system.
[0012] Further, a method for manufacturing a biaxial optical deflector, includes: forming
two-dimensional actuators on a front side of a first wafer; forming mirror support
poles on a rear side of a second wafer; wafer-bonding the rear side of the second
wafer onto a rear side of the first wafer so that the mirror support poles are in
contact with the rear side of the first wafer ; etching the first wafer so that the
two-dimensional actuators are separated from each other and the first wafer is separated
into mirror drivers, after the wafer-bonding; dicing the second wafer so that the
second wafer is separated into individual mirrors, after the etching; and packaging
the mirror drivers and the mirrors each fixed to one of the mirror drivers in a package.
[0013] According to the presently disclosed subject matter, since a biaxial deflector is
constructed by multiple mirror units, each of the mirror units can be operated for
high speed scanning so that areas irradiated by the mirror units can be continuous,
thus realizing a single large mirror.
BRIEF DESCRIPTION OF THE DRAWINGS
[0014] The above and other advantages and features of the presently disclosed subject matter
will be more apparent from the following description of certain embodiments, taken
in conjunction with the accompanying drawings, wherein:
Fig. 1 is a schematic view illustrating an embodiment of the laser radar system according
to the presently disclosed subject matter;
Fig. 2A is a perspective view of the biaxial optical deflector of Fig. 1;
Fig. 2B is a cross-sectional view of one of the mirror units of Fig. 2A;
Fig. 3 is a perspective view of the mirror driver of Fig. 2B;
Figs. 4A and 4B are perspective views for explaining a non-operation state and an
operation state, respectively, of the piezoelectric cantilevers of one piezoelectric
actuator of Fig. 3;
Fig. 5 is a cross-sectional view illustrating a package on which the mirror units
of Figs. 2A and 2B are mounted;
Figs. 6A through 6K are cross-sectional views for explaining a method for processing
a mirror driver wafer for the mirrors of Figs. 2A and 2B;
Figs. 7A, 7B and 7C are cross-sectional views for explaining a method for processing
a mirror wafer for the mirrors of Figs. 2A and 2B;
Figs. 8A, 8B and 8C are cross-sectional a wafer bonding process of the mirror driver
wafer of Fig. 6K and the mirror wafer of Fig. 7C;
Figs. 9A and 9B are cross-sectional views for explaining a chip separation process
of the mirror driver wafer and the mirror wafer of Fig. 8C;
Fig. 10 is a cross-sectional view for explaining a packaging process of the biaxial
optical deflector of Fig. 9B;
Fig. 11 is a perspective view illustrating a modification of the biaxial optical deflector
of Fig. 2A; and
Fig. 12 is a cross-sectional view illustrating a modification of the package of Fig.
5.
DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS
[0015] In Fig. 1, which is a schematic view illustrating an embodiment of the laser radar
system according to the presently disclosed subject matter, a laser radar system 1,
that may be mounted on a driver's vehicle, monitors an object such as a preceding
vehicle 21 in a scanned area 2 to detect a distance and angle between the driver's
vehicle and the preceding vehicle 21. For example, the distance between the driver's
vehicle and the preceding vehicle 21 may be 100 m.
[0016] The laser radar system 1 is constructed by a control unit 10 such as a microcomputer,
a single laser light source 11, a projection lens 12, a biaxial optical deflector
(mirror array) 13, two or more fixed mirrors 14 and 14', a light convergence lens
15 and a photo detector 16.
[0017] The laser light source 11 is driven by a signal S1 from the control unit 10 to emit
an about 2 to 3 mm beam-diameter collimated laser beam L1 which passes through the
projection lens 12 to the biaxial optical deflector 13. Note that the signal S1 of
the control unit 10 is also used for controlling the brightness of the laser light
source 11.
[0018] The laser beam L1 is deflected by the biaxial optical deflector 13, so that the laser
beam L1 is emitted from the laser radar system 1. As a result, the preceding vehicle
21 in the scanned area 2 would be irradiated with the laser beam L1.
[0019] When the preceding vehicle 21 is irradiated with laser beam L1, the preceding vehicle
21 returns a reflected laser beam L2 whose beam-diameter is about 6 mm to the laser
radar system 1.
[0020] In the laser radar system 1, the laser beam L2 is reflected by the biaxial optical
deflector 13, and then, is reflected by the fixed mirrors 14 and 14' to pass through
the light convergence lens 15 to the photo detector 16. Note that the light convergence
lens 15 serves as an iris to increase the power density of the laser beam L2.
[0021] The laser beam L2 is converted by the photo detector 16 into an electrical signal
S2 which is transmitted to the control unit 10.
[0022] The control unit 10 can calculate a distance between the driver's vehicle and the
preceding vehicle 21 in accordance with the difference between the signals S1 and
S2, a speed of the preceding vehicle 21 relative to that of the driver's vehicle,
a magnitude of the preceding vehicle 21 and the like.
[0023] Also, the control unit 10 generates a signal S3 including voltages V
x1a, V
x2a, ··· of Fig. 3 for controlling the biaxial optical deflector 13.
[0024] The control unit 10 is connected to other units such as a liquid crystal display
(LCD) unit, a vehicle speed control unit and the like. For example, when the distance
between the driver's vehicle and the preceding vehicle becomes smaller than a predetermined
value, the vehicle speed control unit deaccelerates the driver's vehicle, while, when
the distance between the driver's vehicle and the preceding vehicle becomes larger
than a predetermined value, the vehicle speed control unit accelerates the driver's
vehicle.
[0025] As explained above, the beam-diameter of the laser beam L1 is about 2 to 3 mm, while
the beam-diameter of laser beam L2 is about 6 mm. In this case, if the biaxial optical
deflector 13 has a size of 6 mm × 6mm, the biaxial optical deflector 13 can sufficiently
deflect both of the laser beam L1 and the laser beam L2.
[0026] The laser radar system 1 constitutes a coaxial optical system where both of the laser
beam L1 and the laser beam L2 are deflected. Therefore, unless external disturbances
LS such as a solar beam passing between the fixed lenses 4 and 4' , such external
disturbances LS would not reach the photo detector 16. As a result, the noise caused
by the external disturbances LS can be reduced to increase the detection sensitivity.
[0027] In Fig. 2A, which is a perspective view of the biaxial optical deflector (mirror
array) 13 of Fig. 1, the biaxial optical deflector 13 is constructed by 36 (= 6 rows
× 6 column) small mirror units (two-dimensional optical deflectors) 13S at a spacing
of about 50
µm arranged in an array.
[0028] Each of the mirror units 13S has a size of 1 mm × 1 mm, and therefore, the biaxial
optical deflector 13 has a size of 6 mm × 6 mm or more. Note that the biaxial optical
deflector 13 actually includes a package 51 (see : Fig. 5).
[0029] Each of the mirror units 13S includes one mirror support plate 313a and one mirror
driver 13b. The mirror drivers 13b are synchronously operated, so that the mirrors
13a synchronously carry out biaxial operations. Thus, the mirrors 13a altogether serve
as one large mirror. As a result, four of the mirror units 13S at the center of the
biaxial optical deflector 13 can deflect the laser beam L1 of Fig. 1 with a 2 mm beam-diameter,
while all of the mirror units 13S can deflect the laser beam L2 of Fig. 1 with a 6
mm beam-diameter.
[0030] In Fig. 2A, since the mirrors 13a are spaced at a distance of 50
µm, the occupation ratio of the mirrors 13a over the biaxial optical deflector 13 is
about 92%. Although the reflectivity at the gap between the mirrors 13a is low, if
the above occupation ratio is larger than 90%, the mirrors 13a can substantially serve
as a single large mirror. However, the larger the above-mentioned occupation ratio,
the more complete the biaxial optical deflector 13. Preferably, the distance between
the mirrors 13a is less than 50
µm, so that the occupation ratio is more than 95%.
[0031] As illustrated in Fig. 2A, all the mirror drivers 13b are commonly controlled by
the control signal S3 from the control unit 10, so that all the mirrors 13a can synchronously
perform the same deflecting operation. However, the mirror drivers 13b can be independently
controlled by separate control signals from the control unit 10. In this case, the
inner-side mirrors 13a can perform small deflecting operations so that the space between
the inner-side mirrors 13a is small while the outer-side mirrors 13a can perform large
deflecting operations so that the space between the outer-side mirrors 13a is large.
Also, the flexing angles of the mirrors 13a can be adjusted by sense signals of angle
sensors (not shown) incorporated into the mirror drivers 13b, to thereby precisely
control the flexing amounts of the mirrors 13a.
[0032] In Fig. 2B, which is a cross-sectional view of one of the mirror units 13S of Fig.
2A, the mirror support plate 313a is constructed by a mirror element 13a-1 including
an Au reflective layer 801 (see: Fig. 8B) formed thereon and a mirror support pole
13a-2 supporting the mirror element 13a-1 at the center thereof. The mirror support
pole 13a-2 is fixed to a mirror support plate 31 of the mirror driver 13b. Therefore,
when the mirror support plate 31 is two-dimensionally rocked as indicated by arrows
X1, the mirror element 13a-1 is also two-dimensionally rocked as indicated by arrows
X2.
[0033] Note that the mirror support plate 31 can be rectangular, circular or elliptical
viewed from the top.
[0034] The mirror driver 13b of Figs. 2A and 2B is explained in more detail next with reference
to Fig. 3. The mirror driver 13b includes a two-dimensional piezoelectric actuator
(32 ∼35) for two dimensionally rocking the mirror support plate 31.
[0035] The mirror driver 13b is further constructed by an inner frame (movable frame) 32
surrounding the mirror support plate 31, a pair of meander-type inner piezoelectric
actuators 33a and 33b fixed between the inner frame 32 and the mirror support plate
31 and serving as cantilevers for rocking the mirror support plate 31 with respect
to an X-axis of the mirror support plate 31, an outer frame (fixed frame) 34 surrounding
the inner frame 32, and a pair of meander-type outer piezoelectric actuators 35a and
35b fixed between the outer frame 34 and the inner frame 32 and serving as cantilevers
for rocking the mirror support plate 31 through the inner frame 32 with respect to
a Y-axis of the mirror support plate 31 perpendicular to the X-axis.
[0036] The inner frame 32 is rectangularly-framed to surround the mirror support plate 31
associated with the inner piezoelectric actuators 33a and 33b.
[0037] The inner piezoelectric actuators 33a and 33b oppose each other with respect to the
mirror support plate 31. The inner piezoelectric actuators 33a and 33b have ends coupled
to the inner circumference of the inner frame 32 and other ends coupled to the mirror
support plate 31, in order to rock the mirror support plate 31 with respect to the
X-axis.
[0038] The inner piezoelectric actuator 33a is constructed by piezoelectric cantilevers
33a-1, 33a-2, 33a-3, 33a-4, 33a-5 and 33a-6 which are serially-coupled from the inner
frame 32 to the mirror support plate 31. Also, each of the piezoelectric cantilevers
33a-1, 33a-2, 33a-3, 33a-4, 33a-5 and 33a-6 are in parallel with the Y-axis of the
mirror support plate 31. Therefore, the piezoelectric cantilevers 33a-1, 33a-2, 33a-3,
33a-4, 33a-5 and 33a-6 are folded at every cantilever or meandering from the inner
frame 32 to the mirror support plate 31, so that the amplitudes of the piezoelectric
cantilevers 33a-1, 33a-2, 33a-3, 33a-4, 33a-5 and 33a-6 can be changed along directions
perpendicular to the X-axis of the mirror support plate 31.
[0039] Similarly, the inner piezoelectric actuator 33b is constructed by piezoelectric cantilevers
33b-1, 33b-2, 33b-3, 33b-4, 33b-5 and 33b-6 which are serially-coupled from the inner
frame 32 to the mirror support plate 31. Also, each of the piezoelectric cantilevers
33b-1, 33b-2, 33b-3, 33b-4, 33b-5 and 33b-6 are in parallel with the Y-axis of the
mirror support plate 31. Therefore, the piezoelectric cantilevers 33b-1, 33b-2, 33b-3,
33b-4, 33b-5 and 33b-6 are folded at every cantilever or meandering from the inner
frame 32 to the mirror support plate 31, so that the amplitudes of the piezoelectric
cantilevers 33b-1, 33b-2, 33b-3, 33b-4, 33b-5 and 33b-6 can be changed along directions
perpendicular to the X-axis of the mirror support plate 31.
[0040] Note that the number of piezoelectric cantilevers in the inner piezoelectric actuator
33a and the number of piezoelectric cantilevers in the inner piezoelectric actuator
33b can be other values such as 2, 4, 8, ···.
[0041] The outer frame 34 is rectangularly-framed to surround the inner frame 32.
[0042] The outer piezoelectric actuators 35a and 35b are coupled between the inner circumference
of the outer frame 34 and the outer circumference of the inner frame 32, in order
to rock the inner frame 32 associated with the mirror support plate 31 with respect
to the outer frame 34, i. e. , to rock the mirror support plate 31 with respect to
the Y-axis.
[0043] The outer piezoelectric actuator 35a is constructed by piezoelectric cantilevers
35a-1, 35a-2, 35a-3 and 35a-4 which are serially-coupled from the inner frame 32 to
the outer frame 34. Also, each of the piezoelectric cantilevers 35a-1, 35a-2, 35a-3
and 35a-4 are in parallel with the X-axis of the mirror support plate 31. Therefore,
the piezoelectric cantilevers 35a-1, 35a-2, 35a-3 and 35a-4 are folded at every cantilever
or meandering from the outer frame 34 to the inner frame 32, so that the amplitudes
of the piezoelectric cantilevers 35a-1, 35a-2, 35a-3 and 35a-4 can be changed along
directions perpendicular to the Y-axis of the mirror support plate 31.
[0044] Similarly, the outer piezoelectric actuator 35b is constructed by piezoelectric cantilevers
35b-1, 35b-2, 35b-3 and 35b-4 which are serially-coupled from the inner frame 32 to
the outer frame 34. Also, each of the piezoelectric cantilevers 35b-1, 35b-2, 35b-3
and 35b-4 are in parallel with the X-axis of the mirror support plate 31. Therefore,
the piezoelectric cantilevers 35b-1, 35b-2, 35b-3 and 35b-4 are folded at every cantilever
or meandering from the outer frame 35 to the inner frame 32, so that the amplitudes
of the piezoelectric cantilevers 35b-1, 35b-2, 35b-3 and 35b-4 can be changed along
directions perpendicular to the Y-axis of the mirror support frame 31.
[0045] Note that the number of piezoelectric cantilevers in the outer piezoelectric actuator
35a and the number of piezoelectric cantilevers in the outer piezoelectric actuator
35b can be other values such as 2, 6, 8, ···.
[0046] Provided on the outer frame 34 are pads P
Ra, P
Y2a, P
X1a, P
X2a, P
Y1a and P
Y2a P
X1a, P
X2b, P
Y1b and P
Y2b which receive the control signal S3. In this case, the control signal S3 includes
voltages V
X1a and V
X2a opposite in phase with each other for the inner piezoelectric actuator 33a, voltages
V
X1b and V
X2b opposite in phase with each other for the inner piezoelectric actuator 33b, voltages
V
Y1a and V
Y2a opposite in phase with each other for the inner piezoelectric actuator 35a, and voltages
V
Y1b and V
Y2b opposite in phase with each other for the inner piezoelectric actuator 35b.
[0047] The pad P
X1a is connected to the upper electrode layers 606 (see: Fig. 6C) of the odd-numbered
piezoelectric cantilevers 33a-1, 33a-3 and 33a-b of the inner piezoelectric actuator
33a, and the pad P
X2a is connected to the upper electrode layers 606(see: Fig. 6C) of the even-numbered
piezoelectric cantilevers 33a-2, 33a-4 and 33a-6 of the inner piezoelectric actuator
3a.
[0048] The pad P
X1b is connected to the upper electrode layers 606 (see: Fig. 6C) of the odd-numbered
piezoelectric cantilevers 33b-1, 33b-3 and 33b-6 of the inner piezoelectric actuator
33b, and the pad P
X2b is connected to the upper electrode layers 606(see: Fig. 6C) of the even-numbered
piezoelectric cantilevers 33b-2, 33b-4 and 33b-6 of the inner piezoelectric actuator
35b.
[0049] The pad P
Y1a is connected to the upper electrode layers 606(see: Fig. 6C) of the odd-numbered
piezoelectric cantilevers 35a-1 and 35a-3 of the outer piezoelectric actuator 35a,
and the pad P
Y2a is connected to the upper electrode layers 606 (see: Fig. 6C) of the even-numbered
piezoelectric cantilevers 35a-2 and 35a-4 of the outer piezoelectric actuator 35a.
[0050] The pad P
Y1b is connected to the upper electrode layers 606(see: Fig. 6C) of the odd-numbered
piezoelectric cantilevers 35b-1 and 35b-3 of the outer piezoelectric actuator 35b,
and the pad P
Y2b is connected to the upper electrode layers 606 (see: Fig. 6C) of the even-numbered
piezoelectric cantilevers 35b-2 and 35b-4 of the outer piezoelectric actuator 35b.
[0051] The meander-type piezoelectric actuator such as 35a operate as follows.
[0052] In the piezoelectric actuator 35a, the piezoelectric cantilevers 35a-1, 35a-2, 35a-3
and 35a-4 are divided into an odd-numbered group of the piezoelectric cantilevers
35a-1 and 35a-3, and an even-numbered group of the piezoelectric cantilevers 35a-2
and 35a-4 alternating with the odd-numbered group of the piezoelectric cantilevers
35a-1 and 35a-3.
[0053] When no drive voltages are applied to the piezoelectric cantilevers 35a-1, 35a-2,
35a-3 and 35a-4, the piezoelectric cantilevers 35a-1, 35a-2, 35a-3 and 35a-4 are as
illustrated in Fig. 4A.
[0054] On the other hand, a drive voltage V
Y1a is applied to the odd-numbered group of the piezoelectric cantilevers 35a-1 and 35a-3
and a drive voltage V
Y2a opposite in phase to the drive voltage V
Y1a is applied to the even-numbered group of the piezoelectric cantilevers 35a-2 and
35a-4. For example, the odd-numbered group of the piezoelectric cantilevers 35a-1
and 35a-3 are flexed in one direction, for example, in a downward direction D, and
the even-numbered group of the piezoelectric cantilevers 35a-2 and 35a-4 are flexed
in the other direction, i. e. , in an upward direction U. Otherwise, the odd-numbered
group of the piezoelectric cantilevers 35a-1 and 35a-3 are flexed in the upward direction
U, and the even-numbered group of the piezoelectric cantilevers 35a-2 and 35a-4 are
flexed in the downward direction D.
[0055] Thus, the mirror support plate 31 is rocked around the Y-axis by the piezoelectric
cantilevers 35a-1, 35a-2, 35a-3 and 35a-4.
[0056] In Fig. 5, which illustrates a package on which the mirror units 13S are mounted,
the front side of the mirror units 13S on which the pads P
x1a, P
X2a, ···, P
Y2b of Fig. 3 are formed are faced down on a package 51 formed by high temperature co-fined
ceramic (HTCC). In this case, Au bumps 52 or ball soldering bumps are provided between
the pads P
x1a, P
X2a, ···, P
Y2b of Fig. 3 and the package 51. Also, recesses (not shown) are perforated in the surface
of the package 51, so that the piezoelectric actuators 33a, 33b, 35a and 35b of Fig.
3 can be surely rocked. The bumps 52 are electrically connected via interconnects
53 within the package 51 to terminals 54 on the rear side thereof. Finally, the package
51 is mounted on a printed circuit board 55 for a laser radar system on which the
control unit 10 and the like are also mounted.
[0057] A method for manufacturing the biaxial optical deflector 13 of Figs. 2A and 2B will
be explained in more detail with reference to Figs. 6A through 6K, 7A through 7D,
and 8A and 8B, 9A and 9B, and 10.
Mirror Driver Wafer Processing
[0058] First, referring to Fig. 6A, a bare monocrystalline silicon wafer (substrate) 601
made of an about 400
µm thick monocrystalline silicon having polished surfaces is prepared. Then, the bare
monocrystalline silicon wafer 601 is oxidized by a thermal oxidation process, so that
about 1
µm thick silicon dioxide layers 602 and 603 are formed on both surfaces of the bare
monocrystalline silicon wafer 601.
[0059] Next, referring to Fig. 6B, a Pt/Ti lower electrode layer 604 consisting of an about
50 nm thick Ti and an about 150 nm thick Pt on Ti is formed by a sputtering process.
Then, an about 3
µm thick titanate zirconate (PZT) layer 605 is deposited on the lower electrode layer
604 by an arc discharge reactive ion plating (ADRIP) process at a temperature of about
500°C to 600°C. Then, an about 150 nm thick Pt upper electrode layer 606 is formed
on the PZT layer 605 by a sputtering process.
[0060] Next, referring to Fig. 6C, the upper electrode layer 606 and the PZT layer 605 are
patterned by a photolithography and etching process. Then, the lower electrode layer
604 and the silicon dioxide layer 603 are patterned by a photolithography and etching
process.
[0061] Next, referring to Fig. 6D, an about 500 nm thick silicon dioxide interlayer 607
is formed on the entire surface by a plasma-enhanced chemical vapor deposition (PCVD)
process.
[0062] Next, referring to Fig. 6E, contact holes CONT are perforated in the silicon dioxide
interlayer 607 by a photolithography and dry etching process. The contact holes CONT
correspond to the piezoelectric actuators 33a, 33b, 35a and 35b, the pads P
x1a, P
X2a, P
Y1a, P
Y2a, P
X1b, P
X2b, P
Y1b and P
Y2b.
[0063] Next, referring to Fig. 6F, wiring layers 608 made of AlCu (1%Cu) are formed by a
photolithography process, a sputtering process, and a lift-off process, or by a sputtering
process and a photolithography/etching process using mixed acid. The wiring layers
608 are electrically connected between the upper electrode layers 606 of the piezoelectric
actuators 33a, 33b, 35a and 35b, and their corresponding piezoelectric actuators 33a,
33b, 35a and 35b.
[0064] Next, referring to Fig. 6G, the silicon dioxide layer 602 is removed by a dry etching
process.
[0065] Next, referring to Fig. 6H, a wax layer 609 is coated on the entire front surface,
and a support wafer 610 is temporarily bonded to the wax layer 609.
[0066] Next, referring to Fig. 6I, a chemical mechanical polishing (CMP) process is performed
upon the entire rear-side surface, so that the silicon substrate 601 becomes about
50
µm thick.
[0067] Next, referring to Fig. 6J, a protection layer 611 made of silicon nitride is deposited
on the entire rear surface by a sputtering process.
[0068] Finally, referring to Fig. 6K, an Au layer 612 deposited on the protection layer
611 by a sputtering process and a photolithography/etching process. The Au layer 612
is used for a wafer bonding process which will be explained later.
Mirror Wafer Processing Step
[0069] First, referring to Fig. 7A, a bare monocrystalline silicon wafer (substrate) 701
made of about 300
µm thick monocrystalline silicon having polished surfaces is prepared. Then, an Au
layer 702 is deposited on the rear surface of the monocrystalline silicon wafer 701
by a PCVD process. Note that an underlayer (not shown) made of TiW is interposed between
the monocrystalline silicon wafer 701 and the Au layer 702, to avoid the formation
of silicide. The Au layer 702 is used for a wafer bonding process which will be later
explained.
[0070] Next, referring to Fig. 7B, a resist pattern 702 for a deep reactive ion etching
(DRIE) process is formed on the Au layer 702.
[0071] Finally, referring to Fig. 7C, the Au layer 702 and the monocrystalline silicon wafer
701 is etched by a DRIE process using the resist pattern 703 as a mask. As a result,
the thickness of the monocrystalline silicon wafer 701 becomes about 200
µm. In this case, the monocrystalline silicon wafer 701 corresponds to the mirror element
13a-1 of Fig. 2B, and its protruded portion corresponds to the mirror support pole
13a-2 of Fig. 2B.
Wafer Bonding Process
[0072] First, while the Au layer 702 of Fig. 7C is aligned with the Au layer 612 of Fig.
6K, the wafer of Fig. 7C is bonded onto the wafer of Fig. 6K by thermally-pressuring
the wafer of Fig. 7C to the wafer of Fig. 6K at a pressure of less than 0.1 atm, at
a temperature of about 300°C and at a weight of 7000 N for about 10 minutes. As a
result, the wafers of Figs. 6K and 7D are bonded by an Au-Au solid diffusion bonding,
thus securing a strong bonding therebetween.
[0073] Note that, the wafers of Figs. 6K and 7D are bonded by an Au-Au solid diffusion bonding
as illustrated in Fig. 8A. However, the wafers of Figs. 6K and 7D can be bonded by
a Cu-Cu solid diffusion bonding. Also, an AuSn eutectic bonding, an adhesive bonding
using epoxy resin, an anode oxidation bonding for bonding silicon and glass, or a
glass frit bonding without lead at a low melting point can be used.
[0074] Next, referring to Fig. 8B, an Au reflective layer 801 is deposited on the front
surface of the monocrystalline silicon wafer 701 by a sputtering process. In this
case, note that an underlayer made of TiW (not shown) is interposed between the monocrystalline
silicon wafer 701 and the Au layer 801, to avoid the formation of silicide.
[0075] Finally, referring to Fig. 8C, the bonded wafers are reversed. Then, the support
wafer 610 is removed by melting the wax layer 609.
Chip Separating Step
[0076] First, referring to Fig. 9A, the bonded wafers are reversed. Then, the monocrystalline
silicon wafer 601 is etched by a DRIE process, so that the mirror support plate 31,
the inner frame 32, the inner piezoelectric actuators 33a and 33b, the outer frame
34, and the outer piezoelectric actuators 35a and 35b are separated from each other.
Simultaneously, the dicing streets (not shown) are etched by the DRIE process, so
that the mirror drivers 13b are separated from each other.
[0077] Finally, referring to Fig. 9B, the wafers are again reversed. Then, the mirror side
of the wafer 701 is laser-diced, so that the mirrors 13a are separated from each other.
Thus, each of the mirror units 13 is completed.
Packaging Step
[0078] Referring to Fig. 10 corresponding to Fig. 5, each of the mirror units 13 is mounted
on a package 51 by Au bumps 52.
[0079] In the above chip separation step, the dicing streets are provided for each of the
mirror drivers 13b; however, the dicing streets can be provided for every 36 (=6 ×6)
mirror drivers 13b. In this case, one mirror driver 13b' can be realized as illustrated
in Figs. 11 and 12.
[0080] According to the above-described embodiment, when the biaxial optical deflector 13
with the mirror units 13S having a size of 0.5 to 1 mm was operated at a high scanning
speed of several kHz to several tens of kHz, the horizontal scanning angle was 60°
to 140° at a resonant frequency operation and 25° to 50° at a non-resonant frequency
operation, and the scanning angle was 40° to 100° at a resonant frequency operation
and 20° to 40° at a non-resonant frequency operation. That is, both of the horizontal
and vertical scanning angles can be increased.
[0081] In the above-described embodiment, each of the mirror drivers 13b is constructed
by a two-dimensional meander-type piezoelectric actuator; however, the mirror drivers
13b can be constructed by other two-dimensional meander-type piezoelectric actuators
such as torsion-bar type piezoelectric actuators. Further, each of the mirror drivers
13b can be electromagnetic type actuators using a Lorentz force between a magnetic
field generated from a permanent magnet and a current flowing through a winding. Since
such a Lorentz force is very large, a vertical scanning angle at a non-resonant low
frequency operation can be increased.
[0082] It will be apparent to those skilled in the art that various modifications and variations
can be made in the presently disclosed subject matter without departing from the spirit
or scope of the presently disclosed subject matter. Thus, it is intended that the
presently disclosed subject matter covers the modifications and variations of the
presently disclosed subject matter provided they come within the scope of the appended
claims and their equivalents. All related or prior art references described above
and in the Background section of the present specification are hereby incorporated
in their entirety by reference.
1. A biaxial optical deflector, comprising:
multiple mirror units (13S) arranged in an array,
each of said mirror units (13S) including one mirror (13a) and one mirror driver (13b)
coupled to said mirror (13a) for rocking said mirror (13a).
2. The biaxial optical deflector as set forth in claim 1, wherein said mirror (13a) comprises
a mirror element (13a-1) and a mirror support pole (13a-2) supporting said mirror
element (13a-1) at a center of said mirror element (13a-1), and
wherein said mirror driver (13b) comprises a mirror support plate (31) to which said
mirror support pole (13a-2) is fixed, and a two-dimensional actuator (32∼35) for two-dimensionally
rocking said mirror support plate (31).
3. The biaxial optical deflector as set forth in claim 2, wherein said mirror support
pole (13a-2) is fixed to said mirror support plate (31) by one of a Au-Au solid diffusion
bonding, a Cu-Cu solid diffusion bonding, an AuSn eutectic bonding, an adhesive bonding,
an anode oxidation bonding and a glass frit bonding.
4. The biaxial optical deflector as set forth in claim 2, wherein said mirror element
(13a-1) is defined as multiple mirror elements (13a-1), an occupation ratio of a total
area of said mirror elements (13a-1) per an area of said mirror units (13S) is larger
than 90%.
5. The biaxial optical deflector as set forth in claim 2, wherein said two-dimensional
deflector (32∼35) comprises meander-type piezoelectric actuators.
6. The biaxial optical deflector as set forth in claim 1, wherein said mirror driver
(13b) is defined as multiple mirror drivers (13b), said mirror drivers (13b) of said
mirror units (13S) are coupled to each other.
7. The biaxial optical deflector as set forth in claim 1, wherein said mirror (13a) is
defined as multiple mirrors (13a) and said mirror driver (13b) is defined as multiple
mirror drivers, and
wherein said mirror drivers (13b) are synchronously operated, so that said mirrors
(13a) serve as a single mirror.
8. A radar system comprising:
said biaxial optical deflector (13) as set forth in claim 1, wherein said mirror (13a)
is defined as multiple mirrors (13a) and said mirror driver (13b) is defined as multiple
mirror drivers (13b);
a control unit (10), connected to said biaxial optical deflector, for synchronously
controlling said mirror drivers (13b);
a single light source (11), connected to said control unit (10), for emitting a first
light beam (L1) to said biaxial optical deflector (13), so that said first light beam
(L1) is reflected by said biaxial optical deflector (13) to emit from said radar system
(1); and
a photo detector (16), connected to said control unit (10), for receiving a second
light beam (L2) reflected by said biaxial optical deflector (13) that receives said
second light beam (L2) outside of said radar system (1).
9. The radar system as set forth in claim 8, further comprising:
fixed lenses (14, 14') for reflecting said second light beam (L2) from said biaxial
optical deflector (13); and
a light convergence lens (15) for receiving said second light beam (L2) from said
fixed lenses (14, 14') to transmit said second light beam (L2) to said photo detector
(16).
10. A method for manufacturing a biaxial optical deflector, comprising:
forming two-dimensional actuators (604∼606) on a front side of a first wafer (601);
forming mirror support poles (13a-2) on a rear side of a second wafer (701);
wafer-bonding the rear side of said second wafer (701) onto a rear side of said first
wafer (601) so that said mirror support poles (13a-2) are in contact with the rear
side of said first wafer (601);
etching said first wafer (601) so that said two-dimensional actuators (604∼606) are
separated from each other and said first wafer (601) is separated into mirror drivers
(13b), after said wafer-bonding;
dicing said second wafer (701) so that said second wafer (701) is separated into mirrors
(13a) on a basis of one mirror, after said etching; and
packaging said mirror drivers (13b) and said mirrors (13a) each fixed to one of said
mirror drivers (13b) in a package (51).
11. The method as set forth in claim 10, further comprising:
forming a wax layer (609) on said two-dimensional actuators (604∼606), before said
wafer-bonding;
bonding a support wafer (610) on said wax layer (609), before said wafer-bonding;
and
removing said support wafer (610) and said wax layer (609), after said wafer-bonding.
12. The method as set forth in claim 10, wherein said dicing comprising dicing said second
wafer (701) so that said second wafer (701) is separated into said mirrors on a basis
of one mirror.
13. The method as set forth in claim 10, wherein said dicing comprising dicing said second
wafer (701) so that said second wafer (701) is separated into said mirrors on a basis
of one array of mirrors.