(19)
(11) EP 3 074 738 A1

(12)

(43) Date of publication:
05.10.2016 Bulletin 2016/40

(21) Application number: 14810019.1

(22) Date of filing: 28.11.2014
(51) International Patent Classification (IPC): 
G01J 3/18(2006.01)
G01J 3/02(2006.01)
(86) International application number:
PCT/NL2014/050807
(87) International publication number:
WO 2015/080579 (04.06.2015 Gazette 2015/22)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA ME

(30) Priority: 29.11.2013 NL 2011868

(71) Applicant: Technische Universiteit Delft
2628 CN Delft (NL)

(72) Inventors:
  • ELSHINAWY, Mostafa
    NL-2600 AA Delft (NL)
  • HEIRMAN, Stefaan Gustaaf Mariette
    NL-2600 AA Delft (NL)
  • MELSKENS, Jimmy
    NL-2600 AA Delft (NL)
  • FISCHER, Marinus
    NL-2600 AA Delft (NL)

(74) Representative: Van Breda, Jacobus 
Octrooibureau Los & Stigter B.V., Weteringschans 96
1017 XS Amsterdam
1017 XS Amsterdam (NL)

   


(54) A SYSTEM FOR MEASURING AN OPTICAL SPECTRAL RESPONSE AND/OR IV DATA OF A PHOTOELECTRIC DEVICE UNDER TEST