(19)
(11) EP 3 168 856 A3

(12) EUROPEAN PATENT APPLICATION

(88) Date of publication A3:
23.08.2017 Bulletin 2017/34

(43) Date of publication A2:
17.05.2017 Bulletin 2017/20

(21) Application number: 16200793.4

(22) Date of filing: 19.09.2014
(51) International Patent Classification (IPC): 
H01J 35/08(2006.01)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

(30) Priority: 19.09.2013 US 201361880151 P
22.10.2013 US 201361894073 P
24.01.2014 US 201461931519 P
06.06.2014 US 201462008856 P
21.08.2014 US 201414465816

(62) Application number of the earlier application in accordance with Art. 76 EPC:
14868433.5 / 3047501

(71) Applicant: Sigray Inc.
Concord, CA 94520 (US)

(72) Inventors:
  • YUN, Wenbing
    Walnut Creek, CA 94595 (US)
  • LEWIS, Sylvia Jia Yun
    San Francisco, CA 94103 (US)
  • KIRZ, Janos
    Berkeley, CA 94708 (US)
  • LYON, Alan Francis
    Berkeley, CA 94708 (US)

(74) Representative: Richards, John et al
Ladas & Parry LLP
Temple Chambers 3-7 Temple Avenue London EC4Y 0DA
Temple Chambers 3-7 Temple Avenue London EC4Y 0DA (GB)

   


(54) X-RAY SOURCES USING LINEAR ACCUMULATION


(57) This application discloses a compact source for high brightness x-ray generation. Higher brightness is achieved through electron beam bombardment of multiple regions aligned with each other to achieve a linear accumulation of x-rays. This is achieved by aligning discrete x-ray emitters, or through use of novel x-ray targets comprising a number of microstructures of x-ray generating materials fabricated in close thermal contact with a substrate with high thermal conductivity. This allows heat to be more efficiently drawn out of the x-ray generating material, and allows bombardment of this material with higher electron density and/or higher energy electrons, leading to greater x-ray brightness. The orientation of the microstructures allows the use of an on-axis collection angle, allowing accumulation of x-rays from several microstructures to be aligned, appearing to have a single origin, also known as "zero-angle" x-ray emission.







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