BACKGROUND OF THE DISCLOSURE
[0001] The present disclosure relates generally to the use of transient voltage suppression
(TVS) diodes to protect aircraft power control circuitry and their components from
transient power surges. More specifically, the present disclosure relates to TVS diode-based
protection schemes that facilitate the efficient and cost effective protection of
solid state power controller (SSPC) components from exposure to overvoltage conditions
caused by lightning-induced pulses and other transient events, while also facilitating
the efficient and cost effective incorporation of built-in-test (BIT) circuitry for
TVS diode failure detection.
[0002] Vehicles, such as aircraft, typically include miles of wires and dozens of computers
and other instruments and systems that control everything from the engines to passenger
headsets. One or more power management and distribution (PMD) systems are typically
provided to distribute power from a primary source to various vehicle systems. PMD
systems often include so-called smart power management and distribution functionality
enabled by SSPCs. A typical PMD system may include hundreds or thousands of SSPCs.
[0003] Aircraft computers and electrical systems, including PMD systems and their SSPCs,
must be able to safely withstand overvoltage conditions and other transients that
can result from a lightning strike. Traditionally, aircraft had an aluminum skin that
attenuated the lightning current induced on the wires. Some aircraft now use composite
materials instead of aluminum for weight and strength benefits. However, composite
materials do not provide the same level of attenuation to lightning as aluminum. When
lightning occurs, hundreds of volts may surge between a load in the vehicle system
and the aircraft chassis. As such, the lightning requirements of PMD systems and their
SSPCs have increased.
[0004] SSPCs generally use microprocessors to manage the operation of high-efficiency switching
MOSFETs, which perform on/off control of the load and protect loads from short circuit
and overload conditions. When these MOSFETs are subjected to lightning-induced power
surges and other transients that are higher than the MOSFET voltage ratings and they
are OFF, the MOSFETs break down and conduct, which typically results in the MOSFET
being damaged or destroyed.
[0005] It is known to use TVS diodes to protect the MOSFET switches of an SSPC from lightning-induced
power surges and other transients. TVS diodes provide protection to MOSFETs by shunting
excess current when the lightning-induced voltage exceeds the diode avalanche breakdown
potential. TVS diodes are, in effect, clamping devices that suppress all voltages
above their breakdown voltages, and they automatically reset when the overvoltage
goes away. A TVS diode may be either unidirectional or bidirectional. A unidirectional
TVS diode operates as a rectifier in the forward direction like any other avalanche
diode but is made and tested to handle very large peak currents.
[0006] Known TVS diode-based protection schemes for SSPC MOSFET switches require an individual
TVS diode for every SSPC output channel. As the complexity of SSPCs for aircraft applications
increases, a single SSPC card can include 40 or more output channels, which, following
known transient protection schemes, would require 40 individual TVS diodes per SSPC
card. Additionally, although TVS diodes have sufficient functionality to provide the
necessary transient protection, known TVS designs exhibit dormant failures. Existing
SSPCs that utilize TVS diode-based protection transient protection schemes do not
have a way of testing the full functionality of its protection circuitry without removing
the module containing the protection circuitry from the aircraft itself. As a result,
the functionality of the protection circuitry is determined during maintenance and
assumed to be maintained until the next maintenance. Verification is then performed
at the next maintenance when the module is removed from the aircraft. Hidden or dormant
TVS diode failures are not immediately evident to operations and maintenance personnel
as soon as they occur, so the detection of such dormant failures require a specific
action (e.g., a periodic application of BIT circuitry) in order for the dormant failure
to be identified. Providing the necessary BIT circuitry to test 40 or more TVS diodes
per SSPC card for dormant failures is complicated and typically cost prohibited.
[0007] It is therefore desirable to provide a TVS diode-based protection schemes that facilitates
the simple, efficient and cost effective protection of SSPC power channels and components
from exposure to overvoltage conditions caused by lightning-induced pulses and other
transient events, while also facilitating the efficient and cost effective incorporation
of BIT circuitry for identifying dormant TVS diode failures.
BRIEF DESCRIPTION OF THE DISCLOSURE
[0008] Embodiments are directed to a lightning protection circuit configured for use in
a module having a plurality of SSPC power channels. The lightning protection circuit
includes a shared transient voltage suppressor, and a shared protection line communicatively
coupled to the shared transient voltage suppressor. The shared protection line is
configured to be communicatively coupled to and shared by the plurality of power channels.
When the shared protection line is communicatively coupled to and shared by the plurality
of power channels, energy above a threshold on any one of the plurality of power channels
is dissipated through the shared protection line and the shared transient voltage
suppressor.
[0009] Embodiments are further directed to a transient protection circuit configured for
use a SSPC having a feed line communicatively coupled to a plurality of power channels.
The transient protection circuit includes a shared transient voltage suppressor, a
transient voltage suppression (TVS) diode in series with a non-TVS diode, and a shared
protection line communicatively coupled to the shared transient voltage suppressor.
The shared protection line is configured to be communicatively coupled to and shared
by the plurality of power channels, and the non-TVS diode is configured to be communicatively
coupled to the feed line. When the shared protection line is communicatively coupled
to and shared by the plurality of power channels, energy above a threshold on any
one of the plurality of power channels is dissipated through the shared protection
line and the shared transient voltage suppressor. Additionally, at least a portion
of energy above another threshold on the feed line passes through the non-TVS diode
and is dissipated through the TVS diode.
[0010] Embodiments are further directed to a method of forming a lightning protection circuit
configured for use in a module having a plurality of SSPC power channels. The method
includes forming a shared transient voltage suppressor, forming a shared protection
line communicatively coupled to the shared transient voltage suppressor, and configuring
the shared protection line to be communicatively coupled to and shared by the plurality
of power channels. When the shared protection line is communicatively coupled to and
shared by the plurality of power channels, energy above a threshold on any one of
the plurality of power channels is dissipated through the shared protection line and
the shared transient voltage suppressor.
[0011] Additional features and advantages are realized through the techniques of the present
disclosure. Other embodiments and aspects of the disclosure are described in detail
herein. For a better understanding of the disclosure with the advantages and the features,
refer to the description and to the drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
[0012] The subject matter of the present disclosure is particularly pointed out and distinctly
claimed in the claims at the conclusion of the specification. The foregoing and other
features, and advantages of the present disclosure are apparent from the following
detailed description taken in conjunction with the accompanying drawings in which:
FIG. 1 depicts a known TVS diode-based protection scheme;
FIG. 2 depicts a known non-TVS diode-based protection scheme; and
FIG. 3 depicts a shared transient voltage suppressor and BIT circuit configuration
according to one or more embodiments.
[0013] In the accompanying figures and following detailed description of the disclosed embodiments,
the various elements illustrated in the figures are provided with three or four digit
reference numbers. The leftmost digit(s) of each reference number corresponds to the
figure in which its element is first illustrated.
DETAILED DESCRIPTION OF THE DISCLOSURE
[0014] Turning now to an overview of the present disclosure, PMD systems generally include
modules that each includes multiple SSPC power channels. Each power channel has an
input feed line, an output load and a power MOSFET that selectively couples the feed
voltage to the output load when turned on. When the power MOSFET switch of a given
channel is subjected to a voltage transient (e.g., a lightning induced transient)
that is higher than the MOSFET voltage rating limit and it is OFF, the MOSFET will
break down and conduct and usually be damaged or destroyed. Existing transient protection/suppression
systems, examples of which are shown in FIGS. 1 and 2, provide transient protection.
However, as the number of channels provided on an SSPC card continues to increase
(e.g., up to about 40 SSPC channels per SSPC card), the complexity, cost and card
area required to implement existing transient protection schemes continue to increase
as well.
[0015] In one or more embodiments of the present disclosure, instead of providing individual
TVS diodes for each power channel, a shared transient voltage suppressor is provided
in communication with a shared protection line coupled to each individual power channel.
Transient energy above a threshold (e.g., above the MOSFET voltage rating limit) on
any one of the multiple SSPC power channels is dissipated through the shared transient
voltage suppressor. In one or more embodiments, the shared transient voltage suppressor
includes a single TVS diode. In one or more embodiments, the shared transient voltage
suppressor includes a plurality of simple diodes and a single TVS diode. In one or
more embodiments, the shared transient voltage suppressor includes a TVS diode circuit
having multiple TVS diodes, wherein the number of TVS diodes is less than the number
of power channels. In any of the disclosed shared transient voltage suppressors, the
reliance on TVS diodes, which provide the necessary voltage suppression functionality
but exhibit dormant failures, is reduced by sharing either one or a few (i.e., less
than the number of power channels) TVS diodes among a plurality of power channels.
[0016] Because the present disclosure significantly reduces the number of TVS diodes that
are required to provide protection from lightning-induced and other transients, the
present disclosure makes it efficient and cost effective to provide a BIT circuit
to test the disclosed shared transient voltage suppressor for dormant failures. The
BIT circuit applies a pulsed BIT signal to the shared transient voltage suppressor
and measures the resulting voltage across the shared transient voltage suppressor.
The BIT signal applied to the shared transient voltage suppressor is a voltage (positive
or negative) to verify that the shared transient voltage suppressor is clamping at
a proper value. Because of the significant reduction in the number of TVS diodes that
are required to provide protection from lightning-induced and other transients, the
added cost/area of providing a BIT circuit is relatively small. Additionally, for
embodiments wherein the shared transient voltage suppressor is augmented by or supplemented
with simple diodes (e.g., one simple diode per channel), the simple diodes prevent
BIT circuit test pulses applied to the shared protection line from affecting the normal
operating outputs of the channels.
[0017] Lightning-induced transients may occur as a positive or negative pulse on the feed
line side of a channel or as a positive or negative pulse on the load side of a channel.
Accordingly, a BIT circuit of the present disclosure may be provided on the feed line
side of a channel or on the load side of a channel, or on both the feed side and load
side of a channel. When provided on the load line side of a channel, the BIT circuit
tests with a negative voltage on the load line side shared protection line. When provided
on the feed line side of a channel, the BIT circuit tests with a positive voltage
at the cathode of the shared transient voltage suppressor. Additionally, because the
actual transients on the feed line or the load line can vary, the disclosed transient
suppression schemes may or may not include the same voltage threshold for the TVS
diodes on the feed side and the load side.
[0018] Turning now to a more detailed description of the drawings, FIG. 1 depicts a known
TVS diode-based protection scheme, and FIG. 2 depicts a known non-TVS diode-based
protection scheme. In either FIG. 1 or FIG. 2, the protection scheme includes multiple
power channels, only two of which are shown for ease of illustration. Each power channel
is coupled to a FEED BUS LINE and a Load Line and includes a MOSFET switch, a MOSFET
body diode, a LOAD, a ON/OFF MOSFET control line coupled at one end through a resistor
to the MOSFET gate and coupled at its other end to a gate drive (not shown). Each
channel further includes an output line (i.e., the Load Line) having thereon either
a TVS diode (FIG. 1) or a simple diode (FIG. 2).
[0019] As shown in FIG. 1, in the normal operation of the MOSFET switches, the FEED BUS
LINE feeds power into Channel-A through the MOSFET switch and the Load Line into LOAD-A.
A lightning-induced pulse or other transient on either the FEED BUS LINE or through
the Load Line of Channel-A forces a positive or negative voltage on the FEED BUS LINE
or a positive or negative voltage on the Load Line. In either case, large currents
attempt to flow through the MOSFET switch. If for example a positive transient is
on the Load Line of Channel-A in FIG. 1, the transient will conduct through the MOSFET
body diode until the TVS diode reaches its breakdown voltage at which point it conducts
the excess to Chassis Ground (Chassisgnd), which in effect shunts the high levels
of transient current away from the MOSFET. The TVS diode shunts transient current
by providing a low resistance path for current to pass through the TVS diode. This
also limits the voltage increase at the FEED BUS LINE for cases wherein the FEED BUS
LINE has high source impedance.
[0020] The anode of the TVS diode shown in FIG. 1 is tied to Chassisgnd, and the cathode
of the TVS diode is tied to the Load Line. Accordingly, the Load Line has to reach
the breakdown voltage of the TVS diode in order for the TVS diode to conduct. Thus,
from the Load Line side of the TVS diode, the voltage rating of the TVS diode for
a typical aircraft application would be approximately 48V. For negative load transients,
the TVS diode in FIG. 1 functions as a simple diode and the voltage drop across the
TVS diode would be approximately 1 V.
[0021] A drawback to the approach in FIG. 1 is that because the negative transient is clamped
to a small value such as 1V, inductive loads take much longer to de-energize when
the SSPC MOSFET turns off. For relay or contactor coil loads, this longer time allows
more contact arcing, which adversely impacts the relay or contactor reliability. For
this reason the unidirectional TVS device configuration shown in FIG. 1 is not preferred.
Accordingly, some applications chose to use bidirectional TVS devices sized at a voltage
rating with margin below the rating of the MOSFET devices.
[0022] In FIG. 2, the TVS diode is replaced with a Simple Diode. The Simple Diode blocks
the transient current in one direction but does not provide that breakdown voltage
protection that is provided by the TVS diode shown in FIG. 1. Accordingly, the Simple
Diode typically has a relatively large voltage rating. For example, in a typical aircraft
application, the Simple Diode of FIG. 2 would be approximately 600V. Although simple,
the drawback to the approach in FIG. 2 is that because the negative transient is clamped
to a small value such as 1V, inductive loads take much longer to de-energize when
the SSPC MOSFET turns off. For relay or contactor coil loads, this longer time allows
more contact arcing, which adversely impacts the relay or contactor reliability. Accordingly,
simple diodes on SSPC outputs as shown in FIG. 2 are not preferred.
[0023] Turning now to a more detailed description of the present disclosure, FIG. 3 depicts
selected portions of a SSPC module 300 having a shared protection line 358, a shared
transient voltage suppressor 360 and a BIT circuit 362 according to one or more embodiments.
In terms of its overall functionality, module 300 may be part of a PMD system utilized
to control power management and distribution on a vehicle, such as an aircraft (not
shown). Under some conditions, such as a lightning strike, a transient current may
surge through the vehicle. The transient current may be, for example, an induced current,
other known type of transient current, or a transient current from another source
besides lightning. In the disclosed example, shared protection line 358, shared transient
voltage suppressor 360 and BIT circuit 362 of SSPC 300 provide lightning protection
to reduce the risk that module 300, and particularly the channel MOSFETS, becomes
damaged from the transient current. As will be appreciated from the illustration and
the following description, in accordance with one or more disclosed embodiments, shared
protection line 358, shared transient voltage suppressor 360 and BIT circuit 362 of
module 300 facilitate the simple, efficient and cost effective protection of SSPC
power channels and components thereof (e.g., the channel MOSFETs) from exposure to
overvoltage conditions caused by lightning-induced pulses and other transient events
that exceed a threshold (e.g., the voltage rating limit of the channel MOSFET), while
also facilitating the efficient and cost effective incorporation of BIT circuit 362
for identifying dormant TVS diode failure points.
[0024] Module 300 couples multiple power channels to multiple loads. For ease of illustration,
only two power channels, Channel-A and Channel-B, and two loads, Load-A and Load-B,
are shown. In the present disclosure, a description of the operation of one channel
applies equally to all channels. Channel-A transmits power down Feed Bus Line-A, through
the channel-A MOSFET to Load-A. Lightning strikes can result in transients through
Channel-A that exceed the operating range of the channel-A MOSFET.
[0025] Lightning-induced and other transients may occur as a positive or negative pulse
on the feed line side of Channel-A, or as a positive or negative pulse on the load
side of Channel-A. For the embodiment shown in FIG. 3, shared protection line 358,
shared transient voltage suppressor 360 and BIT circuit 362 are provided on the load
side of Channel-A. Additionally, a TVS diode 322, a simple diode 320 and a BIT circuit
324 are also provided between the FEED BUS LINE and Chassisgnd. BIT circuit 362 tests
with a negative voltage across shared transient voltage suppressor 360. BIT circuit
324 tests with a positive voltage on TVS diode 322.
[0026] Channel-A couples power on the FEED BUS LINE through a channel-A MOSFET having an
intrinsic body diode 310 and an ON/OFF MOSFET control line coupled at one end through
a resistor 302 to the channel-A MOSFET and coupled at its other end to a functional
gate driver (not shown). From the channel-A MOSFET, power is coupled through the Load
Line to LOAD-A. A simple diode 306 is coupled between the Load Line and shared protection
line 358, which is coupled to and shared by all channels of module 300. Shared TVS
diode 360 is coupled between shared protection line 358 and Chassisgnd. Shared TVS
diode 360 increases the clamping voltage and addresses the reliability concern with
simple diode clamping (provided by simple diode 306) when interfacing to inductive
loads such as relays and contactors. Through its coupling to shared protection line
358, shared TVS diode 360 is coupled to and shared by all channels of module 300.
[0027] As shown in FIG. 3, shared protection line 358 sits between simple diode 306 and
shared TVS diode 360. Shared protection line 358A is a "protected line" in that it
can never go more than the value of the voltage across shared TVS diode 360 below
Chassisgnd. Because simple diode 306 is connected between shared protection line 358A
and LOAD-A, when a negative transient is present on the Load Line and the channel-A
MOSFET is off, simple diode 306 conducts and applies the negative transient voltage
to shared protection line 358. When shared protection line 358 reaches the breakdown
voltage of shared TVS diode 360, TVS diode 360 starts to conduct and carries current
through shared TVS diode 360 over shared protection line 358 through simple diode
306 and out to LOAD-A, thereby clamping the negative overvoltage. Accordingly, for
a negative lightning-induced transient pulse, the channel-A MOSFET stays off and all
of the transient energy is dissipated by shared protection line 358, simple diode
306 and shared TVS diode 360.
[0028] When a positive transient is present on the Load Line and the channel-A MOSFET is
off, the positive transient current goes through body diode 310 of the channel-A MOSFET
and goes out through the FEED BUS LINE. Body diode 310 of the channel-A MOSFET is
the intrinsic body diode of the channel-A MOSFET based on the structure of the channel-A
MOSFET.
[0029] BIT circuit 362 is coupled through shared protection line 358 to shared TVS diode
360. To ensure that shared TVS diode 360 does not have a dormant "stuck at" fault,
BIT circuit 362 stimulates shared TVS diode 360 to a known value momentarily, and
then monitors shared TVS diode 360 for the correct response to the stimulus.
[0030] FIG. 3 also depicts feed-side TVS diode 322 in series with simple diode 320 between
the FEED BUS LINE and Chassisgnd. Positive transients on the FEED BUS LINE are shunted
through simple diode 320 and TVS diode 322. When a negative transient is present on
the FEED BUS LINE, the negative transient current goes through the channel-A MOSFET
body diode 310 and out through the Load Line.
[0031] BIT circuit 324 is coupled between simple diode 320 and TVS diode 322. To ensure
that TVS diode 322 does not have a dormant "stuck at" fault, BIT circuit 324 stimulates
TVS diode 322 to a known value momentarily, and then monitors TVS diode 322 for the
correct response to the stimulus.
[0032] While the present disclosure has been described in detail in connection with only
a limited number of embodiments, it should be readily understood that the present
disclosure is not limited to such disclosed embodiments. Rather, the present disclosure
can be modified to incorporate any number of variations, alterations, substitutions
or equivalent arrangements not heretofore described, but which are commensurate with
the spirit and scope of the present disclosure.
[0033] Additionally, while various embodiments of the present disclosure have been described,
it is to be understood that aspects of the present disclosure may include only some
of the described embodiments. Accordingly, the present disclosure is not to be seen
as limited by the foregoing description, but is only limited by the scope of the appended
claims.
[0034] The term "about" is intended to include the degree of error associated with measurement
of the particular quantity based upon the equipment available at the time of filing
the application. For example, "about" can include a range of ± 8% or 5%, or 2% of
a given value.
[0035] The terminology used herein is for the purpose of describing particular embodiments
only and is not intended to be limiting of the disclosure. As used herein, the singular
forms "a", "an" and "the" are intended to include the plural forms as well, unless
the context clearly indicates otherwise. It will be further understood that the terms
"comprises" and/or "comprising," when used in this specification, specify the presence
of stated features, integers, steps, operations, elements, and/or components, but
do not preclude the presence or addition of one or more other features, integers,
steps, operations, element components, and/or groups thereof.
[0036] While the disclosure is provided in detail in connection with only a limited number
of embodiments, it should be readily understood that the disclosure is not limited
to such disclosed embodiments. Rather, the disclosure can be modified to incorporate
any number of variations, alterations, substitutions or equivalent arrangements not
heretofore described, but which are commensurate with the scope of the disclosure.
Additionally, while various embodiments of the disclosure have been described, it
is to be understood that the exemplary embodiment(s) may include only some of the
described exemplary aspects. Accordingly, the disclosure is not to be seen as limited
by the foregoing description, but is only limited by the scope of the appended claims.
1. A transient protection circuit configured for use in a solid state power controller
(SSPC) comprising a plurality of power channels, the transient protection circuit
comprising:
a shared transient voltage suppressor (360); and
a shared protection line (358) communicatively coupled to the shared transient voltage
suppressor;
wherein the shared protection line is configured to be communicatively coupled to
and shared by the plurality of power channels;
wherein, when the shared protection line is communicatively coupled to and shared
by the plurality of power channels, energy above a threshold on any one of the plurality
of power channels is dissipated through the shared protection line and the shared
transient voltage suppressor.
2. The circuit of claim 1 further comprising:
a built-in-test (BIT) circuit (362) communicatively coupled to the shared protection
line and configured to test the shared transient voltage suppressor to detect a dormant
failure of the shared transient voltage suppressor.
3. The circuit of claim 1 or 2 further comprising:
a plurality of channel diodes (320, 322) communicatively coupled to the shared protection
line;
wherein, when the shared protection line is communicatively coupled to and shared
by the plurality of power channels, at least a portion of the energy above the threshold
on any one of the plurality of power channels also passes through at least one of
the plurality of the channel diodes.
4. The circuit of claim 1, 2 or 3, wherein the energy above the threshold is induced
by a lightning strike
5. The circuit of any preceding claim, wherein:
the shared transient voltage suppressor comprises a shared transient voltage suppression
(TVS) diode (322).
6. The circuit of claim 5, wherein the transient protection circuit further comprises:
a built-in-test (BIT) circuit communicatively coupled to the shared protection line
and configured to test the shared TVS diode to detect a dormant failure of the shared
TVS diode.
7. The circuit of claim 1, wherein:
the shared transient voltage suppressor comprises a shared transient voltage suppression
(TVS) diode circuit having a predetermined number of shared TVS diodes; and
the predetermined number of shared TVS diodes is less than the plurality of power
channels.
8. The circuit of claim 7 further comprising:
a built-in-test (BIT) circuit communicatively coupled to the shared protection line
and configured to test the shared TVS diode circuit to detect a dormant failure of
the shared TVS diode circuit.
9. A transient protection circuit configured for use in a solid state power controller
(SSPC) comprising a feed line communicatively coupled to a plurality of power channels,
the transient protection circuit comprising:
a shared transient voltage suppressor;
a transient voltage suppression (TVS) diode in series with a non-TVS diode; and
a shared protection line communicatively coupled to the shared transient voltage suppressor;
the shared protection line configured to be communicatively coupled to and shared
by the plurality of power channels;
the non-TVS diode configured to be communicatively coupled to the feed line;
wherein, when the shared protection line is communicatively coupled to and shared
by the plurality of power channels, energy above a threshold on any one of the plurality
of power channels is dissipated through the shared protection line and the shared
transient voltage suppressor;
wherein at least a portion of energy above another threshold on the feed line passes
through the non-TVS diode and is dissipated through the TVS diode.
10. The circuit of claim 9 further comprising:
a first built-in-test (BIT) circuit communicatively coupled to the shared protection
line and configured to test the shared transient voltage suppressor to detect a dormant
failure of the shared transient voltage suppressor; and
a second BIT circuit communicatively coupled to the TVS diode and configured to test
the TVS diode to detect a dormant failure of the TVS diode.