ATBECHDEDKESFRGBGRITLILUNLSEMCPTIESILTLVFIROMKCYALTRBGCZEEHUPLSK..HRIS..MTNORS..SM..................*JBDM Ver 2.0.14 (4th of August) - 2999001/03298390CORRECTED EUROPEAN PATENT SPECIFICATIONB8B120220216W173deBibliographieenBibliographyfrBibliographieEP16890862.2201604282017113020191129enenen20151470369220150504US20151487952220151009US2022021620220720180328201813202107072021272021021620211007NO20210707AT20210707LT20220216202207G01N 21/64 20060101AFI20190103BHEP G01N 21/95 20060101ALI20190103BHEP G06T 7/00 20170101ALI20190103BHEP H04N 5/374 20110101ALI20190103BHEP H04N 5/367 20110101ALI20190103BHEP G01N2021/646 20130101 LA20161214BHEP G01N 21/6456 20130101 LI20181220BHEP G01N 21/9505 20130101 LI20181220BHEP G01N 21/6489 20130101 FI20161110BHEP G01N 21/9501 20130101 LI20161110BHEP deMIKROPHOTOLUMINESZENZBILDGEBUNG MIT OPTISCHER FILTRIERUNGenMICRO PHOTOLUMINESCENCE IMAGING WITH OPTICAL FILTERINGfrIMAGERIE PAR MICROPHOTOLUMINESCENCE AVEC FILTRAGE OPTIQUEEP-A1- 2 124 037EP-A1- 2 562 000EP-A1- 2 587 547EP-A1- 2 650 674WO-A1-2010/058680WO-A1-2011/017772WO-A1-2011/079353WO-A1-2014/020046DE-A1-102010 029 133DE-A1-102012 010 406KR-A- 20150 043 346US-A1- 2007 000 434US-A1- 2007 008 518US-A1- 2010 220 186US-A1- 2011 025 839US-A1- 2011 292 376US-A1- 2012 111 396US-A1- 2012 262 566US-A1- 2013 027 543US-A1- 2013 062 536US-A1- 2013 129 189US-A1- 2013 169 283US-A1- 2014 224 965US-A1- 2015 008 952US-B1- 7 446 868US-B1- 8 023 110STEVE JOHNSTON ET AL: "Temperature-dependent Photoluminescence imaging and characterization of a multi-crystalline silicon solar cell defect area", PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2011 37TH IEEE, IEEE, 19 June 2011 (2011-06-19), pages 69-74, XP032167592, DOI: 10.1109/PVSC.2011.6185848 ISBN: 978-1-4244-9966-3STEVE JOHNSTON ET AL: "Imaging study of multi-crystalline silicon wafers throughout the manufacturing process", PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2011 37TH IEEE, IEEE, 19 June 2011 (2011-06-19), pages 2885-2890, XP032168292, DOI: 10.1109/PVSC.2011.6186549 ISBN: 978-1-4244-9966-3JOHNSTON STEVE ET AL: "Correlating Multicrystalline Silicon Defect Types Using Photoluminescence, Defect-band Emission, and Lock-in Thermography Imaging Techniques", IEEE JOURNAL OF PHOTOVOLTAICS, I E E E, US, vol. 4, no. 1, 1 January 2014 (2014-01-01) , pages 348-354, XP011534384, ISSN: 2156-3381, DOI: 10.1109/JPHOTOV.2013.2283575 [retrieved on 2013-12-16]STEVE JOHNSTON ET AL: "Comparison of photoluminescence imaging on starting multi-crystalline silicon wafers to finished cell performance", PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2012 38TH IEEE, IEEE, 3 June 2012 (2012-06-03), pages 2161-2166, XP032258243, DOI: 10.1109/PVSC.2012.6318025 ISBN: 978-1-4673-0064-3FEI YAN ET AL: "Defect-bandemission photoluminescence imagingonmulti-crystallinesisolar cells", PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2011 37TH IEEE, IEEE, 19 June 2011 (2011-06-19), pages 2231-2235, XP032168144, DOI: 10.1109/PVSC.2011.6186400 ISBN: 978-1-4244-9966-3TRUPKE T ET AL: "Progress with luminescence imaging for the characterisation of silicon wafers and solar cells", PROCEEDINGS OF THE EUROPEAN PHOTOVOLTAIC SOLAR ENERGY CONFERENCE, XX, XX, no. 22TH, 3 September 2007 (2007-09-03), pages 22-31, XP002675848,Jan Linnros ET AL: "CARRIER LIFETIME: FREE CARRIER ABSORPTION, PHOTOCONDUCTIVITY, AND PHOTOLUMINESCENCE INTRODUCTION", Characterization of Materials, 15 October 2002 (2002-10-15), pages 658-692, XP055139470, DOI: 10.1002/0471266965.com037 Retrieved from the Internet: URL:http://onlinelibrary.wiley.com/store/1 0.1002/0471266965.com037.pub2/asset/com037 .pdf?v=1&t=hzwrpklq&s=db630afdcd19017f6f2f f0d0d9e62dd9906bb99d [retrieved on 2014-09-10]2019010921183872.720210706KISS, Zoltan TamasBánk bán u. 9.1115 BudapestHUDUDAS, LaszloRáday Gedeon tér 4/D 1.em/3.a2119 PécelHUKOVACS, ZsoltHajló utca 5. II/ 4.1048 BudapestHULAJTOS, ImreAttila út. 115. 4.a1012 BudapestHUNADUDVARI, GyorgySport ter 2.2084 PilisszentivanHULAURENT, Nicolas2 Kensington Park Drive 03-02 Kensington ParkSingapore 557320SGJASTRZEBSKI, Lubomir L.450 S. Gulfview Boulevard Apt. 1705Clearwater, Florida 33767USSEMILAB Semiconductor Physics Laboratory Co., Ltd.10193074702695-0047EP1Prielle Kornelia u. 2Budapest 1117HUFish & Richardson P.C.101869757Highlight Business Towers Mies-van-der-Rohe-Straße 880807 MünchenDEALATBEBGCHCYCZDEDKEEESFIFRGBGRHRHUIEISITLILTLULVMCMKMTNLNOPLPTRORSSESISKSMTRUS201602982120160428enWO20171425692017082420173420180215000000