IMPROVED POWER SUPPLY TRANSIENT PERFORMANCE (POWER INTEGRITY) FOR A PROBE CARD ASSEMBLY IN AN INTEGRATED CIRCUIT TEST ENVIRONMENT - Patent 3304110

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EP 3 304 110 A1

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(43)	Date of publication:
	11.04.2018 Bulletin 2018/15

(21)	Application number: 16803876.8

(22)	Date of filing: 26.02.2016

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International Patent Classification (IPC):

G01R 31/28^(2006.01)

(86)	International application number:
	PCT/US2016/019865

(87)	International publication number:
	WO 2016/195766 (08.12.2016 Gazette 2016/49)

(84)	Designated Contracting States:
	AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
	Designated Extension States:
	BA ME
	Designated Validation States:
	MA MD

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Priority:

29.05.2015 US 201562168107 P

(71)	Applicant: R&D Circuits Inc.
	South Plainfield, NJ 07080 (US)

(72)	Inventors:
	WARWICK, Thomas, P. Melbourne, FL 32934 (US) RUSSELL, James, V. New Hope, PA 18938 (US) TURPUSEEMA, Dhananjaya Whitehouse Station, NJ 08889 (US)

(74)	Representative: Meissner Bolte Partnerschaft mbB
	Postfach 10 26 05 86016 Augsburg 86016 Augsburg (DE)

(54)	IMPROVED POWER SUPPLY TRANSIENT PERFORMANCE (POWER INTEGRITY) FOR A PROBE CARD ASSEMBLY IN AN INTEGRATED CIRCUIT TEST ENVIRONMENT