TECHNICAL FIELD
[0001] The present invention relates to a radiation image processing method and a radiographic
system, and in particular, to a radiation image processing method and a radiographic
system capable of correcting a blurring due to light scattering occurring in a scintillator
panel of an indirect radiation detector.
BACKGROUND ART
[0002] Medical imaging using a radiation is performed on a subject matter through a Compton
effect that only a portion of energy of a radiation photon is delivered to electrons
or a photoelectric effect that all energy is delivered to electrons and a radiation
is completely absorbed. At this point, typically a radiation having energy of 10 keV
to 200 keV is used.
[0003] Digital radiography devices for obtaining a radiation image are divided into an indirect
type equipment and a direct type equipment. In the indirect type equipment, a radiation
collides with a scintillator of a scintillator panel to generate a visible light ray,
and the visible light ray is transformed to an image signal through a thin film transistor
in which a charge coupled device (CCD) or a photodiode is installed. In addition,
the direct type equipment obtains an image in a manner that a radiation passing through
a subject is directly irradiated on a thin film transistor in which a photoconductor
or a photoresistor is installed, and is transformed to an image signal.
[0004] In such a radiographic system, a radiation radiated from a radiation generating device
is irradiated on a wide area at once in a cone type and causes image distortion due
to radiation scattering. As a method for removing such a scatter radiation, a method
using an anti-scatter grid or an air gap is used.
[0005] The grid method uses a difference between a primary radiation almost perpendicularly
incident to a radiation detector and a scatter radiation incident in a random direction.
This method is to dispose the anti-scatter grid between a subject and a radiation
detector, and to physically cut off the scatter radiation, which is obliquely incident
in a process where a radiation passing through the subject passes through the grid,
from reaching the radiation detector. Here, the anti-scatter grid is composed of lead
and aluminum.
[0006] The method using the air gap is imaging with a space between a subject and a radiation
detector. The scatter radiation is not perpendicularly but obliquely incident to the
detector, and when there is the air gap between the detector and the subject, only
the primary radiation among photons passing through the subject reaches the radiation
detector. On the other hand, the scatter radiation is scattered to the surroundings
and does not reach the radiation detector.
[0007] However, in a case of adopting the indirect radiation detector using the scintillator
panel, although the scatter radiation caused by the subject may be removed using these
methods, scattering by the scintillator inside the radiation detector is not removed.
In addition, when a radiation image is obtained by this radiographic system, a blurring
may occur in the radiation image, thereby lowering the sharpness of the radiation
image.
[Citation List]
[Patent Literature]
DISCLOSURE OF THE INVENTION
TECHNICAL PROBLEM
[0009] The present invention provides a radiation image processing method and a radiographic
system capable of correcting a blurring, which occurs due to scattering occurred in
a scintillator panel of an indirect radiation detector, with deconvolution using a
point spread function (PSF).
TECHNICAL SOLUTION
[0010] According to an embodiment of the present invention, a radiation image processing
method includes: obtaining a radiation image using an indirect radiation detector
including a scintillator panel and a pixel array panel; determining a parameter value
for defining a point spread function (PSF) according to the scintillator panel or
the pixel array panel; and correcting the radiation image by deconvoluting the radiation
image using the PSF to which the parameter value is applied.
[0011] The radiation image processing method may further include removing a fault element
from the radiation image before the correcting the radiation image by deconvoluting
the radiation image.
[0012] The parameter may define a magnitude of the PSF and a shape of the PSF.
[0013] In the determining a parameter value, the parameter value may be determined to allow
a correction image for which the radiation image is deconvoluted using the PSF to
satisfy an image quality reference.
[0014] The image quality may be evaluated by measuring at least any one selected from among
a modulation transfer function (MTF), a detective quantum efficiency (DQE), a normalized
noise power spectrum (NNPS), and a signal to noise ratio (SNR).
[0015] The image quality reference may include a condition that a DQE value of the correction
image is in a range of 90% to 110% of a DQE value of the radiation image in a same
spatial frequency.
[0016] The image quality reference may include a condition that for a spatial frequency
of the correction image, a value of the MTF decreases according to an increase in
spatial frequency, and the MTF value is a highest in the correction image according
to the parameter value.
[0017] The radiation image processing method may further include: classifying and storing
the determined parameter value according to at least any one among a pixel size of
the pixel array panel, a thickness of the scintillator panel, and a type of the scintillator,
wherein in the correcting the radiation image by deconvoluting the radiation image,
the radiation image is corrected by selecting a parameter value from among stored
parameter values according to at least any one among the pixel size of the pixel array
panel, the thickness of the scintillator panel, and the type of the scintillator,
which are used for obtaining the radiation image.
[0018] In the correcting the radiation image by deconvoluting the radiation image, the radiation
image may be corrected by iterating the deconvolution using the PSF to which the parameter
value is applied.
[0019] According to another embodiment of the present invention, a radiographic system includes:
a radiation irradiating unit irradiating a radiation on a subject; an indirect radiation
detector including a scintillator panel converting a radiation, which passes through
the subject and is incident thereto, to a visible light, and a pixel array panel storing
charges generated by the visible light in each pixel, and realizing a radiation image
according to a charge amount in each pixel; and an image processing unit correcting
the radiation image by deconvoluting the radiation image obtained by the indirect
radiation detector using a point spread function(PSF).
[0020] The image processing unit may include: a data storage unit in which a parameter value,
which is applied to the PSF according to at least any one among a pixel size of the
pixel array panel, a thickness of the scintillator panel, and a type of the scintillator,
is classified and stored according to at least any one among the pixel size of the
pixel array panel, the thickness of the scintillator panel, and the type of the scintillator;
a parameter selecting unit selecting the parameter value according to the at least
any one among a pixel size of the pixel array panel, a thickness of the scintillator
panel, and a type of the scintillator; and an image correcting unit deconvoluting
the radiation image using the PSF to which the selected parameter value is applied.
[0021] The image processing unit may further include a preprocessing unit removing a fault
element from the obtained radiation image.
[0022] The image processing unit may further include an iteration setting unit setting a
number of times of deconvoluting the radiation image.
[0023] The iteration setting unit may set an iteration number for satisfying a condition
that a DQE value of a correction image, which is corrected by deconvoluting the radiation
image with the PSF, is in a range of 90% to 110% of a DQE value of the radiation image
in a same spatial frequency.
ADVANTAGEOUS EFFECTS
[0024] A radiation image processing method according to an embodiment of the present invention
may correct a blurring of a radiation image, which is caused by scatting of light
generated in a scintillator panel of an indirect radiation detector, by deconvoluting
the radiation image using a point spread function (PSF). Accordingly, a radiation
image of which the sharpness is improved with an indirect radiation detector may be
obtained. In addition, since a radiation image of which the sharpness is improved
with the indirect radiation detector having a high detective quantum efficiency (DQE)
is obtained, a sharp radiation image may be obtained even with a small radiation dose
and accordingly, a radiation exposure dose of a subject may be lowered.
[0025] In addition, artificial improvement in sharpness may be prevented and only a blurring
may be corrected by evaluating image quality of a radiation image in which the blurring
is corrected. In addition, a parameter value having highest sharpness and satisfying
the image quality according to the thickness of the scintillator panel may be easily
obtained by using parameter data.
[0026] Furthermore, amplification of a defective element may be prevented in a process for
correcting the blurring of the radiation image through preprocessing for removing
the defective element before correcting the blurring of the radiation image. In addition,
since the blurring is not artificially deleted but is mitigated to disappear, data
information on the radiation image may be prevented from being lost.
BRIEF DESCRIPTION OF THE DRAWINGS
[0027]
FIG. 1 is a flowchart illustrating a radiation image processing method according to
an embodiment of the present invention;
FIG. 2 is a conceptual diagram illustrating a scattering degree of light in a thin
scintillator panel according to an embodiment of the present invention;
FIG. 3 is a conceptual diagram illustrating a scattering degree of light in a medium
thickness scintillator panel according to an embodiment of the present invention;
FIG. 4 is a conceptual diagram illustrating a scattering degree of light in a thick
scintillator panel according to an embodiment of the present invention;
FIG. 5 is a conceptual diagram illustrating the magnitude of a point spread function
(PSF) in a pixel array panel in which a pixel size is large according to an embodiment
of the present invention;
FIG. 6 is a conceptual diagram illustrating the magnitude of a PSF in a pixel array
panel in which a pixel size is small according to an embodiment of the present invention;
FIG. 7 illustrates a PSF of Gaussian type according to an embodiment of the present
invention;
FIG. 8 is a graph for explaining a reference for selecting a parameter value of a
PSF according to an embodiment of the present invention;
FIG. 9 is a graph of a modulation transfer function (MTF) for evaluating image quality
according to an embodiment of the present invention;
FIG. 10 is a graph of a normalized noise power spectrum (NNPS) for evaluating image
quality according to an embodiment of the present invention;
FIG. 11 is a graph of a detective quantum efficiency (DQE) for evaluating image quality
according to an embodiment of the present invention;
FIG. 12 is a cross-sectional view of a photodiode type indirect radiation detector
according to another embodiment of the present invention; and
FIG. 13 is a cross-sectional view of a charge-coupled device type indirect radiation
detector according to another embodiment of the present invention.
MODE FOR CARRYING OUT THE INVENTION
[0028] Hereinafter, specific embodiments will be described in detail with reference to the
accompanying drawings. The present invention may, however, be embodied in different
forms and should not be construed as limited to the embodiments set forth herein.
Rather, these embodiments are provided so that this disclosure will be thorough and
complete, and will fully convey the scope of the present invention to those skilled
in the art. Throughout the drawings and written description, like reference numerals
refer to like elements. In the drawings, the dimensions may be partially enlarged
or exaggerated for clarity of illustration.
[0029] A point spread function (PSF) depicts a shape that a point is represented by blurring
in an image, and the extent of blurring may vary according to a shape of the PSF.
For example, the larger the blurring area at each point in an image is, the blurring
of the image gets more severe. Accordingly, the extent of blurring may be adjusted
by adjusting the shape of the PSF, and using this, an image including the blurring
may be obtained through convolution of a sharp image with the PSF.
[0030] Accordingly, through this principle, a blurring effect may be applied to the sharp
image. Besides, as in the present invention, a blurring of a radiation image may also
be corrected by deconvoluting the radiation image with a PSF. Furthermore, when the
radiation image including the blurring is corrected by performing deconvolution with
the PSF, the blurring is not artificially deleted but is mitigated to disappear and
accordingly data information on the radiation image may not be lost. Accordingly,
when the radiation image is corrected, quality of the radiation image may not be lowered.
[0031] FIG. 1 is a flowchart illustrating a radiation image processing method according
to an embodiment of the present invention.
[0032] Referring to FIG. 1, a radiation image processing method according to an embodiment
of the present invention may include an operation S100 for obtaining a radiation image
by using an indirect radiation detector, which includes a scintillator panel 110 and
a pixel array panel 120; an operation S200 for determining a value of a parameter
defining a PSF according to the scintillator panel 110 or the pixel array panel 120;
and an operation S300 for correcting the radiation image by deconvoluting it with
a PSF to which the parameter value is applied.
[0033] In order to process a radiation image, the radiation image is obtained (operation
S100) using the indirect radiation detector including the scintillator 110 and the
pixel array panel 120. When the radiation image is obtained with the indirect radiation
detector using the scintillator panel 110, a blurring occurs by light scattered by
a scintillator 111 of the scintillator panel 110. At this point, the light scattering
by the scintillator 111 may have a Gaussian shape. In order to correct the blurring
and improve the sharpness of the radiation image, the radiation image including the
blurring in the present invention is defined as an image for which a sharp image is
convoluted with a PSF. In addition, the radiation image is corrected by deconvoluting
the radiation image including the blurring using the PSF.
[0034] The pixel array panel 120 may store, for each pixel, charges generated by the visible
light into which a radiation irradiated on the scintillator panel 110 is converted.
Here, the resolution of the radiation image may vary according to a pixel size of
the pixel array panel 120.
[0035] In addition, the parameter value, which defines the PSF according to the scintillator
panel 110 or the pixel array panel 120, is determined (operation S200) in parallel
with operation S100 for obtaining the radiation image. Operation S200 for determining
the parameter value may be concurrently performed with operation S100 for obtaining
the radiation image. Alternatively, the parameter value may be determined before or
after operation S100 for obtaining the radiation image. Here, the parameter value
for defining the PSF may be determined depending on the scintillator panel 110 or
the pixel array panel 120. At this point, the parameter value for defining the PSF
may be determined depending on the pixel size of the pixel array panel 120, the thickness
of the scintillator panel 110, or the type of the scintillator 111.
[0036] FIG. 2 is a conceptual diagram illustrating a scattering degree of light in a thin
scintillator panel according to an embodiment of the present invention, FIG. 3 is
a conceptual diagram illustrating a scattering degree of light in a medium thickness
scintillator panel according to an embodiment of the present invention, and FIG. 4
is a conceptual diagram illustrating a scattering degree of light in a thick scintillator
panel according to an embodiment of the present invention.
[0037] A line spread function (LSF) represents a distribution of a certain value one-dimensionally,
and represents a distribution (or a difference in intensity) according to a position
of visible light 11 emitted from any one scintillator 111 in FIGS. 2 to 4. Referring
to FIGS. 2 to 4, a scattering degree of light may be checked through the PSF and the
greater the scattering degree of light is, the wider the sigma (or standard deviation)
of the LSF is. Accordingly, it may be seen through FIGS. 2 to 4 that the thicker the
scintillator panel 110 is, the more the scattering of light is. Here, the narrower
the sigma of the LSF is, the sharper the radiation image is, and accordingly, the
wider the sigma of the LSF is, the greater the scattering degree of light is. In other
words, as the thickness of the scintillator panel 110 is thicker, a conversion efficiency
that the radiation 10 is converted to visible light 11 becomes higher. However, when
scattering of light is increased according to the conversion efficiency, it causes
a more severe blurring of the radiation image.
[0038] The scattering degree of light may vary according not only to the thickness of the
scintillator panel 110 but also to the type of the scintillator panel 110 (or scintillator
111). From the FIGS. 2 to 4, the straightly incident radiation 10 collides with the
scintillator 111 and is emitted from the scintillator 111 as the visible light 11
in all directions. The blurring occurs in the radiation image by the visible light
11 incident not perpendicularly but diagonally among the visible light 11 emitted
in all directions. When the conversion efficiency for converting the radiation 10
to the visible light 11 becomes better according to the type of the scintillator 111
(or the type of the scintillator panel), the light scattering is increased to cause
more severe blurring.
[0039] Furthermore, the blurring of the radiation image may vary according to the intensity
of the radiation 10 incident to the scintillator panel 110. When the radiation 10
of lower energy is incident to the scintillator panel 110 and the thickness of the
scintillator panel 110 is thick, the light scattering is increased. In this case,
since the blurring becomes severe in the radiation image, a spatial resolution is
reduced but a speed becomes increased. On the other hand, when the radiation 10 of
high energy is incident to the scintillator panel 110, since a probability that the
radiation 10 reacts to the scintillator 111 becomes high as the thickness of the scintillator
panel 110 becomes thicker, the spatial resolution may become better. In other words,
since there is the proper thickness of the scintillator panel 110 according to the
intensity of the radiation 10, when the thickness of the scintillator panel 110 is
thinner than the proper one, the spatial resolution becomes bad. When the thickness
of the scintillator panel 110 is thicker than the proper one, the light scattering
is increased to make the blurring of the radiation image more severe.
[0040] FIG. 5 is a conceptual diagram illustrating the magnitude of a PSF in a pixel array
panel in which a pixel size is large according to an embodiment of the present invention,
and FIG. 6 is a conceptual diagram illustrating the magnitude of a PSF in a pixel
array panel in which a pixel size is small according to an embodiment of the present
invention.
[0041] Referring to FIGS. 5 and 6, the resolution of the radiation image may vary according
to the pixel size of the pixel array panel 120. FIGS. 5 and 6 have the same shadow
area, but FIG. 5 does not represent well light and darkness for each position because
of a large pixel size. However, in FIG. 6, since the pixel size is smaller than that
of FIG. 5, the light and darkness of a peripheral portion may be represented low to
show the light and darkness for each position relatively well. Like this, the smaller
the pixel size is, the higher the resolution is.
[0042] The parameter may define the magnitude of the PSF and the shape of the PSF. Here,
the magnitude and shape of the PSF are parameters for depicting a scattering type
of light in a situation in which the scattering type of light is quantized by the
scintillator panel 110 and converted to a digital signal.
[0043] The magnitude of the PSF may mean the number of pixels (or the size of a matrix)
having a digital value, and may correspond to the number of pixels corresponding to
an area on which a point of light is scattered by the scintillator panel 110. Accordingly,
for the same scintillator panel 110, when the pixel size of the pixel array panel
120 is large, since the number of pixels corresponding to the area on which the point
of light is scattered by the scintillator panel 110 is smaller than that in a case
where the pixel size of the pixel array panel 120 is small, the size of the PSF may
be relatively smaller. Since the magnitude of the PSF is required to be sufficiently
large to include the area on which the light is scattered by the scintillator panel
110, the magnitude of the PSF may vary according to the pixel size of the pixel array
panel 120.
[0044] The shape of the PSF may be that of a graph formed by each pixel value (or matrix
value) of the PSF. The shape of the PSF may be determined by a matrix of the PSF.
A variation amount of the brightness of an image may vary for each area according
to the shape (or matrix) of the PSF. Through this, various blurring effects may be
obtained by applying the PSF to a sharp image, and correction may be effectively performed
according to a blurring type by varying the shape of the PSF and performing deconvolution
according to a blurring shape of a radiation image.
[0045] In an embodiment of the present invention, the PSF shape may be a Gaussian shape.
For example, when the radiation 10 collides with the scintillator 111, since visual
light is radiated from the scintillator 111 in all directions, it may be effective
to determine the shape of the PSF as a Gaussian shape which may represent dispersion
well from one point to all directions. However, the PSF shape is not limited thereto
and may be determined according to the blurring type of the radiation image.
[0046] In a case where the PSF shape is the Gaussian shape, the Gaussian shape may be determined
by sigma σ of the Gaussian distribution and the sigma σ of the Gaussian distribution
may be used as one of the parameters. Accordingly, in the PSF of the Gaussian shape,
the magnitude of the PSF and the sigma σ of the Gaussian distribution may be used
as the parameters.
[0047] The PSF of the Gaussian shape may be expressed as the following Equation (1)

[0048] In Equation (1), x and y denote x and y coordinates, σ denotes sigma of the Gaussian
distribution, and when x, y, and σ are substituted for Equation (1), a Gaussian value
at (x, y) coordinates may be obtained.
[0049] Furthermore, the thicker the thickness of the scintillator panel 110 is, the magnitude
of the PSF and the sigma σ of the Gaussian distribution may increase, and a blurring
area may be increased since the visible light 11 emitted from the scintillator 111
in all directions may be dispersed wider before being incident to the photodiode 121.
Accordingly, since the magnitude of the PSF may be increased and the sigma σ of the
Gaussian distribution may be increased according to the magnitude of the PSF, the
blurring may be effectively depicted through the PSF. In addition, the magnitude and
shape of the PSF may be obtained by expanding an LSF two-dimensionally after obtaining
the LSF in one dimension from an edge image.
[0050] Like this, the magnitude of the PSF may vary according to the pixel size of the pixel
array panel 120, the thickness of the scintillator panel 110, and the type of the
scintillator 111, and when the magnitude of the PSF is determined, the sigma σ of
the Gaussian distribution may vary according to the thickness of the scintillator
panel 110 and the type of the scintillator 111. Accordingly, in the present invention,
the magnitude of the PSF and the sigma σ of the Gaussian distribution may be obtained
according to the pixel size of the pixel array panel 120, the thickness of the scintillator
panel 110, and the type of the scintillator 111, and accordingly, a radiation image
having the best sharpness may be obtained with effective correction.
[0051] Next, the radiation image is corrected by deconvoluted using the PSF, to which the
parameter values are applied(operation S300). Once the parameter values are known,
the radiation image may be deconvoluted with the PSF to correct the radiation image.
Under assumption that an image including the blurring is generated by convoluting
the PSF with a sharp image, the deconvolution process may be performed by iterating
an algorithm until a residual error value between a blurred image obtained from capturing
(namely, including light scattering by the scintillator) and a blurred image estimated
by a user becomes sufficiently small. As the deconvolution, a spatial-invariant deconvolution
for recovering the entire image using one PSF may be used. Alternatively, a spatial-variant
deconvolution for recovering an image using multiple individual PSFs according to
an image position may also be used. Although the spatial-variant deconvolution, in
which an individual PSF is used properly to each position, may have higher sharpness
than the spatial-invariant deconvolution, since a process for obtaining the individual
PSF proper to each position is complicated, the spatial-invariant deconvolution may
be mainly used.
[0052] The indirect radiation detector has a higher Detective Quantum Efficiency (DQE) but
lower sharpness (or an MTF) than the direct radiation detector. Here, the DQE is a
radiation conversion efficiency, and means that a good image may be obtained using
a smaller radiation dose when the DQE becomes higher. Accordingly, when the indirect
radiation detector is used in the present invention, scintillator scattering occurring
due to a structural feature of hardware may be corrected with a software algorithm
to obtain high sharpness similar to that in the direct radiation detector while maintaining
the high DQE of the indirect radiation detector.
[0053] As a result of performing the algorithm according to the present invention, an image
may be obtained which has a higher DQE than that of the direct radiation detector,
while having high sharpness. In this case, a sharper image of high quality may be
obtained with a smaller radiation dose. In other words, in a case of being used in
a product having a high DQE, since the radiation dose becomes smaller, a radiation
exposure dose to a subject becomes lowered, and since a sharper image may be obtained
when the sharpness is high, it is useful to diagnosis.
[0054] In particular, in mammography, even a very detailed part may be observed with a sharper
radiation image in a process for observing microcalcification and breast masses, etc.
[0055] Furthermore, in the present invention, it is assumed that the thickness of the scintillator
panel 110 is uniform across the entire region of the radiation detector and a difference
in thickness is not large, recovery may be performed by deconvolution using one PSF
and the obtained image. In this process, image measurement evaluation factors such
as the NNPS and DQE may vary according to a radiation dose irradiated at the time
of obtaining the image. However, an increase in MTF according to the present invention
does not influence the radiation dose. The MTF is influenced by the pixel size of
the pixel array panel 120 and the structure (e.g. a needle structure of Csl) of the
scintillator panel 110. Accordingly, in the present invention, the MTF, which is lowered
by the structure of the scintillator panel 110, may be recovered to improve the sharpness
of the radiation image. Like this, an effect due to scattering of light generated
in the scintillator panel 110 may determined through the MTF which is not influenced
by the radiation dose, instead of variables influenced by the radiation dose such
as the NNPS for determining a noise component and the DQE for determining the entire
performance. In addition, the sharpness of the radiation image may be improved by
enhancing the MTF. In addition, the MTF is proper as a factor for measuring the sharpness
of the radiation image since it is not influenced by the radiation dose. Accordingly,
in the present invention, the sharpness of the radiation image is measured through
the MTF and is improved by enhancing the MTF. When the factor for measuring the sharpness
of the radiation image is influenced by the radiation dose, it becomes difficult to
measure the sharpness of the radiation image. However, in the present invention, the
sharpness of the radiation image may be measured without any difficulty by using the
MTF, which is not influenced by the radiation dose, as the measuring factor, and may
be improved by enhancing the MTF.
[0056] FIG. 7 illustrates a PSF of Gaussian type according to an embodiment of the present
invention.
[0057] Referring to Fig. 7, scales in dotted lines denote an x-axis, a y-axis, and a pixel
value (or a z-axis value) in an image, the total area of the pixels divided with solid
lines becomes the magnitude of PSF, and combinations of pixel values become a matrix
of the PSF. Here, the pixel value may be a brightness value of each pixel.
[0058] When the sharp image is convoluted with the PSF having such a Gaussian shape, a blurring
may occur around the center portion of the Gaussian distribution. In addition, when
the radiation image including the blurring is deconvoluted with such a Gaussian type
PSF, the blurring occurring around the center portion of the Gaussian distribution
is mitigated to correct the radiation image.
[0059] In operation S200 for determining the parameter value, a correction image for which
the radiation image is deconvoluted with the PSF may be determined as a parameter
value for satisfying the image quality reference. When the radiation image is corrected
by deconvolution, the sharpness of the correction image may be enhanced than that
of the radiation image. However, when the sharpness is excessively artificially enhanced,
unique features of the radiation image become distorted. In addition, when the unique
features of the radiation image are distorted, since the radiation image becomes worthless,
the correction image of which unique features are distorted may be filtered out by
evaluating the quality of the correction image and determining whether the unique
features of the radiation image are distorted. Accordingly, when the parameter value
is determined as a parameter value for satisfying the image quality reference, the
radiation image may be corrected to the correction image of which the sharpness is
enhanced without distorting the unique features of the radiation image.
[0060] The image quality may be evaluated by measuring at least any one selected from among
the MTF, the DQE, the NNPS, and a signal to noise ratio (SNR). The values of the MTF,
DQE, NNPS, and SNR may be measured with an image evaluation tool by analyzing a feature
graph of each measurement value to evaluate the image quality. In other words, whether
the unique features of the radiation image are distorted may be determined through
the feature graph of each measurement value.
[0061] The Modulation Transfer Function (MTF) represents a frequency response of any one
image system and is a sharpness related measurement factor which may be defined as
an image contrast ratio for a subject contrast. In addition, the MTF is a frequency
recording capability for a region corresponding to each frequency when a spatial frequency
of an image is measured, and the resolution of the image may be obtained by marking
a degree that a radiographic system reacts to a spatial variation of the image. The
MTF is frequently used for evaluating the sharpness of an image and whether the sharpness
is enhanced may be determined through the MTF.
[0062] The DQE represents a transfer feature of the SNR and is a parameter for representing
a noise amount occurring by a last image. In other words, it measures the overall
SNR performance of a radiation detector, and a capability of a radiation detector
for transferring the SNR. In addition, the DQE may be defined as the square of a ratio
of an output SNR to an input SNR, and may be expressed as Equation (2).

wherein X denotes a irradiation dose.
[0063] In addition, the DQE is a comprehensive index for indicating quality of a radiation
image and is obtained by the MTF, NNPS, and SNR. Accordingly, the image quality may
be comprehensively evaluated with the MTF. NNPS, and SNR, and whether the unique features
of the image are distorted may be effectively determined.
[0064] The noise power spectrum (NPS) is representation of a distribution of dispersion
value of noise on a spatial frequency, represents dependence of noise on the spatial
frequency, which is a variation factor between pixels in an image, and is a noise
related measurement factor. And, the Normalized Noise Power Spectrum (NNPS) is a normalized
NPS and may be obtained by averaging all spectrum samples.
[0065] Image noise means uncertainty or inaccuracy in an image signal, and may be divided
into noise resulted from the number of photons forming image information and noise
caused by an image signal processing circuit. For the former, a degree of the uncertainty
increases when the number of photons forming the image information is small. On the
other hand, when the number of photons increases, a probability to be detected as
an image signal may become high to reduce a noise effect to the image signal. In order
to evaluate the SNR of the radiographic system, an image may be obtained using a lead
phantom from which the central portion is removed, and may use gray-scale value of
the obtained image, which is measured along a leader line. The image signal means
a difference ΔD between a peripheral lead phantom and a gray-scale value in a circular
region of the center, and the image noise means a standard deviation s of the gray-scale
value of the obtained image. A ratio of them (ΔD/s) may be defined as the SNR which
is a measurement factor related to the signal and noise.
[0066] FIG. 8 is a graph for explaining a reference for selecting a parameter value of a
PSF according to an embodiment of the present invention.
[0067] The indirect radiation detector has a higher DQE but lower sharpness (or a MTF) than
the direct radiation detector. Accordingly, it is required to obtain high sharpness
while maintaining the high DQE of the indirect radiation detector. Accordingly, when
determining the parameters, in order to effectively determine the magnitude of the
PSF and the sigma σ of the Gaussian distribution, the MTF which is an index for checking
the sharpness with reference to the image quality may be firstly checked.
[0068] Referring to FIG. 8, the image quality reference may include a condition that a value
of the MTF for a spatial frequency of the correction image decreases according to
an increase in spatial frequency, and the MTF value is the highest in the correction
image according to the parameter value. It may be confirmed that in a graph of the
radiation image (before correction), the MTF value decreases in a right downward direction
as the spatial frequency increases. Like this, in the radiation image (before correction)
including the blurring, when the spatial frequency increases, the blurring is amplified
to decrease the MTF. However, unlike the obtained radiograph image (before correction),
a graph of correction 3 does not have a right downward slope in a certain period (where
the spatial frequency is about 0.7 lp/mm to about 1.4 lp/mm), but tilts upward. From
the graph of correction 3, it may be estimated that the unique features of the radiograph
image are distorted. In order to verify this, the DQE may be analyzed. From the graph
of correction 3 of which the shape is greatly changed, it may be seen that a difference
occurs between DQE values of the correction image and the radiation image, and the
unique features thereof are distorted. Although a graph of correction 2 is slightly
changed in shape from the radiation image (before correction), it has a right downward
slop. From the analysis of the graph of correction 2, it may be seen that the correction
image maintains the DQE value of the radiation image and the unique features of the
radiation image are not distorted. Like this, whether the unique features of the radiation
image are distorted may be determined through the graph of the MTF. In other words,
whether the unique features of the radiation image are distorted may be determined
by determining whether the MTF graph does not have the right downward slope but tilts
upward. Furthermore, whether the unique features of the radiation image are distorted
may also be determined not only with the MTF graph but also with the NNPS and SNR
graphs.
[0069] In addition, a correction image having a highest MTF value among the correction images
corrected according to the parameter value may be set as the image quality reference.
For example, when the MTF value of the correction image is the highest, since the
sharpness thereof is best, a correction image of which the sharpness is the best may
be obtained among the correction images. However, since it is not good that the sharpness
becomes so high to distort the unique features of the radiation image, a correction
image having the highest MTF value may be selected from among the correction images
of which the DQE value of the radiation image is maintained. In addition, a parameter
may be determined so that the obtained radiation image may be deconvoluted with the
correction image satisfying the foregoing condition. Accordingly, the correction image
of which the unique features of the radiation image are not distorted and which has
the highest sharpness may be obtained. Like this, in the present invention, since
a sharp radiation image may be obtained only with a small radiation dose and a radiation
exposure dose of a subject may be reduced accordingly, more accurate diagnosis may
be performed with the sharp radiation image. In particular, in mammography, even a
very detailed part may be observed with a sharper radiation image in a process for
observing microcalcification and breast masses, etc.
[0070] FIG. 8 is a graph obtained by changing the sigma σ of the Gaussian distribution while
fixing the magnitude of the Gaussian type PSF, and a graph of correction 1 is for
the case where σ = 0.5, a graph of correction 2 is for the case where σ =0.7, and
a graph of correction 3 is for the case where σ =1.0. From among the graphs of correction
1, correction2, and correction 3, the graph of correction 2 may be selected. The reason
is because although the graph of correction 3 has a highest MTF value, the unique
features of the radiation image are distorted. Therefore, the graph of correction
2 having a higher MTF value is selected from between the graphs of which the unique
features of the radiation image are not distorted. Accordingly, the sigma σ of the
Gaussian distribution may be determined as 0.7, and the fixed magnitude of the PSF
may be determined as the parameter value. Furthermore, other parameter values may
be determined through experiments according to the above-described methods.
[0071] FIG. 9 is a graph of an MTF for evaluating image quality according to an embodiment
of the present invention, FIG. 10 is a graph of an NNPS for evaluating image quality
according to an embodiment of the present invention, and FIG. 11 is a graph of a DQE
for evaluating image quality according to an embodiment of the present invention.
[0072] Referring to FIGS. 9 to 11, in the correction image for satisfying the image quality
reference, not only a graph of the MTF, which is a measurement factor of sharpness,
but also a graph of the NNPS increases. Therefore, the DQE graph is not nearly changed.
As a result, the correction image for satisfying the image quality reference has the
same DQE as the radiation image before correction. This means that the unique features
of the correction image are the same as those of the radiation image, and the unique
features of the radiation image are not distorted by the correction. Accordingly,
the radiation image, of which the sharpness is improved, may be obtained while characteristics
of the indirect radiation detector, in which the DQE is high, are maintained, and
accordingly, a sharp radiation image may be obtained with a small radiation dose.
Through this, a radiation exposure dose of a subject may be reduced and more accurate
diagnosis may be performed with the sharp radiation image. In particular, in mammography,
even a very detailed part may be observed with a sharper radiation image in a process
for observing microcalcification and breast masses, etc.
[0073] The image quality reference may include a condition that the DQE value of the correction
image is in the range of 90% to 110% of the DQE value of the radiation image in the
same spatial frequency. The DQE is obtained from the MTF, NNPS, and SNR. Accordingly,
the DQE is for comprehensively evaluating the image quality by including the MTF,
NNPS, and SNR, and may effectively determine whether the unique features of the image
are distorted. Since a change in DQE due to correction of the radiation image means
distortion of the unique features of the radiation image, the DQE value should not
be changed. However, since it is difficult to equally maintain the DQE without an
error while changing the MTF, an error range of ± 10 % may be tolerated. When the
DQE value of the correction image is in the range of 90% to 110% of the DQE value
of the radiation image in the same spatial frequency, the DQE graph of the correction
image may be maintained in the same type as the obtained DQE graph of the radiograph
image. Since there is a little difference in DQE value in this case, unique features
of the correction image and the obtained radiation image may be determined as the
same. On the other hand, when the DQE value of the correction image is out of the
range of 90% to 110% of the DQE value of the radiation image in the same spatial frequency,
the DQE graph of the correction image may vary differently from the obtained DQE graph
of the radiograph image. In addition, since the difference in DQE value is large,
the unique features of the correction image may be determined to be distorted. Like
this, since the correction image, which does not satisfy the condition that the DQE
value of the correction image is in the range of 90% to 110% of the DQE value of the
radiation image in the same spatial frequency, is an image of which the unique features
are distorted, it is worthless as an image for medical diagnosis. Therefore, the correction
image necessarily satisfies the condition that the DQE value of the correction image
is in the range of 90% to 110% of the DQE value of the radiation image in the same
spatial frequency.
[0074] Although the DQE value condition is a prerequisite that the correction image should
satisfy, since the DQE may be obtained from the MTF, NNPS, and SNT, the DQE value
is not a value preferentially checked. For example, the MTF, from which the sharpness
may be determined, may be firstly checked, and then distortion of the unique features
of the radiation image may be estimated from the MTF graph. However, it is necessary
to check the DQE in order to accurately determine whether the unique features of the
radiation image are distorted.
[0075] Furthermore, images for measuring the NNPS and MTF may be different from each other.
The image for measuring the NNPS may be captured without a subject, and the image
for measuring the MTF may be obtained by capturing an edge subject. The NNPS is for
measuring and analyzing noise displayed as white in the image captured without an
object. In addition, the MTF is for determining whether a subject portion is distinguished
from a portion without the subject at the edge portion of the subject and for determining
an extent of blurring. Through this, the NNPS and the MTF are measured, and the DQE
may be calculated from the NNPS and MTF.
[0076] An operation for classifying and storing the determined parameter values according
to at least any one among the pixel size of the pixel array panel 120, the thickness
of the scintillator panel 110, and the type of scintillator 111 is further included.
In operation S300 for correcting the radiation image by deconvoluting the radiation
image, from among the stored parameter values, the parameter value is selected according
to at least any one among the pixel size of the pixel array panel 120, the thickness
of the scintillator panel 110, and the type of scintillator 111, which are used for
obtaining the radiation image, and the radiation image may be corrected. A lot of
time are necessary to verify whether a correction image, for which the radiation image
is deconvolutioned with a PSF to which the parameter values are applied, satisfies
the image quality reference. Accordingly, parameter data may be generated in advance
according to at least one among the pixel size of the pixel array panel 120, the thickness
of the scintillator panel 110, and the type of the scintillator 111. In addition,
the parameter value, which corresponds to at least any one among the pixel size of
the pixel array panel 120, the thickness of the scintillator panel 110, and the type
of the scintillator 111, is selected and applied to the PSF.
[0077] The parameter data may be obtained by, before operation S100 for obtaining the radiation
image, applying all the parameter values to each one among the pixel size of the pixel
array panel 120, the thickness of the scintillator panel 110, and the type of the
scintillator 111 to generate correction images, determining whether the correction
images satisfy the image quality reference, and by storing the parameter values for
allowing the correction images to satisfy the image quality reference according to
at least any one among the pixel size of the pixel array panel 120, the thickness
of the scintillator panel 110, and the type of the scintillator 111. Accordingly,
through the parameter data, combinations of corresponding parameter values may be
obtained according to at least one among the pixel size of the pixel array panel 120,
the thickness of the scintillator panel 110, and the type of the scintillator 111.
In addition, a correction image of which unique features of the radiation image are
not distorted while having the high MTF graph may be easily obtained.
[0078] Furthermore, a parameter value satisfying the DQE condition and having a highest
MTF value is searched while changing any one parameter and fixing other parameters,
and for other parameters, parameter values satisfying the DQE condition and having
a highest MTF value are searched in the same manner, and then a combination of parameter
values, each having a highest MTF value and satisfying the DQE condition, may be obtained
while the found parameter values are relatively changed. At this point, since the
magnitude of the PSF is necessary to be determined only to be equal to or greater
than a prescribed magnitude (e.g., the magnitude that sufficiently includes the physical
range of scattering), the magnitude of PSF may be firstly determined through evaluation
of the image quality after fixing other parameters. Next, the sigma σ of the Gaussian
distribution may be determined by using the determined magnitude of PSF, and other
parameters may be determined such that the DQE condition is satisfied and the MTF
value is a highest while the determined magnitude of PSF and the sigma σ of the Gaussian
distribution are fixed. The parameter value combination obtained like this may be
the determined parameter values. In addition, the determined parameter values may
be classified and stored according to at least one among the pixel size of the pixel
array panel 120, the thickness of the scintillator panel 110, and the type of the
scintillator 111, and the classified and stored parameter values may be the parameter
data.
[0079] In operation S300 for correcting the radiation image by deconvoluting the radiation
image, the deconvolution may be iterated using the PSF to which the parameter values
are applied, and the radiation image may be corrected. The parameter value combination
is required not to distort the unique features of the radiation image for the correction
image at the time of deconvoluting the obtained radiation image. Through this combination,
even when the MTF graph is not high, the radiation image may be corrected to a correction
image having a highest MTF graph among the correction images in which the unique features
of the radiation image are not distorted by iterating deconvolution using the PSF
to which the parameter values are applied. At this point, in order for the unique
features of the radiation image not to be distorted, the correction image is necessary
to satisfy the condition that the DQE value of the correction image is in the range
of 90% to 110 % of the DQE value of the radiation image in the same spatial frequency.
Like this, the extent of correction of the radiation image may be adjusted according
to the magnitude of PSF, the shape of PSF, and the iteration number of deconvolution.
In other words, the correction extent of the radiation image may be determined according
to the shape and magnitude of PSF and the number of times of devolution. Furthermore,
through advance experiments, the number of iteration times of deconvolution may also
be preset by checking a maximum number of times that the unique features of the radiation
image are not distorted with the parameter value combinations. In addition, the parameter
value combination and the maximum number of iterations may be pre-stored in a lookup
table, etc. according to at least any one among the pixel size of the pixel array
panel 120, the thickness of the scintillator panel 110, and the type of the scintillator
111.
[0080] An operation for removing a fault element from the radiation image may be further
included before the operation for correcting the radiation image by deconvoluting
the radiation image. The fault element may include a flat field, a gain, and a defect.
Among them, the defect may mainly influence the radiation image at the time of deconvoluting
the radiation image. The defect is a part to which a pixel value is not properly output.
When there is a defect in the radiation image at the time of deconvoluting the radiation
image, the defect is amplified to exert bad influence on quality of the radiation
image. Accordingly, the defect in the radiation image may be removed before the radiation
image is corrected by deconvoluting the radiation image.
[0081] At the time of removing the defect, the defect in a point/pixel type or a line type
may be corrected using peripheral information. In this case, since correction is performed
using the peripheral information, a pixel value similar to an actual pixel value may
be obtained and accordingly the quality of the radiation image may be improved. In
addition, the defect is removed and accordingly, amplification of the defect may be
prevented.
[0082] In addition, a flat field correction and a gain correction may be performed as a
preprocessing procedure of the radiation image. The flat field correction is to correct
a difference in dose response of a pixel occurring by a hardware cause. In addition,
the gain correction is to correct dose nonuniformity occurring by a radiation source.
[0083] FIG. 12 is a cross-sectional view of a photodiode type indirect radiation detector
according to another embodiment of the present invention, and FIG. 13 is a cross-sectional
view of a charge-coupled device type indirect radiation detector according to another
embodiment of the present invention.
[0084] Descriptions will be provided about a radiographic system according to another embodiment
with reference to FIGS. 12 and 13, and repetitive descriptions with the foregoing
descriptions related to the radiation image processing method according to the embodiment
will be omitted.
[0085] A radiographic system according to another embodiment may include a radiation irradiating
unit for irradiating a radiation 10 on a subject; an indirect radiation detector 100
which includes a scintillator panel 110 for converting the radiation 10 passing through
the subject to be incident to visible light 11 and a pixel array panel 120 for storing
charges generated by the visible light 11 in each pixel, and which realizes a radiation
image according to a charge amount in each pixel; and an image processing unit for
correcting the radiation image by deconvoluting the radiation image obtained by the
indirect radiation detector 100 with an PSF.
[0086] The radiation irradiating unit may adjust the intensity of the radiation 10 and irradiate
the radiation 10 of the certain intensity on the subject to allow the radiation 10
passing through the subject to be incident into the scintillator panel 110.
[0087] The indirect radiation detector 100 may include the scintillator panel 110. The radiation
10 incident to the scintillator panel 110 collides with the scintillator 111 to be
converted to the visible light 11. Here, the indirect radiation detector 100 may convert
the intensity of the visible light 11 to an electrical signal through a thin film
transistor 122 in which a photodiode 121 or a charge coupled device 120b is installed,
and may realize an image with the electrical signal.
[0088] The image processing unit may deconvolute a blurring of the radiation image, which
occurs by light scattered by the scintillator 111 of the scintillator panel 110, with
a PSF, and correct the blurring. Through this, the sharpness of the radiation image
may be improved to enhance accuracy of medical diagnosis using the radiation image.
[0089] The image processing unit may include a data storage unit in which parameter values,
which are applied to a PSF according to at least any one among the pixel size of the
pixel array panel 120, the thickness of the scintillator panel 110, and the type of
the scintillator 111, are classified and stored according to at least any one among
the pixel size of the pixel array panel 120, the thickness of the scintillator panel
110, and the type of the scintillator 111; a parameter selecting unit for selecting
the parameter value according to at least any one among the pixel size of the pixel
array panel 120, the thickness of the scintillator panel 110, and the type of the
scintillator 111, and an image correcting unit for deconvoluting the radiation image
using the PSF to which the selected parameter value is applied.
[0090] The data storage unit may store combinations of the parameter values which are classified
according to at least one among the pixel size of the pixel array panel 120, the thickness
of the scintillator panel 110, and the type of the scintillator 111, and which satisfy
a certain condition. When the parameter value combinations are applied to the PSF
to deconvolute the radiation image, a correction image in which unique features of
the radiation image are not distorted and which has a high MTF graph may be obtained.
In addition, the parameter values, which correspond to at least any one among the
pixel size of the pixel array panel 120, the thickness of the scintillator panel 110,
and the type of the scintillator 111, may be easily selected.
[0091] The parameter selecting unit may select a parameter value according to at least any
one among the pixel size of the pixel array panel 120, the thickness of the scintillator
panel 110, and the type of the scintillator 111. Here, the parameter value may be
selected according to at least any one among the pixel size of the pixel array panel
120, the thickness of the scintillator panel 110, and the type of the scintillator
111 by using the parameter values (i.e. parameter data), which stored in the data
storage unit.
[0092] The image correcting unit may correct the radiation image by deconvoluting the radiation
image using the PSF to which the selected parameter value is applied. The correction
may be performed to mitigate the blurring by convoluting a radiation image including
a blurring with a sharp image to search a PSF which generates the same blurring as
that in the radiation image, and by deconvoluting the radiation image including the
blurring using the found PSF.
[0093] The image processing unit may further include an iteration setting unit for setting
the number of iterations for deconvoluting the radiation image. When the sharpness
is slightly improved with one time deconvolution, the deconvolution may be iterated
to improve the sharpness of the radiation image. Like this, the iteration setting
unit may allow the extent of correction of the radiation image to be adjusted according
to the number of times of deconvolution. Furthermore, through advance experiments,
the number of times of deconvolution may also be preset by checking a maximum number
of times that the unique features of the radiation image are not distorted with the
parameter value combinations. In addition, the parameter value combination and the
maximum number of iterations may be pre-stored in the data storage unit, such as a
lookup table, according to at least any one among the pixel size of the pixel array
panel 120, the thickness of the scintillator panel 110, and the type of the scintillator
111.
[0094] The iteration setting unit may set the iteration number in order to satisfy the condition
that the DQE value of the correction image, which is corrected by deconvoluting the
radiation image with the PSF, is in the range of 90% to 110% of the DQE value of the
radiation image in the same spatial frequency. When the DQE value of the correction
image is out of the range of 90% to 110% of the DQE value of the radiation image in
the same spatial frequency, the unique features of the radiation image in the correction
image are distorted. Accordingly, the DQE value of the correction image may be allowed
to be in the range of 90% to 110% of the DQE value of the radiation image in the same
spatial frequency. However, too many iteration of the deconvolution for improving
the sharpness may cause distortion in unique features of the radiation image. Accordingly,
the iteration number may be set in order to satisfy the condition that the DQE value
of the correction image is in the range of 90% to 110% of the DQE value of the radiation
image in the same spatial frequency.
[0095] The image processing unit may further include a preprocessing unit for removing a
fault element from the obtained radiation image. The preprocessing unit may preprocess
the obtained radiation image. When there is a fault element such as a defect in the
radiation image at the time of deconvolution of the radiation image, the fault element
such as the defect may be amplified to exert a bad effect to the quality of the radiation
image. Accordingly, the fault element such as defect in the radiation image may be
removed before the radiation image is corrected by deconvoluting the radiation image.
The fault element may include not only the defect but also a flat field and a gain,
and the defect may mainly influence on the radiation image at the time of deconvoluting
the radiation image.
[0096] Like this, a blurring of a radiation image due to scatting of light generated in
a scintillator panel of an indirect type radiation detector may be corrected by deconvoluting
the radiation image with the PSF. Accordingly a radiation image of which the sharpness
is improved with the indirect radiation detector may be obtained. In addition, since
a radiation image for which the sharpness is improved with the indirect radiation
detector having a high DQE is obtained, a sharp radiation image may be obtained even
with a small radiation dose. Accordingly, a radiation exposure dose of a subject may
be lowered and more accurate diagnosis may be performed with the sharp radiation image.
In particular, in mammography, even a very detailed part may be observed with a sharper
radiation image in a process for observing microcalcification and breast masses, etc.
[0097] In addition, artificial improvement in sharpness may be prevented and only a blurring
may be corrected by evaluating quality of a radiation image for which the blurring
is corrected. In addition, a parameter value having highest sharpness may be easily
obtained while the image quality is satisfied according to the thickness of the scintillator
panel using parameter data. Furthermore, amplification of a defect factor may be prevented
in a process for correcting a blurring of a radiation image through preprocessing
the radiation image for removing the fault element before correcting the blurring
of the radiation image. In addition, since the blurring is not artificially deleted
but is mitigated to disappear, loss of data information on the radiation image may
be prevented.
[0098] Although the radiation image processing method and the radiographic system have been
described with reference to the specific embodiments, they are not limited thereto.
Therefore, it will be readily understood by those skilled in the art that various
modifications and changes can be made thereto without departing from the spirit and
scope of the present invention defined by the appended claims and their equivalents.
1. A radiation image processing method comprising:
obtaining a radiation image using an indirect radiation detector comprising a scintillator
panel and a pixel array panel;
determining a parameter value for defining a point spread function (PSF) according
to the scintillator panel or the pixel array panel; and
correcting the radiation image by deconvoluting the radiation image using the PSF
to which the parameter value is applied.
2. The radiation image processing method of claim 1, further comprising removing a fault
element from the radiation image before the correcting the radiation image by deconvoluting
the radiation image.
3. The radiation image processing method of claim 1, wherein the parameter defines a
magnitude of the PSF and a shape of the PSF.
4. The radiation image processing method of claim 1, wherein, in the determining a parameter
value, the parameter value is determined to allow a correction image for which the
radiation image is deconvoluted using the PSF to satisfy an image quality reference.
5. The radiation image processing method of claim 4, wherein the image quality is evaluated
by measuring at least any one selected from among a modulation transfer function (MTF),
a detective quantum efficiency (DQE), a normalized noise power spectrum (NNPS), and
a signal to noise ratio (SNR).
6. The radiation image processing method of claim 4, wherein the image quality reference
comprises a condition that a DQE value of the correction image is in a range of 90%
to 110% of a DQE value of the radiation image in a same spatial frequency.
7. The radiation image processing method of claim 4, wherein the image quality reference
comprises a condition that for a spatial frequency of the correction image, a value
of the MTF decreases according to an increase in spatial frequency, and the MTF value
is a highest in the correction image according to the parameter value.
8. The radiation image processing method of claim 1, further comprising:
classifying and storing the determined parameter value according to at least any one
among a pixel size of the pixel array panel, a thickness of the scintillator panel,
and a type of the scintillator,
wherein in the correcting the radiation image by deconvoluting the radiation image,
the radiation image is corrected by selecting a parameter value from among stored
parameter values according to at least any one among the pixel size of the pixel array
panel, the thickness of the scintillator panel, and the type of the scintillator,
which are used for obtaining the radiation image.
9. The radiation image processing method of claim 1, wherein in the correcting the radiation
image by deconvoluting the radiation image, the radiation image is corrected by iterating
the deconvolution using the PSF to which the parameter value is applied.
10. A radiographic system comprising:
a radiation irradiating unit irradiating a radiation on a subject;
an indirect radiation detector comprising a scintillator panel converting a radiation,
which passes through the subject and is incident thereto, to a visible light, and
a pixel array panel storing charges generated by the visible light in each pixel,
and realizing a radiation image according to a charge amount in each pixel; and
an image processing unit correcting the radiation image by deconvoluting the radiation
image obtained by the indirect radiation detector using a point spread function (PSF).
11. The radiographic system of claim 10, wherein the image processing unit comprises:
a data storage unit in which a parameter value, which is applied to the PSF according
to at least any one among a pixel size of the pixel array panel, a thickness of the
scintillator panel, and a type of the scintillator, is classified and stored according
to at least any one among the pixel size of the pixel array panel, the thickness of
the scintillator panel, and the type of the scintillator;
a parameter selecting unit selecting the parameter value according to the at least
any one among the pixel size of the pixel array panel, the thickness of the scintillator
panel, and the type of the scintillator; and
an image correcting unit deconvoluting the radiation image using the PSF to which
the selected parameter value is applied.
12. The radiographic system of claim 11, wherein the image processing unit further comprises
a preprocessing unit removing a fault element from the obtained radiation image.
13. The radiographic system of claim 11, wherein the image processing unit further comprises
an iteration setting unit setting a number of times of deconvoluting the radiation
image.
14. The radiographic system of claim 13, wherein the iteration setting unit sets an iteration
number for satisfying a condition that a DQE value of a correction image, which is
corrected by deconvoluting the radiation image with the PSF, is in a range of 90%
to 110% of a DQE value of the radiation image in a same spatial frequency.